STMICROELECTRONICS SAS Patent applications |
Patent application number | Title | Published |
20120148943 | Method for Determining A Grey Level Etch Mask - A method for determining, by means of a computer, a photolithography mask for the manufacturing a microstructure by grey level etching of a resist layer, this mask including a plurality of elementary cells, each including an opaque area arranged, in top view, in a non-peripheral portion of a transparent region or, conversely, in a transparent area arranged, in top view, in a non-peripheral portion of an opaque region, comprising the steps of:
| 06-14-2012 |
20100014749 | METHOD AND DEVICE FOR ADJUSTING THE DEPOSIT POSITION OF A SEMICONDUCTOR WAFER IN AN OVEN - A method for loading a semiconductor wafer into a process unit comprises opening the process unit, inserting a wafer into the process unit, adjusting the position of the wafer in the process unit so that it is in a certain position in relation to markers, and inserting a camera into the process unit facing the markers. The camera acquires an image of the markers and of a part of the wafer, and displays on a display screen the image acquired. The position of the wafer is adjusted according to the position of the wafer in relation to the markers on the image displayed. | 01-21-2010 |
20090201087 | DIFFERENTIAL INPUT AMPLIFIER - An amplifier comprises: first and second supply terminals intended to receive a DC supply voltage; a first branch coupled between the first and second supply terminals and including a first terminal of application of a differential signal to be amplified; a second branch coupled between the first and second supply terminals and including a second terminal of application of the differential signal to be amplified; a third branch coupled between the first and second supply terminals and including a first amplifier having an input terminal connected to the second branch and having an output terminal configured to be coupled to a load, and a measurement element configured to measure a current in the third branch; and a fourth branch coupled between the first and second supply terminals and including a second amplifier having an input terminal connected to the first branch, and a copying element configured to copy the current measured in the third branch. | 08-13-2009 |