CAPITAL NORMAL UNIVERSITY Patent applications |
Patent application number | Title | Published |
20140340732 | A PLANAR OPTICAL COMPONENT AND ITS DESIGN METHOD - This invention relates to a planar optical component and a design method thereof, the method including designing a structure with defined discrete phases; based on the structure with defined discrete phases as array elements, designing a 2D thin antenna array; constituting the planar optical component by a metal film having the 2D thin antenna array and a substrate. To achieve expected beam shaping effect, the method according to the embodiment of the present invention modulates structural parameters of antenna array elements to modulate the amplitude and phase of radiation field having vertical polarization states, which is excited by a beam having specific wavelengths and polarization states incident on the planar diffractive optical component. The planar diffractive optical component according to the embodiment of the present invention has little difference from expected parameters, and can achieve optimum beam shaping effect to make up the shortfall of conventional beam shaping elements. | 11-20-2014 |
20140198973 | TERAHERTZ TEMPORAL AND SPATIAL RESOLUTION IMAGING SYSTEM, IMAGING METHOD AND APPLICATION THEREOF - A terahertz temporal and spatial resolution imaging system is provided. The system includes: a sample placing rack; a detection crystal, located on the exit side of the sample placing rack; a pump light generating device, for generating a pump light to irradiate the test sample; a terahertz light generating device, for generating a terahertz light to irradiate the test sample, irradiate the detection crystal after obtaining information about the test sample, and modulate an index ellipsoid of the detection crystal; a detection light generating device, for generating a detection light to irradiate the detection crystal to detect the index ellipsoid of the detection crystal, thereby indirectly obtaining the information about the test sample; and an imaging apparatus, located in an optical path after the detection light passes through the detection crystal, for collecting terahertz images of the test sample. | 07-17-2014 |
20140153608 | METHOD FOR MEASURING THICKNESS BY PULSED INFRARED THERMAL WAVE TECHNOLOGY - A method for measuring thickness or defect depth by pulsed infrared thermal wave technology is described. The method includes heating a measured object by pulsed heating devices, and at the same time, obtaining a thermal image sequence on the surface of the measured object by an infrared thermography device, and storing the thermal image sequence in a general-purpose memory. The method also includes multiplying a temperature-time curve at every point of the thermal image sequence by a corresponding time, thereby obtaining a new curve. The method also includes calculating a first-order differential and obtaining a peak time thereof. The method also includes use of one or more formulas to thereby determine the thickness or the defect depth of the measured object. | 06-05-2014 |