Corad Technology Inc.
|Corad Technology Inc. Patent applications|
|Patent application number||Title||Published|
|20140094071||COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT ELEMENTS - A compressible contact pin. The contact pin includes a first contact element and a second contact element. A compressible member is coupled between the first contact element and the second contact element to compress when one or more external forces are applied between the first contact element and the second contact element. In addition, the compressible member maintains a separation distance between the first and second contact elements when no external forces are applied. A deformable conductor is electrically coupled between the first contact element and the second contact element. The deformable conductor maintains the electrical coupling between the first contact element and the second contact element by deforming when the one or more external forces are applied between the first contact element and the second contact element.||04-03-2014|
|20140091825||FINE PITCH INTERFACE FOR PROBE CARD - A probe card interface for interfacing a probe head with a first circuit. The probe card interface includes an impedance control element to interface a first set of pins of the probe head with the first circuit. The impedance control element is further configured to control the impedance of the first set of pins. The probe card interface includes a conductive plane to interface a second set of pins of the probe head with the first circuit. The conductive plane is further coupled to provide at least one of power or ground to the second set of pins.||04-03-2014|
|20140091818||FINE PITCH INTERFACE FOR PROBE CARD - A probe card for testing integrated circuit devices. The probe card includes a first circuit having a plurality of traces disposed thereon. The probe card also includes a plurality of pins to couple to a device under test. An interface element interfaces a first set of pins of the plurality of pins with the plurality of traces on the first circuit. The interface element includes a conductive plane coupled to a second set of pins of the plurality of pins to provide power and ground to the device under test.||04-03-2014|
|20130021050||Resonant test probe for integrated circuits - A resonant test probe for testing high-speed integrated circuit devices. The test probe includes a probe tip that makes electrical contact with a device under test to receive a test signal from the device, and an output circuit transmits the received test signal to a testing apparatus. The test probe also includes tuning circuitry coupled between the probe tip and the output circuit. The tuning circuitry is configured to tune a resonance frequency of the test probe to be substantially equal to an operating frequency of the device under test to enable the test probe to transmit the test signal to the device under test.||01-24-2013|
|20100330830||Vertical probe intrface system - A vertical probe interface system includes a flex PCB system where a portion of the flex PCB is pressed together to form a solid board and the other portion of the flex PCB is in layer or layers form. A metal plate mounts the flex PCB to the stiffener of the probe interface board. The flex PCB is electrically connected to the probe interface board by connectors, soldering or other known method.||12-30-2010|
Patent applications by Corad Technology Inc.