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CELTRAST LLC
| CELTRAST LLC Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20090246144 | SYSTEM AND METHOD FOR INDIRECTLY MEASURING CALCIUM ION EFFLUX - A system and method for indirectly measuring calcium ion efflux from a cell of a subject by using manganese ions as a surrogate marker for calcium is disclosed. Manganese ion efflux is measured with a MEMRI T | 10-01-2009 |