BEIJERT ENGINEERING
BEIJERT ENGINEERING Patent applications | ||
Patent application number | Title | Published |
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20140015955 | PROBE APPARATUS - The present invention generally relates to methods and apparatuses for ensuring the integrity of probe card assemblies, verifying that probe cards are ready for testing, and allowing analysis of probe card performance characteristics. In one embodiment, an apparatus allows rework of a probe card at an angle from a front position of the apparatus. | 01-16-2014 |