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BRUKER AXS, INC.

BRUKER AXS, INC. Patent applications
Patent application numberTitlePublished
20110268251METHOD AND APPARATUS FOR USING AN AREA X-RAY DETECTOR AS A POINT DETECTOR IN AN X-RAY DIFFRACTOMETER - An area detector used in a two-dimensional system is used as a point detector in Bragg-Brentano and other geometries by providing the area detector with a mask the limits the area through which X-rays can enter the detector. Secondary X-ray optics and a monochromator that are part of the diffractometer geometry are attached to the area detector mask to allow a fast and easy switch between the two-dimensional detector mode and the point detector mode. A concave detector mask is used with a spherical detector in order to reduce the secondary beam path and increase detector efficiency and the opening in the detector mask can be offset from the mask center to achieve high 2θ angle measurements. Single channel bypath electronics are used to disregard the dimensional position of each X-ray count to increase the efficiency and speed of the system.11-03-2011
20100002842CATHODE ASSEMBLY FOR RAPID ELECTRON SOURCE REPLACEMENT IN A ROTATING ANODE X-RAY GENERATOR - A cathode assembly for a rotating anode X-ray source comprises two parts: a focusing part that is mechanically connected to the remainder of the X-ray source and permanently aligned with respect to the anode and a separate emission part that holds the electron source and is removably connected to the focusing part. The electron source is permanently mounted in the emission part and precisely aligned to the focusing part. The focusing part and the emission part are mechanically connected aligned relative to one another at the time of replacement. This arrangement allows the emission part, including the electron source to be quickly removed and replaced by an inexperienced user while maintaining the accuracy of the X-ray source alignment.01-07-2010
20090274274HANDHELD TWO-DIMENSIONAL X-RAY DIFFRACTOMETER - A handheld X-ray diffractometer comprises a miniaturized X-ray source and multiple area detectors to allow the diffractometer to obtain two-dimensional X-ray diffraction images in a large diffraction space without rotating the sample. The source and detectors are located inside of a radio opaque enclosure that protects the operator during use. The handheld diffractometer also comprises a sample monitoring and alignment system that allows an operator to observe the measuring area and to align the diffractometer to the sample from outside of the housing. A specially designed mouthpiece, which mates the diffractometer to the sample area, prevents x-ray leakage and triggers off the data collection. The detectors can be positioned to perform measurements necessary to calculate a mechanical stress in the sample. Linear detectors may also be used in place of the area detectors.11-05-2009

Patent applications by BRUKER AXS, INC.