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ALTIS SEMICONDUCTOR
Corbeil Essonnes Cedex, FR
| ALTIS SEMICONDUCTOR Patent applications | ||
| Patent application number | Title | Published |
|---|---|---|
| 20090161460 | RETENTION TEST SYSTEM AND METHOD FOR RESISTIVELY SWITCHING MEMORY DEVICES - A retention test system and method for resistively switching memory devices is disclosed. One embodiment provides a plurality of memory cells configured to be changed over between a first state of high electrical resistance and a second state of low electrical resistance, wherein the system is configured to apply a bias voltage to at least one memory cell of the memory device to be tested. | 06-25-2009 |