ELITE SEMICONDUCTOR MEMORY TECHNOLOGY INC. Patent applications |
Patent application number | Title | Published |
20150332769 | METHOD FOR PROGRAMMING SELECTED MEMORY CELLS IN NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE THEREOF - A method for programming memory cells of a selected word line has steps of: providing a first word line programming signal being at plurality of voltage levels in different programming slots of a current programming operation to the memory cells of the selected word line, wherein the first word line programming signal is a ramping voltage signal; and providing a second line programming signal being at plurality of voltage levels in different programming slots of a next programming operation to the memory cells of the selected word line, wherein the second word line programming signal is another one ramping voltage signal; wherein the highest voltage levels of the first and second word line programming signals are identical to each other, and a number of the voltage levels of the first word line programming signal is larger than that of the second word line programming signal. | 11-19-2015 |
20150270004 | Method for Performing Erase Operation in Non-Volatile Memory - A method for performing an erase operation in a non-volatile memory incorporates the steps of selecting a block on which to perform an erase operation; erasing the selected block using a plurality of erase pulses; receiving erase data of the selected block; determining an over-erase correction verify voltage level based on the erase data; and over-erase correcting the selected block until each cell within the selected block passes the over-erase correction verify voltage level. | 09-24-2015 |
20150269976 | VOLTAGE REGULATOR - A voltage regulator including an over-drive circuit and a control circuit is illustrated. The over-drive circuit receives a first voltage signal output from a sensing amplifier in a DRAM circuit, and regulates the first voltage signal according to an over-drive signal. The a control circuit electrically connected to the over-drive circuit receives a sense signal, and outputs the over-drive signal according to the sense signal, wherein the sense signal is asserted when a bit line in the DRAM circuit is sensed that an restoring and operation is performed. The over-drive signal goes down to a level of a second voltage signal from a current level thereof dependent on an external power merely when the sense signal is asserted but has not been asserted for a delay time, or otherwise, the over-drive signal is equal to the external power. | 09-24-2015 |
20150269975 | PROGRAMMABLE VOLTAGE GENERATOR FOR NONVOLATILE MEMORY DEVICE - An exemplary embodiment of the present disclosure provides a programming voltage generator for a nonvolatile memory device. The programming voltage generator comprises a power circuit, a detector, a switching circuit, a control signal generator, and a regulation circuit. The power circuit outputs a programming voltage according to a voltage control signal. The detector detects whether the programming voltage is larger than or equal to a breakdown voltage of the nonvolatile memory device, so as to output an indication signal. The switching circuit temporally drops the programming voltage according to the indication signal. The control signal generator generates a plurality of regulation control signals. The regulation circuit generates the voltage control signal according to the programming signal and the regulation control signals. | 09-24-2015 |
20150200659 | TRIANGULAR WAVE GENERATING CIRCUIT TO PROVIDE CLOCK SYNCHRONIZATION - A triangular wave generating circuit incorporates a capacitor, first, second, third, and fourth constant current sources, first and second switching units, a high/low level limiter, a clock generator, and a phase detecting unit. The first and second constant current sources charge the capacitor and the third and fourth constant current sources discharge the capacitor. The phase detecting unit compares an externally supplied clock signal with an internal clock signal and generates first and second phase signals base on a phase difference between the externally supplied clock signal and the internal clock signal. The second switching unit comprises a third switch and a fourth switch. The third switch couples the second constant current source to the capacitor in response to the first phase signal. The fourth switch couples the fourth constant current source to the capacitor in response to the second phase signal. | 07-16-2015 |
20150162096 | MEMORY TEST SYSTEM AND METHOD - An exemplary embodiment of the present disclosure illustrates a memory test system comprising a memory device, a probe card, and a tester. The memory device comprises a memory die with a plurality of memory banks, a plurality of input circuits, and a plurality of output circuits, wherein each of the input circuits has a first input pin and a second pin, the first input pins of the input circuits are used to read a plurality of patches of data stored in memory cells of the memory banks, and the second input pins are used to receive a compressed result. The output circuits receive compressed signals output from the input circuits, and the probe card mixes the compressed output signals output from the output circuits to output a mixed compressed output signal to the tester. | 06-11-2015 |
