Applied Filter Technology, Inc.
Applied Filter Technology, Inc. Patent applications | ||
Patent application number | Title | Published |
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20130137567 | DEVICE TO CLEAN SILOXANES FROM BIOGAS, AND A METHOD OF REGENERATING THE SAME INCLUDING ELECTRIC SWING ADSORPTION - A siloxane-adsorbent media regeneration device, system and method comprising a rectangular cylinder with first and second dielectric elements forming opposing first and second sides, and first and second electrodes forming opposing third and fourth sides thereof, and end caps disposed at opposing ends thereof. A capacitive device is coupled with the dielectric elements and configured to detect a capacitance of an adsorbent media, and a switchable heat source coupled with each of the first and second dielectric elements. A pressure vessel is configured to receive the rectangular cylinder therein, and includes apertures to permit inflow and outflow of a gas. A vibration-generating device may be coupled with one of the electrodes, as well as with a control system. Regeneration generally includes passing an electrical current through an adsorbent medium, detecting a capacitance indicating that regeneration is warranted, and heating the adsorbent medium while conveying an inert gas therethrough. | 05-30-2013 |
20120303290 | REALTIME SILICON DETECTION SYSTEM AND METHOD FOR THE PROTECTION OF MACHINERY FROM SILOXANES - An inline siloxane detection system including each of an inductively coupled plasma (ICP) exciter; a beam splitter to split a light beam emitted from the ICP exciter into secondary light beams; a first signal filter selectively configured for a wavelength corresponding to silicon and configured to receive a first secondary light beam from the beam splitter; a first detector configured to detect a silicon-indicating wavelength in the first secondary light beam; a second signal filter configured to receive second secondary light beam from the beam splitter, and further selectively configured for a background wavelength of the second secondary light beam; a second detector configured to receive and detect a filtered signal from the second signal filter; and a processor configured to receive signals from each of the first detector and the second detector and to calculate a concentration of silicon in the gas sample. | 11-29-2012 |