Texas Instruments Patent applications |
Patent application number | Title | Published |
20120325009 | STRAIN MEASUREMENT TEST MODULE - A test structure for measuring strain in the channel of transistors. A method of correlating transistor performance with channel strain. | 12-27-2012 |
20090096525 | Power amplifier - Methods to implement power control in a digital power amplifier are described. | 04-16-2009 |
20080315954 | Integrated Power Amplifier - Methods to implement low cost, high efficiency, low loss power combiner with novel matching circuits are disclosed. A narrow band power combiner enables a high power and high efficiency radio frequency power amplifier to be realized using multiple low voltage CMOS transistors or micro power amplifiers. The power combiner may be printed on a package substrate and realized either using single layer substrate through edge coupling or multiple layers substrate through broadside coupling. The micro power amplifiers may be fabricated using low voltage CMOS technology and electrical connections between the outputs from the micro power amplifiers and the power combiner may be provided through stud bumps in a flip chip technology. With the tunable matching circuits, the present invention allows the narrow band power combiner to be tuned to different frequencies. | 12-25-2008 |
20080204601 | AC Coupling Techniques For Video Drivers - A low bandwidth signal path is added to copy internal node DC signal to output node. Therefore, for a DC or low frequency signal, the output signal is controlled by this loop. On the other hand, a high frequency signal is not affected because of the low-bandwidth of added loop. Thus, both DC and AC coupling modes are realized for components such as low-voltage video drivers. | 08-28-2008 |