Elcometer Limited Patent applications |
Patent application number | Title | Published |
20150233697 | Measuring Instrument and Method - A measuring instrument, such as a coating thickness measuring instrument, comprises a reader ( | 08-20-2015 |
20140195187 | COATING THICKNESS MEASURING INSTRUMENT AND METHODS - A coating thickness measuring instrument has a probe for measuring the thickness of a coating applied to a substrate and producing an output relating to the measured thickness; a memory storing calibration data; and a processor arranged to process the output produced by the probe, together with calibration data stored by the memory, and produce a coating thickness measurement. The memory stores at least two sets of calibration data, each set associated with a different surface profile value and a user may select the set of calibration data to be used by the processor according to the surface profile of the substrate on which a measurement is to be made. This enables a user to make coating thickness measurements on substrates with at least two different, known, surface profiles without having to calibrate the instrument specifically for those surfaces. | 07-10-2014 |
20140053422 | PROBE - A surface profile measurement probe comprising two spaced apart points | 02-27-2014 |