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BAM Bundesanstalf Fur Materialforschung und-prufung
Berlin, DE
| BAM Bundesanstalf Fur Materialforschung und-prufung Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20100219333 | METHOD AND KIT FOR CALIBRATING A PHOTOLUMINESCENCE MEASUREMENT SYSTEM - The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra I | 09-02-2010 |