| CHROMA ATE INC. Patent applications |
| Patent application number | Title | Published |
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| 20120101782 | PROCESS AND APPARATUS FOR MEASURING SPECTRAL RESPONSE OF SOLAR CELL, AND PROCESS FOR COMPENSATING DECAY OF LIGHT SOURCE - The invention employs a group of LED devices as a light source for emitting light with different wavelengths towards the solar cell under test. A set of test signal data composed of mutually orthogonal test signals are used to power the LED devices to emit light. The solar cell, upon receiving light from the LED devices powered by the test signal data, generates detected values which are in turn converted into electric signals. A processor device is then used to separate component signals contributed by the respective LED devices from the signals and compare the component signals to the output power level corresponding to the test signal data and/or to the optical energy levels radiated from the respective LED devices, thereby obtaining the spectral response of the solar cell to the different wavelengths of light. | 04-26-2012 |
| 20120013897 | DISTANCE ADJUSTMENT SYSTEM FOR USE IN SOLAR WAFER INSPECTION MACHINE AND INSPECTION MACHINE PROVIDED WITH SAME - The present invention relates to a distance adjustment system and a solar wafer inspection machine provided with the system. The inspection machine has a conveyer for carrying a solar wafer, an optical inspection system for inspecting the surface and color appearance of the wafer and an illumination inspection system. A holder is provided in the inspection position where the wafer is clamped along its width direction to prevent the wafer from offset. During the opto-electrical inspection, probes are brought into contact with conductive buses of the wafer and light is applied to the wafer to allow the probing of electric energy thus generated. An adjusting device is employed to adjust the clamping gap of the holder and the distance of the probes in accordance with the size of the solar wafer. The data are collected and transmitted to a sorting system for sorting the wafer. | 01-19-2012 |
| 20120013348 | TEST FIXTURE FOR TESTING SEMICONDUCTOR DIE WITH ITS LOADING MEMBER MAINTAINED FLAT THROUGHOUT THE TEST - A test fixture for testing a semiconductor die with its loading member maintained flat throughout the test is disclosed. The test fixture includes a loading member and a frame. The loading member includes a base film having a melting point higher than a thermal equilibrium temperature thereof, wherein the thermal equilibrium temperature is achieved due to heat transfer from the semiconductor die under test to the base film via the adhesive layer. The loading member further includes an adhesive layer made of electrically conductive adhesive material. The loading member is adapted for securing diced LED dies in position and maintained flat throughout the die testing process, thereby ensuring the accuracy of testing for optical and electrical properties of the dies. | 01-19-2012 |
| 20110317169 | IMAGING APPARATUS AND METHOD THEREOF - An imaging apparatus includes a light source; a first beam splitter for reflecting a projection beam emitted by the light source; an objective lens unit including a reflection reference surface for reproducing the projection beam into a measurement beam projected onto an object to generate a first reflection beam and a reference beam projected onto the reflection reference surface to generate a second reflection beam mixing with the first reflection beam and passing through the first splitter and forming an operating beam; a second beam splitter for modulating the operating beam into first and second sub-beams; a monochrome image detection device for passage of the first sub-beam to obtain an interferometric image with monochrome from a first interference region; and an image detection device for permitting passage of the second sub-beam in order to obtain a non-interferometric image from a second interference region. | 12-29-2011 |
| 20110188036 | MONOCHROMATIC MEASUREMENT SYSTEM - The present invention relates to a monochromatic measurement system. The system mainly includes a monochromator, a light-detecting device and a filter device. The monochromator functions to split light under test into respective light beams with different wavelengths. The filter device modulates the transmission efficiency of the respective light beams, so that the wavelengths of the light beams to which the light-detecting device displays a better response have a lower transmission efficiency while the wavelengths of the light beams to which the light-detecting device displays a lower response have a higher transmission efficiency. The response values measured by the light-detecting device with respect to different wavelength intervals are normalized accordingly. The measurement errors attributed to the measurement precision of the instrument and the environmental noise are independent from the variation of wavelength. The reliability of the measurement instrument is elevated. | 08-04-2011 |
| 20110175575 | Battery Charging/Discharging System - A battery charging/discharging system is provided. This system includes a recycling cable and plural charging/discharging controllers. Each of the charging/discharging controllers is corresponding to a battery. When the battery is in a discharging mode, a discharging current outputted from the battery flows to the recycling cable via the charging/discharging controller. When the battery charging/discharging system is operated, the recycling cable has a recycling voltage equal to a DC voltage. | 07-21-2011 |
| 20110066417 | ELECTRONIC LOAD FOR SIMULATING CHARACTERISTICS OF AN LED AND METHOD FOR OPERATING THE SAME - An electronic load simulates an LED is to output a simulation signal after receiving an input signal. The simulation signal has a voltage value and a current value approximating to a characteristic curve of a real LED. The electronic load comprises a processor, an amplifier, and a control unit. The processor receives a control command to set up the LED. The control command includes a forward voltage parameter and an equivalent impedance parameter. The control unit generates an adjustment command according to the foregoing parameters and the voltage of the power source. The amplifier receives and further adjusts the adjustment command so as to output the simulation signal. | 03-17-2011 |
| 20100201324 | BATTERY CHARGING AND DISCHARGING APPARATUS AND METHOD - The invention provides a battery charging and discharging apparatus and method. The battery charging and discharging apparatus comprises a power source and a plurality of charging and discharging module. The charging and discharging module comprises a current-limiting transistor, a current-limiting resistor, a charging controlling unit, and a discharging controlling unit, wherein both the charging controlling unit and the discharging controlling unit are of battery voltage tracking types. When the charging and discharging module charges a battery, the voltage across two ends of the current-limiting transistor and the current-limiting resistor connected in series is limited to a fixed value by the charging controlling unit. When the battery discharges, the voltage across two ends of the current-limiting transistor and the current-limiting resistor connected in series is limited to a fixed value by the discharging controlling unit. Besides, the discharging controlling unit feedbacks the discharging energy from the battery to the power source. | 08-12-2010 |
| 20090309606 | SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES - A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area. | 12-17-2009 |
| 20090161311 | Top mount surface airflow heatsink and top mount heatsink component device - It's a type of top mount surface airflow heatsink, utilizing the upper ceiling wall separated by an air gap, working together with the upper surface of a heating device (microprocessor) producing an air current. It's a simple device, with a low cost using the Reynolds Equation Re=(ρu | 06-25-2009 |
| 20080266797 | Surface airflow heatsink device and the heatsink device components - It's a type of top mount surface airflow heatsink, utilizing the upper ceiling wall separated by an air gap, working together with the upper surface of a heating device (microprocessor) producing an air current. It's a simple device, with a low cost using the Reynolds Equation Re=(ρu | 10-30-2008 |
