B3 Systems, Inc. Patent applications |
Patent application number | Title | Published |
20140159747 | Methods and Circuits for Measuring a High Impedance Element Based on Time Constant Measurements - A method of measuring impedance includes determining a first time constant based on a known impedance and a capacitor, determining a second time constant based on a target impedance and the capacitor, and determining the target impedance based on the first time constant and the second time constant. | 06-12-2014 |
20120304730 | METHODS, SYSTEMS, AND APPARATUS FOR GENERATING A GAS STREAM HAVING A DESIRED PARTICULATE MATERIAL CONCENTRATION - A method validating a particulate monitoring device includes generating a final gas stream having a particulate material concentration that corresponds to a target particulate material concentration, using the particulate monitoring device to measure the particulate material concentration in the final gas stream, and evaluating an accuracy of the particulate monitoring device based on a comparison of the particulate concentration in the final gas stream that was measured by the particulate monitoring device with the target particulate material concentration. | 12-06-2012 |