20150155873 | INPUT BUFFER WITH CURRENT CONTROL MECHANISM - An input buffer includes a first driving circuit, a second driving circuit, a pull up circuit, and a pull down circuit. The first driving circuit is arranged for driving a first input signal to generate an output signal. The second driving circuit is arranged for driving the output signal. The pull up circuit is arranged for selectively controlling the second driving circuit to pull up the output signal according to the first input signal and a second input signal. The pull down circuit is arranged for selectively controlling the second driving circuit to pull down the output signal according to the first input signal and the second input signal. | 06-04-2015 |
20150078112 | METHOD FOR AUTO-REFRESHING MEMORY CELLS IN SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR MEMORY DEVICE USING THE METHOD - An exemplary embodiment of the present disclosure illustrates a method for auto-refreshing memory cells in a semiconductor memory device with an open bit line architecture, wherein the semiconductor memory device comprises M memory banks, and each of the M memory banks has two particular sectors with a same index and L remained sectors with different indices. Two word lines of the two particular sectors with the same index in the memory bank and (M−1) word lines of the L remained sectors respectively in the other (M−1) memory banks are selected in one cycle. Then, memory cells of the selected word lines are refreshed. | 03-19-2015 |
20150058613 | METHOD OF BOOTING SYSTEM HAVING NON-VOLATILE MEMORY DEVICE WITH ERASE CHECKING AND CALIBRATION MECHANISM AND RELATED MEMORY DEVICE - A method of booting a system with a non-volatile memory device includes at least the following steps: when the system is powered on, reading a status flag of at least a memory block of the non-volatile memory device, wherein the status flag indicates whether an erase operation applied to the memory block is successfully completed; selectively performing a leakage calibration process upon the memory block according to the status flag; and booting the system according to a boot code stored in the non-volatile memory device. | 02-26-2015 |
20150023109 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device comprises a memory cell array, a staircase voltage generator, and a decode and level shift circuit. The memory cell array comprises a plurality of memory cells and a plurality of bit lines coupled to the plurality of memory cells. The staircase voltage generator generates a staircase voltage having a staircase waveform that varies in at least two steps. The decode and level shift circuit selects one of said plurality of bit lines and applies the staircase voltage as a program voltage to the selected bit line. | 01-22-2015 |
20150019927 | TEST SYSTEM AND DEVICE - An aspect of the present invention is to provide a test system for detecting whether a continuity fault condition, e.g., a short or open condition, exists in the path between a tester and chips on a wafer during a wafer level burn-in testing. According to one embodiment of the present invention, the test system comprises a probe card and n chips. The probe card comprises m first signal contacts for receiving m test signals from the tester, n second signal contacts for providing n test results to the tester, and a contact array. The probe card is in contact with the chips on the wafer through a plurality of needles. In this manner, the test system can detect whether the continuity fault condition exists in the path between the tester and the chips on the wafer during the wafer level burn-in testing. | 01-15-2015 |
20140301149 | SEMICONDUCTOR MEMORY DEVICE HAVING COMPRESSION TEST MODE - A semiconductor memory device having a compression test mode is provided. The semiconductor memory device comprises a memory unit, i test pads, a timing circuit, a compression circuit, and a signal distribution circuit. The memory unit comprises m memory banks divided into n activating groups, wherein each bank comprises a plurality of sensing amplifiers for sensing and amplifying data in bit lines. The timing circuit sequentially generates n control signals each for activating a plurality of sensing amplifiers in one of the n activating groups. The compression circuit compresses data sensed and amplified by the plurality of sensing amplifiers in each bank in a compression test mode. The signal distribution circuit distributes signals output from the compression circuit among the i data pads in rotation. The integer n and the integer i are adjustable. | 10-09-2014 |
20140219029 | PROGRAMMING METHOD FOR NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A method for programming a plurality of memory cells of a nonvolatile semiconductor memory device comprises the steps of: dividing the plurality of memory cells into M number of groups (M is an integer); successively selecting each of the M number of groups; generating M number of successive overlapping pulse signals; and programming the memory cells of the M number of groups in response to the respective M number of successive overlapping pulse signals. | 08-07-2014 |
