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EOIR TECHNOLOGIES, INC.
| EOIR TECHNOLOGIES, INC. Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20090296097 | Systems and Methods for Comparative Interferogram Spectrometry - A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality. | 12-03-2009 |