inTEST Corporation Patent applications |
Patent application number | Title | Published |
20140317453 | METHOD AND APPARATUS FOR DOCKING A TEST HEAD WITH A PERIPHERAL - A method and apparatus for docking an electronic test head with a peripheral, which positions devices for testing. Exact-constraint alignment features, also sometimes known as kinematic features, are incorporated to provide repeatable positioning of the test head in three degrees of freedom with respect to the docking plane of the peripheral. A distinct alignment feature is used to provide planarity and to establish the required docked distance between the test head and the peripheral. The exact-constraint alignment features are mounted compliantly to enable them to position the test head in the plane while the test head is away from its final docked distance and to maintain that position as the test head is moved to its final docked position. | 10-23-2014 |
20140202269 | TEST HEAD MANIPULATOR - A test head manipulator system comprising a base structure, a main arm unit configured to support a test head and to be moved relative to the base structure, an actuator having a range of motion of L, and an enhancement mechanism positioned between the main arm unit and the actuator and configured such that movement of the actuator a first distance causes the main arm unit to move a second distance that is greater than the first distance. Additionally, a fluid control system for controlling a test head manipulator system. The pneumatic control system includes a regulator configured to controllably provide an output pressure to the main fluid actuator, and a second fluidly controlled actuator configured to adjust the regulator to modify the output pressure provided to the main fluid actuator. The second actuator is configured to be positively positioned in at least four operating modes with each operating mode causing the regulator to provide a different output pressure to the main fluid actuator. | 07-24-2014 |
20140180494 | TEST HEAD VERTICAL SUPPORT SYSTEM - A manipulator for translating a load along an axis of translation is provided. The manipulator comprises an outer column and a telescoping column positioned adjacent the outer column. The telescoping column is attached to the load and configured to translate the load along the axis of translation. At least one guiding member is mounted between the outer column and the telescoping column, wherein the guiding member is configured to guide the telescoping column as the telescoping column translates along the axis of translation. | 06-26-2014 |
20110305501 | TEST HEAD DOCKING SYSTEM AND METHOD - A system for docking an electronic test head with a handling apparatus is provided. The system includes an assembly for at least partially aligning and subsequently bringing together the electronic test head and the handling apparatus. The system includes a power driven actuator for powered bringing together of the electronic test head and the handling apparatus. | 12-15-2011 |
20110174098 | CRADLE & CABLE HANDLER FOR A TEST HEAD MANIPULATOR - In one aspect, a cradle system for supporting a load, the cradle system comprising a first arm with a first carriage assembly axially adjustable therealong and a second arm, opposite the first arm, with a second carriage assembly axially adjustable therealong. An actuator is associated with the first and second carriage assemblies and configured such that actuation of the actuator causes the first and second carriage assemblies to move axially in opposite directions. In another aspect, a cable support system comprising a support column and one or more tethers supported by the support column and configurable so that at least one tether is configured to move its supported cable in the same or opposite direction as the test head moves at a rate that is a constant multiplied by the test heads rate of motion where the constant may be greater than, equal to, or less than one. | 07-21-2011 |
20110057674 | TEST HEAD MANIPULATOR - A test head manipulator system comprising a base structure, a main arm unit configured to support a test head and to be moved relative to the base structure, an actuator having a range of motion of L, and an enhancement mechanism positioned between the main arm unit and the actuator and configured such that movement of the actuator a first distance causes the main arm unit to move a second distance that is greater than the first distance. Additionally, a fluid control system for controlling a test head manipulator system. The pneumatic control system includes a regulator configured to controllably provide an output pressure to the main fluid actuator, and a second fluidly controlled actuator configured to adjust the regulator to modify the output pressure provided to the main fluid actuator. The second actuator is configured to be positively positioned in at least four operating modes with each operating mode causing the regulator to provide a different output pressure to the main fluid actuator. | 03-10-2011 |
20100264907 | TEST HEAD POSITIONING SYSTEM AND METHOD - An apparatus for supporting a load includes pneumatic units and couplers coupled to opposite sides of the load. The couplers move the load parallel to a first axis responsive to actuation of the pneumatic units. At least one of the couplers rotate the load about a second axis orthogonal to the first axis. The load is compliant along the first axis and about the second axis At least one of the pneumatic units provides compliance along the first axis and about the second axis. | 10-21-2010 |
20100063637 | TEST HEAD VERTICAL SUPPORT SYSTEM - A manipulator for translating a load along an axis of translation is provided. The manipulator comprises an outer column and a telescoping column positioned adjacent the outer column. The telescoping column is attached to the load and configured to translate the load along the axis of translation. At least one guiding member is mounted between the outer column and the telescoping column, wherein the guiding member is configured to guide the telescoping column as the telescoping column translates along the axis of translation. | 03-11-2010 |
20100045323 | TEST HEAD POSITIONING SYSTEM AND METHOD - An apparatus for supporting a device, comprising a base assembly, a plurality of carrier columns extending from the base unit, and a plurality of vertical support plates, each vertically movable along a respective carrier column and including a pivotal device mounting bracket. A pneumatic unit including a piston rod is associated with each vertical support plate such that vertical motion of the piston rod controls vertical motion of the respective vertical support plate. | 02-25-2010 |
20080273201 | Signal Module With Reduced Reflections - Signal modules and methods for electrically interfacing with an electronic device are provided. The signal module includes a dielectric and a conductor extending through a surface of the dielectric. The surface of the dielectric is located away from perpendicular relative to an axis of the conductor and is located based on an electromagnetic field produced as a result of a signal flowing through the conductor. | 11-06-2008 |
20080258713 | MODULAR INTERFACE - An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot members coupling the first unit and the second unit. The pivot members enable motion in the following sequence as one of the first and second unit moves towards the other: a) pivotal motion between the first connection member and the second connection member; and b) linear motion which decreases linear distance between the first connection member and the second connection member while maintaining respective contact surfaces of the first and second connection members in parallel. | 10-23-2008 |
20080258712 | MODULAR INTERFACE - An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot members coupling the first unit and the second unit. The pivot members enable motion in the following sequence as one of the first and second unit moves towards the other: a) pivotal motion between the first connection member and the second connection member; and b) linear motion which decreases linear distance between the first connection member and the second connection member while maintaining respective contact surfaces of the first and second connection members in parallel. | 10-23-2008 |