| CHRISTIAN-ALBRECHTS-UNIVERSITAT ZU KIEL Patent applications |
| Patent application number | Title | Published |
|---|
| 20120116725 | Method and Arrangement for Reconstructing the Source of an Electromagnetic Field - The disclosure relates to a method for reconstructing the source of an electromagnetic field. Firstly, a measurement space separate from the source is selected so that the measurement space is connected to the source via a magnetically homogeneous spatial region. Measured values of the electromagnetic field emitted by the source are recorded on the surface of the measurement space so that the electromagnetic field in the measurement space can be uniquely determined in the context of an error bound determined by the discreteness of the measured values. A mathematical model of the electromagnetic source is developed which has a multiplicity of unknowns, and a system of equations is set up that relates the unknowns of the model to the measured values. The system of equations is solved in order to determine the characteristics of the electromagnetic source. The disclosure also relates to an arrangement for carrying out the method. | 05-10-2012 |
| 20110012636 | MEASURING METHOD AND DEVICE FOR CHARACTERIZING A SEMICONDUCTOR COMPONENT - A measuring method for characterizing a semiconductor component ( | 01-20-2011 |
| 20100285229 | Method for Generating Oxidic Nanoparticles from a Material Forming Oxide Particles - A method for generating oxidic nanoparticles from a material forming oxide particles, comprising the steps of: preparation of an aqueous solution containing ions of the material forming the oxide particles, film evaporation of the solution at a temperature above 200° C., and skimming off the nanoparticles floating on the surface of the aqueous solution generated in the vicinity of the vapour film on film evaporation. A device for performing the method is also provided. | 11-11-2010 |
