| Bruker AXS GmbH Patent applications |
| Patent application number | Title | Published |
|---|
| 20120106706 | Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source - A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analyses with multiple characteristic energy lines are possible without any need for conversion or switchover. | 05-03-2012 |
| 20120002787 | Method for determining the quantitative composition of a powder sample - A method for automatic determination of the quantitative composition of a powder sample, comprises the following steps: (a) predetermining a list of phases; (b) calculating a theoretical diffraction diagram or theoretical energy-dispersive spectrum; (c) fitting the theoretical diffraction diagram or theoretical energy-dispersive spectrum. In step (a), a list is predetermined which is composed of phases that are actually contained in the powder sample and also phases that are possibly not contained in the powder sample, a threshold value for the phase content is predetermined for each phase, and the following further steps are carried out: (d) elimination of all phases, having phase contents which are below the threshold value, from the list in step (a); (e) repeating steps (b), (c) and (d) with the new list until all phase contents are above their predetermined threshold values; and (f) outputting the composition of the powder sample. This method permits automatic exclusion of amorphous or crystalline phases with phase contents below a user-definable threshold value in profile adjustment methods based on Rietveld or Pawley methods. | 01-05-2012 |
| 20110135059 | X-ray optical configuration with two focusing elements - An X-ray optical configuration ( | 06-09-2011 |
| 20100195795 | X-Ray multichannel spectrometer - An X-ray multichannel spectrometer comprising a polychromatic source ( | 08-05-2010 |
| 20100150310 | X-RAY REFLECTOMETRY SYSTEM WITH MULTIPLE SAMPLE HOLDER AND INDIVIDUAL SAMPLE LIFTING MECHANISM - An X-ray reflectometry apparatus comprises an X-ray source ( | 06-17-2010 |
| 20100135460 | X-ray optical element and diffractometer with a soller slit - An X-ray optical element ( | 06-03-2010 |
| 20100111266 | Secure housing for an X-ray apparatus with combined pivoting and sliding door - A safety housing ( | 05-06-2010 |
| 20100107499 | Door configuration with a pivoting door and sliding door function wich can be actuated by a single actuating element - A door configuration ( | 05-06-2010 |
| 20090262895 | X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position - An X-ray diffractometer ( | 10-22-2009 |
