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Axometrics, Incorporated

Axometrics, Incorporated Patent applications
Patent application numberTitlePublished
20090296089Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements - Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (12-03-2009
20090296088Method and apparatus for determining liquid crystal cell parameters from full mueller martix mesaurements - Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (12-03-2009