20140191814 | OSCILLATION CONTROL CIRCUIT FOR BIASING RING OSCILLATOR BY BANDGAP REFERENCE SIGNAL AND RELATED METHOD - An oscillation control circuit for a ring oscillator includes a bandgap reference circuit and an oscillation frequency control circuit. The bandgap reference circuit is arranged for generating a bandgap reference signal by mirroring a proportional-to-absolute-temperature current. The oscillation frequency control circuit is coupled to the bandgap reference circuit, and is arranged for biasing the ring oscillator according to the bandgap reference signal. When the ring oscillator has a plurality of stages, the oscillation frequency control circuit includes one current source and a plurality of current mirrors for biasing the plurality of stages of the ring oscillator, respectively. | 07-10-2014 |
20140177334 | CIRCUIT FOR SENSING MLC FLASH MEMORY - A circuit for sensing a multi-level cell (MLC) flash memory is disclosed. The circuit comprises a plurality of first decoding units, a second decoding unit and a data latch. Each of the first decoding units provides a timing information and includes a controlled transistor to allow a current to pass therethrough, and a capacitor to be charged by the current or to discharge through the controlled transistor. The second decoding unit provides a latch signal and includes a controlled transistor to allow a current to pass therethrough, the magnitude of the current being associated with data in an MLC, and a capacitor to be charged by the current or to discharge through the controlled transistor. The data latch, in response to the timing information from each of the first decoding units and the latch signal from the second decoding unit, determines the data in the MLC. | 06-26-2014 |
20130308404 | CIRCUIT FOR SENSING MULTI-LEVEL CELL - A circuit for sensing a multi-level cell (MLC) comprises a first switch associated with a first read bit, a second switch associated with a second read bit, a first switch control unit to control the first switch in response to a first data bit from a counter, and a second switch control unit to control the second switch in response to a second data bit from the counter. | 11-21-2013 |
20130307515 | CIRCUIT FOR GENERATING A DUAL-MODE PTAT CURRENT - The present invention discloses a circuit for generating a dual-mode proportional to absolute temperature (PTAT) current. The circuit includes a voltage stabilizing circuit to provide a voltage reference, and a load current control circuit comprising a first transistor to provide a first load current based on the voltage reference, a second transistor to provide a second load current based on the voltage reference, a first switch to control whether to allow the first load current to flow therethrough in response to different predetermined temperatures, and a second switch to control whether to allow the second load current to flow therethrough in response to the different predetermined temperatures. A resultant current resulting from at least one of the first load current or the second load current has different current magnitudes at the different predetermined temperatures. | 11-21-2013 |
20130294178 | METHOD FOR REDUCING STANDBY CURRENT OF SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes memory cells, a sensing amplifier, a precharge circuit, and a control signal generator. The precharge circuit has a NMOS transistor and two PMOS transistors, and is used to precharge bit lines of a bit line pair, wherein the NMOS transistor is controlled by a first control signal, and the two PMOS transistors are controlled by a second control signal. The control signal generator is used to generate the first and second control signals, wherein the first control signal is at a logic high level only when the second control signal is at a first logic low level, the first control signal is at a logic low level when the second control signal is at a second logic low or a first logic high level, and the second logic low level is higher than the first logic low level. | 11-07-2013 |
20130188429 | TEMPERATURE-DEPENDENT SELF-REFRESH TIMING CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device with a self-refresh timing circuit is provided. The semiconductor memory device comprises a plurality of memory banks, a command decoder, a bank address generator, a self-refresh counter, and the self-refresh timing circuit. The self-refresh timing circuit comprises a temperature sensor, a reference voltage source, a comparison circuit, an enable circuit, and an oscillation circuit. The comparison circuit compares a voltage from the temperature sensor with a constant voltage from the reference voltage source and generates a comparison signal. The enable circuit activates the comparison circuit when self-refresh operations for at least one refresh row are completed in all memory cell banks. The oscillation circuit generates a self-refresh clock signal which controls the operating frequency of the bank address generator and the self-refresh counter. | 07-25-2013 |
20130100734 | APPARATUS AND METHOD FOR TRIMMING REFERENCE CELL IN SEMICONDUCTOR MEMORY DEVICE - A method of trimming a reference cell in a semiconductor memory device comprises the steps of: generating a reference current based on a bias voltage applied to the reference cell; generating a first current and a second current based on the value of a control voltage and the resistance of a precision resistor disposed outside the semiconductor memory device; comparing the reference current with the first current; comparing the reference current with the second current; programming the reference cell if the value of the reference current is greater than that of the first current; and erasing the reference cell if the value of the reference current is less than that of the second current. The value of the second current is less than that of the first current. | 04-25-2013 |
