Inventors list

Assignees list

Classification tree browser

Top 100 Inventors

Top 100 Assignees


El-Mul Technologies Ltd.

El-Mul Technologies Ltd. Patent applications
Patent application numberTitlePublished
20090309021Ion detection method and apparatus with scanning electron beam - The invention pertains to a method for imaging a sample by detecting ions emitted from said sample, wherein 12-17-2009
20090294687Three modes particle detector - The invention discloses a charged particle detecting apparatus for detecting positive ions, negative ions and electrons emitted from a sample, the apparatus comprising a housing, defining a chamber in its interior, which is confined by conductive walls, and has an opening to the outside of said housing; a grid for selectively attracting charged particles, wherein the grid is electrically biasable with respect to said housing and functionally aligned with said opening; a converter arrangement with a converter surface, which is electrically biasable with respect to the grid and with respect to the housing, and which is positioned such that charged particles attracted into the chamber by the grid impact on the converter surface; an electron detector, which is biasable with respect to the converter surface in such a way that electrons emitted from the converter surface impact on the electron detector.12-03-2009

Patent applications by El-Mul Technologies Ltd.