division Patent applications |
Patent application number | Title | Published |
20090302215 | METHOD OF OPERATING TANDEM ION TRAPS - A method for operating tandem ion traps is provided, involving a) accumulating ions in the first ion trap at a first time; b) transmitting a first plurality of ions out of the first ion trap and into the second ion trap at a second time, the first plurality of ions having masses within a first mass range; c) retaining a second plurality of ions in the first ion trap at the second time, the second plurality of ions having masses within a second mass range different from the first mass range; d) transmitting the first plurality of ions out of the second ion trap at a third time; and, e) transmitting the second plurality of ions out of the first ion trap and into the second ion trap at the third time. | 12-10-2009 |
20090194683 | METHOD OF OPERATING A LINEAR ION TRAP TO PROVIDE LOW PRESSURE SHORT TIME HIGH AMPLITUDE EXCITATION - In accordance with an aspect of an embodiment of the present invention, there is provided a method for fragmenting ions in an ion trap of a mass spectrometer. The method comprises a) selecting parent ions for fragmentation; b) retaining the parent ions within the ion trap for a retention time interval, the ion trap having an operating pressure of less than about 1×10−4 Torr; c) providing a RF trapping voltage to the ion trap to provide a Mathieu stability parameter q at an excitement level during an excitement time interval within the retention time interval; d) providing a resonant excitation voltage to the ion trap during the excitement time interval to excite and fragment the parent ions; and, e) within the retention time interval and after the excitement time interval, terminating the resonant excitation voltage and changing the RF trapping voltage applied to the ion trap to reduce the Mathieu stability parameter q to a hold level less than the excitement level to retain fragments of the parent ions within the ion trap. | 08-06-2009 |