20130057322 | DELAY CIRCUIT AND DELAY STAGE THEREOF - A delay circuit includes at least a delay stage. The delay stage includes an inverting receiver, a capacitive element, an output inverter, and a feedback transistor. The inverting receiver includes a resistive element. An input node of the inverting receiver receives an input signal, and the resistive element is coupled to an output node and an internal node of the inverting receiver. A capacitive element is coupled to the output node of the inverting receiver. An input node of the output inverter is coupled to the output node of the inverting receiver, and an output node of the output inverter outputs an output signal of the delay stage. The feedback transistor is coupled between the output node and the input node of output inverter, such that the feedback transistor compensates a delay time of the inverting receiver as at least one of a process, a supply-voltage, and a temperature varies. | 03-07-2013 |
20130049830 | DELAY LOCK LOOP CIRCUIT - The invention provides a delay lock loop circuit (DLL) for generating a locked signal, the DLL circuit includes: a phase detector, a first and a second voltage controlled delay chains, a charge pump and a duty cycle detection pump. The phase detector generates a phase detecting result by detecting a phase difference between the clock signal and the locked signal. The first and the second voltage controlled delay chains generate a first and a second delayed signals by delaying the clock signal according to the first and the second control signals, respectively. The charge pump is used for generating the first and the second control signal according to the phase detecting result. The duty cycle detection pump is used for controlling a voltage level of the second control signal according to the first and the second delayed signals. | 02-28-2013 |
20130028029 | METHOD OF CONTROLLING OPERATIONS OF A DELAY LOCKED LOOP OF A DYNAMIC RANDOM ACCESS MEMORY - A method for controlling operations of a delay locked loop (DLL) of a dynamic random access memory (DRAM) is provided herein. A phase detector of the DLL compares an external clock signal with a feedback clock signal to generate a first control signal. A delay line circuit of the DLL delays the external clock signal according to the first control signal. A detector of the DRAM detects variations of the first control signal to determine a length of an enable period of an enable signal. The delay line circuit and the output buffer are active only during the enable period when the DRAM is in a standby mode. | 01-31-2013 |
20130021862 | DRAM AND METHOD FOR TESTING THE SAME IN THE WAFER LEVEL BURN-IN TEST MODE - A dynamic random-access memory (DRAM) and a method for testing the DRAM are provided. The DRAM includes a memory cell, a bit line associated with the memory cell, a local buffer, and a bit line sense amplifier (BLSA). The local buffer receives a first power voltage as power supply. The local buffer provides a ground voltage to the bit line when a data signal is de-asserted and provides the first power voltage to the bit line when the data signal is asserted. The BLSA receives a second power voltage as power supply. The BLSA provides the second power voltage to the bit line when the data signal and a wafer level burn-in test signal are both asserted. The second power voltage may be higher than the first power voltage. The wafer level burn-in test signal is asserted when the DRAM is in a wafer level burn-in test mode. | 01-24-2013 |
20130021855 | SEMICONDUCTOR MEMORY DEVICE - The present invention provides a semiconductor memory device, the voltage divider circuit comprises a data line sense amplifier and an input output data sensing circuit. The data line sense amplifier receives a data line signal pair and senses the data line signal pair in a first timing period to generate a first output data and a second output data, wherein, the first output data and the second output data are complementary. The input output data sensing circuit receives at least one reference output data and one of the first and the second output data. The input output data sensing circuit generates a sensed data by comparing voltage levels of the reference output data and the one of the first and the second output data in a second timing period, wherein the voltage level of the reference output data is a pre-determined voltage level. | 01-24-2013 |
20130021854 | ANTI-FUSE CIRCUIT - An anti-fuse circuit including a programmable module, a read module, and a control module is provided. The programmable module has a plurality of data cells. The read module is coupled to the programmable module. During a normal operation, the read module distinguishes which one or more of the data cells are stressed. The control module is coupled to the programmable module. During a stress operation, the control module controls each stressed data cell to be coupled to a high voltage, a low voltage, and a control voltage. The first end of each stressed data cells is coupled to the low voltage, the second end of each stressed data cells is coupled to the high voltage, and the control end of each stressed data cells is coupled to the control voltage during the stress operation. | 01-24-2013 |
