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CENTRE DE RECHERCHE INDUSTRIELLE DU QUÉBEC

CENTRE DE RECHERCHE INDUSTRIELLE DU QUÉBEC Patent applications
Patent application numberTitlePublished
20100284609Apparatus and method for measuring size distribution of granular matter - A method and apparatus for measuring size distribution of bulk matter consisted of randomly orientated granules, such as wood chips, make use of scanning the exposed surface of the granular matter to generate three-dimensional profile image data defined with respect to a three-coordinate reference system, The image data is segmented to reveal regions associated with distinct granules, and values of the size-related parameter for the revealed regions are estimated. Then, a geometric correction to each ones of estimated size-related parameter values is applied, to compensate for the random orientation of corresponding distinct granules. Finally, the size distribution of bulk matter is statistically estimated from the corrected size-related parameter values.11-11-2010
20100121473System and method for optimizing lignocellulosic granular matter refining - A system and method for optimizing a process for refining lignocellulosic granular matter such as wood chips use a predictive model including a simulation model based on relations involving a plurality of matter properties characterizing the matter such as moisture content, density, light reflection or granular matter size, refining process operating parameters such as transfer screw speed, dilution flow, hydraulic pressure, plate gaps, or retention delays, at least one output controlled to a target such as primary motor load or pulp freeness, and at least one uncontrolled output such as specific energy consumption, energy split, long fibers, fines and shives. An adaptor is fed with measured values of matter properties and measured values of controlled and uncontrolled outputs, to adapt the simulation model accordingly. An optimizer generates a value of the target according to a predetermined condition on a predicted uncontrolled output parameter and to one or more process constraints.05-13-2010