Crytur Spol S.R.O. Patent applications |
Patent application number | Title | Published |
20160056347 | WHITE LIGHT EMITTING DIODE WITH SINGLE CRYSTAL PHOSPHOR AND THE MANNER OF PRODUCTION - According to the invention, the diode with a single crystal phosphor placed over the chip comprises the fact that the single crystal phosphor, created by LnYAG and/or YAP and/or GGAG hosts, doped with the atoms selected from the Ce | 02-25-2016 |
20130291788 | METHOD FOR THE PREPARATION OF DOPED GARNET STRUCTURE SINGLE CRYSTALS WITH DIAMETERS OF UP TO 500 MM - Preparation of lutetium and yttrium aluminate single crystals doped with rare earth oxides and transition elements consists in the preparation of oxide mixture sinter which is melted throughout and homogenized for a period of at least one hour. The crystal growth rate and broadening of the crystal cone are maintained uniform at an angle of at least 60° from the crystal axis up to a diameter of at least 80% of the crucible diameter which is at least 100 mm. The completion of the process occurs by separating the crystal from the melt while the crystal continues to be positioned inside the crucible in the zone wherein it was grown, and wherein final tempering of the crystal also takes place. | 11-07-2013 |
20130187055 | THE SCINTILLATION DETECTION UNIT FOR THE DETECTION OF BACK-SCATTERED ELECTRONS FOR ELECTRON OR ION MICROSCOPES - A scintillation detection unit for the detection of back-scattered electrons for electron and ion microscopes having a column with longitudinal axis, in which the scintillation detection unit consists of body and at least one system for processing the light signal comprising a photodetector or a photodetector preceded with additional optical members where the body is at least partly made of scintillation material and is at least partly situated in a column of an electron or ion microscope and is made up of at least one hollow part. The height of the body of scintillation detection unit measured in the direction of longitudinal axis is greater than one-and-a-half times the greatest width measured in the direction perpendicular to the longitudinal axis of the hollow part with the greatest width. | 07-25-2013 |