20130021851 | ANTI-FUSE CIRCUIT AND METHOD FOR ANTI-FUSE PROGRAMMING AND TEST THEREOF - An anti-fuse circuit including a plurality of programmable units and a test module is provided. The programmable units receive a stress voltage, a program data, and a write enable signal. During a programming period, the programmable units sequentially transmit the program data. When the write enable signal is enabled, the stress voltage stresses the programmable units according to the program data, and the programmable units output programming results for test. The test module is coupled to the programmable units and receives the program data and the programming results. During a test period, the test module compares the programming results with the program data and outputs different logic levels according to a result of the comparison of the first programming results and the program data. A method for anti-fuse programming and test adapted to the foregoing anti-fuse circuit is also provided. | 01-24-2013 |
20120326695 | INTERMITTENTLY ACTIVATED BANDGAP REFERENCE CIRCUIT - A circuit for providing a reference voltage includes a bandgap reference circuit, a first unity gain buffer coupled to the bandgap reference circuit, a first switch for coupling a second reference voltage node to a third reference voltage node, a first capacitor coupled to the third reference voltage node, a second switch for coupling the third reference voltage node to a fourth reference voltage node, and a second capacitor coupled to the fourth reference voltage node, wherein during operation a fourth reference voltage at the fourth reference voltage node decays when the second capacitor discharges. A control circuit provides control signals for intermittently operating the bandgap reference circuit and for controlling the switches to recharge the second capacitor after the fourth reference voltage decays a predetermined amount. | 12-27-2012 |
20120287742 | CIRCUIT AND METHOD FOR OUTPUTTING REFRESH EXECUTION SIGNAL IN MEMORY DEVICE - A circuit for outputting a refresh execution signal to a memory cell of a memory device in an auto-refresh mode comprises a first frequency dividing unit, a first selection circuit, a second frequency dividing unit, and a second selection circuit. The first frequency dividing unit receives an auto-refresh signal from outside the memory device and generates a plurality of first divided signals. The first selection circuit generates a selection signal selected from the auto-refresh signal and the first divided signals. The second frequency dividing unit divides the frequency of the selection signal and generates a plurality of second divided signals. The second selection circuit generates the refresh execution signal from the selection signal and the second divided signals. | 11-15-2012 |
20120287739 | CIRCUIT AND METHOD FOR CONTROLLING LEAKAGE CURRENT IN RANDOM ACCESS MEMORY DEVICES - A circuit for controlling leakage current in random access memory devices comprises a pre-charge equalization circuit. The pre-charge equalization circuit provides a pre-charge voltage to a pair of complementary bit lines of a memory cell of a random access memory device in accordance with a pre-charge signal. When the memory cell is in a self-refresh mode, the pre-charge signal is activated by a periodically triggered pre-charge request and also activated before and after the memory cell is self-refreshed. | 11-15-2012 |
20120287737 | REPAIRING CIRCUIT FOR MEMORY CIRCUIT AND METHOD THEREOF AND MEMORY CIRCUIT USING THE SAME - A novelty repairing method and circuit are provided by the embodiments of the present invention, wherein the input/output (IO) compression manner can be used therein to reduce the access time during the chip probing 1 (CP1) test, and each redundant column selected line (RCSL) can be divided into several partial redundant column selected lines (P-RCSLs) which are respectively responsible for repairing the defects of the corresponding regions. Based upon the repairing method, the memory circuit can reduce the number of the RCSLs. Furthermore, a variable region dividing manner is applied therein, so as to increase the probability for repairing the defect of the memory circuit. | 11-15-2012 |
20120287721 | Programming Method for Nonvolatile Semiconductor Memory Device - A method for programming a plurality of memory cells of a nonvolatile semiconductor memory device comprises the steps of: sequentially performing a plurality of divide-by-2 operations on the plurality of memory cells; generating a plurality of reduced groups from the memory cells after each of the divide-by-2 operations is performed; sequentially programming the memory cells of each reduced group; generating a final group after a final divide-by-2 operation is performed; programming the memory cells of the final group; and verifying whether the memory cells of the final group are completely programmed. The memory cells of the final group are composed of all the memory cells of the nonvolatile semiconductor memory device and the verifying step is only performed after the step of programming the memory cells of the final group. | 11-15-2012 |
