Checkpoint Technologies LLC Patent applications |
Patent application number | Title | Published |
20150219709 | REMOTELY ALIGNED WAFER PROBE STATION FOR SEMICONDUCTOR OPTICAL ANALYSIS SYSTEMS - A test station holds a semiconductor wafer during electrical testing with an electrical test apparatus and optical inspection with an optical system. The test station allows wafer probing to be aligned external to the optical system. After the wafer is in alignment, the test station may be transported to the optical system for inspection from a back side of the wafer while having electrical testing by the electrical test apparatus from the front side. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. | 08-06-2015 |
20150153232 | MICROSCOPE WITH DETECTOR STOP MATCHING - A microscope includes a detector device having an enclosure and an infrared sensitive detector array disposed within the enclosure. The enclosure may be cryogenically cooled and have an aperture which defines an aperture stop for an optical path extending to the detector array. The microscope may have a microscope objective with an objective exit pupil, and the microscope may include one or more intermediate optical elements which are configured to image at least a portion of the objective exit pupil at the aperture stop while simultaneously focusing light from an object transmitted through the objective at the detector array. | 06-04-2015 |
20150103181 | AUTO-FLAT FIELD FOR IMAGE ACQUISITION - Image correction may comprise acquiring a pixel value for each pixel in a raw image of a sample; obtaining a corresponding filtered pixel value for each pixel in the raw image by applying a filtering function to a subset of pixels in a window surrounding each pixel; obtaining pixel values for a final image by performing a pixel-by-pixel division of each pixel value of the raw image by the corresponding filtered pixel value; and displaying or storing the final image. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. | 04-16-2015 |