| CREDENCE SYSTEMS CORPORATION Patent applications |
| Patent application number | Title | Published |
|---|
| 20110234271 | HIGH RESOLUTION CLOCK SIGNAL GENERATOR - A clock signal generator having first and second coarse delay circuits connected in series delays pulses of a reference signal having period T | 09-29-2011 |
| 20100023294 | AUTOMATED TEST SYSTEM AND METHOD - An efficient automated testing system and method are presented. In one embodiment, an automated testing system includes a control component and an automated test instrument for testing a device or a plurality of devices (e.g., packages or wafers containing multiple independent different devices) under test. The automated test instrument component performs testing operation on the device or devices under test (DUT). The control component manages testing activities of a test instrument testing the device under test, including managing implementation of a plurality of test programs loaded as a group. In one exemplary implementation, the automated test system also includes a DUT interface and a user interface. The device under test interface interfaces with a device or devices under test. | 01-28-2010 |
| 20090076761 | ROUTED EVENT TEST SYSTEM AND METHOD - An efficient automated test system and method are presented. In one embodiment, an automated test system is implemented in a routed event distribution architecture. In one exemplary implementation, an automated test system includes a plurality of test instruments, a switched event bus, and a test controller component. The plurality of test instruments perform testing. The switched event bus communicatively couples the plurality of instruments. The switched event bus comprises an event distribution switch that flexibly routes event information across event lines of the switched event bus. The test controller controls the testing and the switched event bus. | 03-19-2009 |