20120287717 | FLASH MEMORY DEVICE AND ASSOCIATED CHARGE PUMP CIRCUIT - A charge pump circuit comprises a first booster set, a second booster group, and a detecting circuit. The first booster set receives a supply voltage and generates a first output voltage. The detecting circuit generates a detecting signal depending on the voltage level of the first output voltage. The second booster group receives the supply voltage and generates the first output voltage or a second output voltage according to the detecting signal. The second booster group is composed of a plurality of booster sets connected in parallel, wherein each booster set comprises a plurality of charge pump stages and a plurality of switch units. The number of serially-connected charge pump stages of each booster set in the second booster group is controlled by the plurality of switch units according to the stable voltage levels of the first and second output voltages. | 11-15-2012 |
20120286838 | DELAY LINE CIRCUIT AND PHASE INTERPOLATION MODULE THEREOF - A phase interpolation module comprising a first, second, and third phase interpolation units is proposed. Each of the first, second, and third phase interpolation units comprises a first through third inverters, a first and second resistors, wherein the first resistor is coupled between an output end of the first inverter and an input end of the third inverter, and the second resistor is coupled between an output end of the second inverter and the input end of the third inverter. The first and second inverters of the first phase interpolation unit receive a first signal, the first and second inverters of the third phase interpolation unit receive a second signal, and the first and second inverters of the second phase interpolation unit respectively receive the first and second signals. | 11-15-2012 |
20120269008 | DATA INPUT DEVICE FOR SEMICONDUCTOR MEMORY DEVICE - A data input device for use in a memory device to avoid false data being written due to a postamble ringing phenomenon in a write operation is provided. The data input device comprises a buffer, a combinational logic circuit and a flip-flop unit. The buffer receives the data and outputs internal data to the flip-flop unit. The combinational logic circuit receives an external data strobe signal to generate a first data strobe signal and a second data strobe signal. The flip-flop unit stores the data in synchronization with the first data strobe signal and outputs the stored data in synchronization with the second data strobe signal. A last rising edge of the second data strobe signal is generated prior to onset of the postamble ringing on the external data strobe signal, so that a data transferred path in the flip-flop unit is closed prior to onset of the postamble ringing. | 10-25-2012 |
20120268176 | CIRCUIT AND METHOD FOR GENERATING MULTIPHASE CLOCK SIGNALS AND CORRESPONDING INDICATION SIGNALS - A circuit for generating multiphase clock signals and corresponding indication signals is provided. The circuit includes a multiphase clock generation circuit, a DLL circuit, a timing circuit, and a phase comparison circuit. The multiphase clock generation circuit receives an external clock to provide a plurality of first clock signals, phases of which differ from one another. The DLL circuit receives the external clock signal to provide a second clock signal. The timing circuit receives the second clock signal and a comparison signal to provide a plurality of indication signals. Each of the plurality of indication signals has rising edges which lead the rising edges of a corresponding one of the first clock signals. The phase comparison provides the comparison signal if a delayed phase of the corresponding one of the indication signals is within a phase of one of the first clock signals. | 10-25-2012 |
20120146601 | VOLTAGE DIVIDER CIRCUIT AND VOLTAGE REGULATOR - The invention provides a voltage regulator including a voltage divider and a power supply. The voltage divider circuit includes a first, second, third PMOS transistors, a first NMOS transistor, a pull down circuit, and a switching capacitor circuit. The pull down circuit includes a plurality of switches controlled by a pull down control signal. The switching capacitor circuit controlled by a first control pulse includes a capacitor and provides the capacitor connected to the dividing voltage for a short period while the power supply starts up to provide the input voltage. The power supply includes a comparator and a power voltage switch. The comparator compares the dividing voltage and a reference voltage and outputs a comparison result correspondingly. The power voltage switch is controlled by the comparison result to provide the input voltage from a power voltage. | 06-14-2012 |
20120133396 | COMPARATOR - A comparator comprises a current mirror, a differential input pair, and a auxiliary circuit. The current mirror has a biasing end coupled to a power voltage, a first end, and a current outputting end coupled to an output node of the comparator. The differential input pair has a first and second input ends for respectively receiving a first voltage and a second voltage, a second and third ends, and a ground end, wherein the third end is coupled to the first end. The auxiliary circuit is coupled between the output node and the second end, and provides a minimum voltage of a comparison result output at the output node. The comparison result is the power voltage when the first voltage is larger than the second voltage, and the comparison result is the minimum voltage when the first voltage is less than the second voltage. | 05-31-2012 |
