CHENG YUN TECHNOLOGY CO., LTD. Patent applications |
Patent application number | Title | Published |
20140266278 | PROBE NEEDLE - A probe needle for connecting to a circuit board for inspection and to an inspection main board of a testing apparatus includes a conductive shaft having two ends of a connection end and an inspection end for contacting with the circuit board for inspection. An elastic conductive rod is axially connected to the conductive shaft and having two ends of a free end and a fixed end; wherein the free end is connected to the connection end of the conductive shaft and the fixed end abuts the inspection main board. The probe needle has a simplified structure facilitating the manufacturing of parts and assembly thereof. | 09-18-2014 |
20140266277 | SEMICONDUCTOR TESTING PROBE NEEDLE - A semiconductor testing probe needle for connecting to a circuit board for inspection and to an inspection main board of a testing apparatus includes a conductive shaft having two ends of a connection end and an inspection end for contacting with the circuit board for inspection. A spring column includes one end electrically connected to the connection end of the conductive shaft and another end abuts the inspection main board. A conductive wire is arranged along the spring column and includes one end electrically connected to the conductive shaft and another end provided to be electrically connected to the inspection main board. | 09-18-2014 |