| CI SYSTEMS LTD. Patent applications |
| Patent application number | Title | Published |
|---|
| 20110279681 | ROOM-TEMPERATURE FILTERING FOR PASSIVE INFRARED IMAGING - A device, for imaging a scene, includes a detector of the radiation that includes a plurality of detector elements, a circularly variable filter, a mechanism for rotating the filter perpendicular to the optical path of the radiation from the scene to the detector, and a data capture apparatus. All the detector elements are repeatedly interrogated by as a group as the filter rotates, to acquire images of the scene, each of which includes a plurality of image portions in respective spectral bands of the filter. The image portions are assembled to form processed images, each of which depicts the scene in a single respective spectral band. | 11-17-2011 |
| 20110181730 | ROOM-TEMPERATURE FILTERING FOR PASSIVE INFRARED IMAGING - A device, for imaging infrared radiation from a scene, includes a detector of the infrared radiation, an enclosure for keeping the detector at an operating temperature thereof, an optical system, outside the enclosure, for focusing the infrared radiation onto the detector via a window of the enclosure, and a filter. In one embodiment, the filter is positioned at an intermediate focal plane of the optical system. In another embodiment, the filter is on a surface of an optical element of the optical system and has a defocusing relationship to the detector. | 07-28-2011 |
| 20090040506 | REFLECTIVITY/EMISSIVITY MEASUREMENT PROBE INSENSITIVE TO VARIATIONS IN PROBE-TO-TARGET DISTANCE - Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different conditions, and then these two or more measurements are combined in order to calculate the target reflectivity in a way which is independent of the probe-to-target distance. In particular, the different conditions are such that each measurement samples radiation reflected from the target surface at a different distribution of angles. The apparatus can also be used to accurately measure the distance between the probe measurement head and a target surface. | 02-12-2009 |
