INNOPSYS Patent applications |
Patent application number | Title | Published |
20110223679 | METHOD OF SEEKING AT LEAST ONE ANALYTE IN A MEDIUM LIKELY TO CONTAIN IT - A new method of seeking the presence of an analyte bound to a probe, wherein a periodic geometric pattern ( | 09-15-2011 |
20090218513 | FLUORESCENCE-BASED SCANNING IMAGING DEVICE - A device for analysing a specimen by fluorescence includes a confocal microscope, illumination means capable of emitting a light beam that converges, by means of an objective, on a focal spot, means for successively positioning the focal spot at various points on the specimen during analysis. The confocal microscope includes an objective mounted on a movable rapid-scan carriage driven in a reciprocating linear movement along a traverse direction by a rotating motor by means of a device of the connecting rod type. The specimen is placed on a movable support driven in a longitudinal movement and is able to move along the axis of the objective of the microscope in order to position the specimen relative to the focal spot. The excitation light spectrum is spread over the surface of the specimen in such a way that the excitation light reflected by the specimen and corresponding to the wavelengths close to fluorescence converge on points that are sufficiently distant from a diaphragm positioned in front of a device for measuring the fluorescence. | 09-03-2009 |
20090087019 | Method fo rthe simultaneous deposition of a set of patterns on a substrate by a macrostamp - A stamp for depositing materials in the form of imprints on a surface of a substrate. The stamp includes a template and pins joined at one end to a first face of the template. The pins are arranged on the first face of the template so that the faces of all the pins joined to the template can be placed in contact virtually simultaneously on the surface of the substrate. The disclosed embodiments also relate to a method for fabricating the stamp and to a method for the virtually simultaneous deposition of a large number of imprints of identical or different materials on the surface of the substrate using the stamp, for an analysis. | 04-02-2009 |