20120119820 | Fuse Circuit - A fuse circuit comprises a fuse set and an enable circuit. The enable circuit is configured to receive a test mode enable signal and a power up signal to generate an enable signal and a voltage level to the fuse set for indicating whether an external supply voltage reaches a predetermined value and whether a test mode is enabled. In particular, an output signal of the fuse set is constant in the test mode, regardless of whether a fuse in the fuse set is blown or not. | 05-17-2012 |
20120008421 | DATA OUTPUTING METHOD OF MEMORY CIRCUIT AND MEMORY CIRCUIT AND LAYOUT THEREOF - A data outputting method of a memory circuit is illustrated. The memory circuit having at least 16 data buffers DQ[0]˜DQ[15] for storing at least 16 batches of data is provided. If a quadruple data outputting mode is selected for the memory circuit, when the clock signal triggers the 16 data buffers DQ[0]˜DQ[15], the 4 batches of the data stored in the 4 data buffers DQ[0], DQ[1], DQ[8], DQ[9] via 4 input/output pins connected to the 4 data buffers DQ[0], DQ[1], DQ[8], DQ[9], the batch of data stored in the data buffer DQ[2n+2] is transferred to be stored in the data buffer DQ[2n], and the batch of the data stored in the data buffer DQ[2n+3] is transferred to be stored in the data buffer DQ[2n+1], for n is an integer from 0 through 2, and from 4 through 6. | 01-12-2012 |
20120001231 | Electrical Fuse - An electrical fuse comprises first, second, and third thick oxide NMOS transistors and a thin oxide NMOS transistor. The first thick oxide NMOS transistor has a gate connected to a first input signal, and the thin oxide NMOS transistor has a drain connected to the source of the first thick oxide NMOS transistor and a gate shorted to its source. The second thick oxide transistor has a gate connected to a power up signal, a drain connected to the source of the thin oxide NMOS transistor, and a source connected to a reference voltage. The third thick oxide transistor has a gate connected to the second input signal, a drain connected to a high voltage, and a source connected to the drain of the thin oxide NMOS transistor. The first input signal and the second input signal are complementary. | 01-05-2012 |
20110279158 | SLEW RATE CONTROL CIRCUIT AND METHOD THEREOF AND SLEW RATE CONTROL DEVICE - A slew rate control circuit is provided. The slew rate control circuit includes at least one switch and an inverter. A first end of the switch is coupled to a power terminal. A toggle end of the switch is coupled to a first control terminal. A second end of the switch is coupled to an output terminal. An output end of the inverter is coupled to the output terminal. An input end of the inverter is coupled to an input terminal. A voltage at the first control terminal conducts the switch to reduce the slew rate when a large voltage variation occurs at the output terminal. A method of controlling a slew rate and a slew rate control device are provided. | 11-17-2011 |
20110273211 | CIRCUIT AND METHOD FOR PROVIDING A CORRECTED DUTY CYCLE - A duty cycle correction circuit comprises a duty cycle detector, a filter, an amplifier, a charge pump, a control circuit, and a duty cycle corrector. The duty cycle detector is configured to generate a first pair of control signals according to a pair of internal clock signals. The filter is configured to obtain average voltages of the first pair of control signals. The amplifier is configured to compare output voltages of the filter for generating an enable signal, and the control circuit is configured to generate a selection signal according to the enable signal. The charge pump is configured to generate a second pair of control signals according to the enable signal and the selection signal, and the duty cycle corrector is configured to receive a pair of external clock signals, the first pair of control signals, and the second pair of control signals for generating the pair of internal clock signals with a corrected duty cycle. | 11-10-2011 |
20110239046 | TEST CIRCUIT FOR INPUT/OUTPUT ARRAY AND METHOD AND STORAGE DEVICE THEREOF - The invention provides a test circuit for n input/output arrays. Each of the n input/output arrays has M pairs of input/output. The test circuit includes M write drivers and M comparing circuits. The i | 09-29-2011 |
20110235451 | DYNAMIC RANDOM ACCESS MEMORY AND METHOD OF DRIVING DYNAMIC RANDOM ACCESS MEMORY - A dynamic RAM which includes a first inverter, a second inverter, a sense amplifier, a first pair of switches, a pair of bit lines, and a dynamic RAM cell. The first inverter receives a first driving signal. A power end of the first inverter is coupled to a first voltage source. The second inverter receives a second driving signal output from the first inverter. A power end of the second inverter is coupled to a second voltage source. The sense amplifier senses and amplifies a voltage difference between a first sensing signal and a second sensing signal. A power end of the sense amplifier is coupled to a third voltage source, wherein a voltage value of the second voltage source is between a voltage value of the first voltage source and a voltage value of the third voltage source. | 09-29-2011 |
