| ATRENTA, INC. Patent applications |
| Patent application number | Title | Published |
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| 20120042294 | APPARATUS AND METHOD THEREOF FOR HYBRID TIMING EXCEPTION VERIFICATION OF AN INTEGRATED CIRCUIT DESIGN - Timing Constraints are crucial to meet timing requirements of an Integrated Circuit (IC). Timing exceptions are specified so that certain paths of the design of the IC are not timed as they are not relevant for the speed of the IC. If a path is specified as an exception but it is indeed a timing-relevant path then the design may functionally fail due to timing violations ignored by the timing analysis tools. It is therefore extremely important to ensure that all timing exceptions are correctly specified. The Hybrid Timing Exceptions Verification uses static verification as well as dynamic verification to effectively verify correctness of such timing exceptions. The solution pin-points the errors in the exceptions specification with very low number of false errors that would require significant designer inputs and time to manually waive them. | 02-16-2012 |
| 20110288825 | METHOD AND SYSTEM FOR EQUIVALENCE CHECKING - As part of the design process it is required to design circuits in order to reduce their power consumption. This is typically done by enabling or disabling flip-flops (FFs), however, such change in the circuit requires certain verification. As sequential clock gating changes the state function it is necessary to perform a sequential equivalence checking (SEC) verification. Applying a full SEC may be runtime consuming and is not scalable for large designs. Methods to reduce the problem of verifying sequential clock gating by reducing the sequential problem into much smaller problem that can be easily solved is therefore shown. | 11-24-2011 |
| 20110099400 | METHOD AND SYSTEM THEREOF FOR OPTIMIZATION OF POWER CONSUMPTION OF SCAN CHAINS OF AN INTEGRATED CIRCUIT FOR TEST - Scan blocks with scan chains are used to partition and test semiconductor devices using scan groups. The partitioning of the semiconductor device enables testing of all elements within each scan block, at speed, to provide fault coverage. A challenge in scan testing is keeping the power dissipation during testing under the allowed power capabilities of the tester power supplies, as the power used during scan test is much higher than that used during functional testing. A method for estimating the power dissipation of scan blocks in a circuit during the design stage is disclosed. Using the results generated, the circuit designer divides the design into an optimum number of scan blocks for test. Thus at-speed scan of the individual or groups of scan blocks can be estimated, during design, for optimizing test time while keeping the test power within acceptable limits. | 04-28-2011 |
| 20100064263 | METHOD FOR COMPACTION OF TIMING EXCEPTION PATHS - A technique and apparatus for reducing the complexity of optimizing the performance of a designed semiconductor circuit is disclosed. This technique of path compaction is used to reduce the time taken for optimization. The path compaction tool is used in design optimization to reduce the optimizer execution time. Compaction helps readability, usability and reduces synthesis and static timing analyzer (STA) runtime. The aim of path compaction is to reduce the number of constraints the optimizer has to go through during the optimization process. Path compaction has three dimensions. The first is to reduce number of “-through” elements in the constraint, thereby reducing the complexity of constraints developed The second is to combine the paths to reduce the number of constraints. The third is to combine the constraints to reduce the number of constraints to be checked and optimized. Path compaction is used when generating timing exception using timing exception tools. | 03-11-2010 |
| 20090044033 | METHOD FOR COMPUTING POWER SAVINGS AND DETERMINING THE PREFERRED CLOCK GATING CIRCUIT OF AN INTEGRATED CIRCUIT DESIGN - A method for computing the power savings in an integrated circuit (IC) design is disclosed. The method computes the difference in power savings between techniques used for clock gating. Based on the computation results, the method outputs a script to control the implementation tool so as to provide for the best implementation clock gating technique in terms of power and area savings. | 02-12-2009 |
| 20080301598 | METHOD FOR CHECKING CONSTRAINTS EQUIVALENCE OF AN INTEGRATED CIRCUIT DESIGN - The equivalence of two or more constraint files of an integrated circuit (IC) design are checked. The comparison is performed between files at the same stage of design, files that correspond to different stages of the design flow, or between top-level and block-level constraint files. | 12-04-2008 |
| 20080288904 | METHOD FOR MODELING AND VERIFYING TIMING EXCEPTIONS - A method and system for timing exception verification in integrated circuit (IC) designs included verification of functional false paths as well as multi-cycle paths (MCPs). A false path or a MCP is modeled to a satisfiability formula and the formula is validated using a Boolean satisfiability solver. Time required for timing exception verification can be significantly reduced. | 11-20-2008 |
| 20080244472 | METHOD FOR ACCELERATING THE GENERATION OF AN OPTIMIZED GATE-LEVEL REPRESENTATION FROM A RTL REPRESENTATION - A method for accelerating the generation of an optimized netlist from a RTL representation is provided. The method optimizes a given RTL description of an integrated circuit (IC) design by: generating a static single assignment (SSA) graph; creating value range propagation for each variable in the SSA graph; and, applying one or more of a set of optimization algorithms on the SSA graph. The optimization algorithms include, but are not limited to, dead-code elimination, bitwidth analysis, redundancy elimination, iteration loop optimization, algebraic simplification and so on. These algorithms operate on a word-level description to enable fast optimization. Furthermore, the optimized RTL accelerates the overall flow of an IC design. | 10-02-2008 |
| 20080201671 | METHOD FOR GENERATING TIMING EXCEPTIONS - A method for generating timing exceptions for integrated circuit (IC) designs is disclosed. The method includes synthesizing an input RTL description into a gate-level netlist mapped to a technology library; detecting timing critical paths in the netlist; and determining for each detected timing critical path whether it induces timing exceptions. The timing exceptions generated by the disclosed method include, but are not limited to, multi-cycle paths, clock domain crossing false paths, asynchronous false paths, functional false paths, combinational false paths, sequential false paths, timing false paths, and the like. | 08-21-2008 |