20110228627 | DOUBLE DATA RATE MEMORY DEVICE HAVING DATA SELECTION CIRCUIT AND DATA PATHS - A double data rate memory device comprises first and second sense amplifiers, a data selection circuit, and a data processing circuit. The first sense amplifier is configured to provide even data loaded on a first input and output data line, and the second sense amplifier is configured to provide odd data loaded on a second input and output data line. The data selection circuit is connected to the first and second sense amplifiers and is configured to provide output data loaded on a single data line, and the data processing circuit connected to the data selection circuit and configured to transfer the even data and the odd data in first and second data paths. The even data and the odd data are combined into the output data of the data selection circuit, and the data selection circuit selects the output data in response to a least significant bit of a column address and transfers the selected data on the single data line in response to a clock signal. | 09-22-2011 |
20110228623 | POWER-UP CIRCUIT - A power-up circuit comprises an external supply voltage potential detector, a first internal supply voltage potential detector, a second internal supply voltage potential detector, and a logic circuit. The external supply voltage potential detector is configured to detect a supply voltage that is external to the memory device and to generate a first detection signal indicating whether a voltage potential of the external supply voltage reaches a first predetermined value. The first internal supply voltage potential detector is configured to detect a first internal supply voltage that is internal to the memory device and to generate a second detection signal indicating whether a voltage potential of the first internal supply voltage reaches a second predetermined value. The second internal supply voltage potential detector is configured to detect a second internal supply voltage that is internal to the memory device and to receive the first detection signal and an output voltage of the first internal supply voltage potential detector for generating a third detection signal indicating whether the voltage potentials of the external supply voltage and the first and second internal supply voltages reach the first, second, and third predetermined values respectively. The logic circuit is configured to receive the third detection signal and to generate a power-up signal. | 09-22-2011 |
20110228620 | TESTING METHOD FOR SEMICONDUCTOR MEMORY DEVICE - A method comprises simultaneously writing a test bit to a plurality of memory cells in the selected sections of a memory array corresponding to column address signals; individually and successively reading output bits from the memory cells in one of the selected sections of a designated row of the memory array corresponding to column address signals and row address signals; and error-checking the output bits with the test bit, wherein the memory array comprises the plurality of memory cells arranged in rows and columns and the memory cells of each row are divided into a plurality of sections. | 09-22-2011 |
20110227624 | DUTY CYCLE CORRECTION CIRCUIT - A duty cycle correction circuit comprises first and second pulse generators, a clock dividing unit, a detecting unit, and a pulse width control unit. The first pulse generator is configured to generate a first edge of a first pulse signal in synchronization with a first edge of a first clock signal, and the second pulse generator is configured to generate a first edge of a second pulse signal in synchronization with a second edge of the first pulse signal. The clock dividing unit is configured to generate a second clock signal by dividing the frequency of the first clock signal. The detecting unit is configured to generate a detecting signal according to the second clock signal and a time interval between the first edge of the first pulse signal and a second edge of the second pulse signal. In particular, pulse widths of the first and second pulse signals are the same and are adjustable according to a control signal from the pulse width control unit. | 09-22-2011 |
20110215850 | METHOD FOR TRACKING DELAY LOCKED LOOP CLOCK - A method for tracking a delay locked loop (DLL) clock is described. An external clock signal is allowed to pass through delay cells of a DLL during a first period of the external clock signal when a transition edge of a track signal applied on the DLL occurs. Then, when a transition edge of a sensing signal applied on the DLL occurs at a start of a second period of the external clock signal, the external clock signal is inhibited to pass through the delay cells and the number of the delay cells through which the external signal pass during the first period of the external clock signal is counted. When a reset signal is asserted, a delay time of each delay cell is reset such that a ratio of the delay time to the period of the external clock signal is kept from 10% to 15%. | 09-08-2011 |
20110211417 | MEMORY DEVICE WITH PSEUDO DOUBLE CLOCK SIGNALS AND THE METHOD USING THE SAME - A method for operating a memory device with pseudo double clock signals comprises the steps of: generating an even clock signal and an odd clock signal, wherein the clock rates of both the even clock signal and the odd clock signal are half that of the input clock signal, and the even clock signal is the inverse signal of the odd clock signal; if the logic level of the even clock signal is | 09-01-2011 |
20110211407 | SEMICONDUCTOR MEMORY DEVICE AND ASSOCIATED LOCAL SENSE AMPLIFIER - A semiconductor memory device comprises a plurality of memory cells, a bit line sense amplifier, a local sense amplifier, and a sense amplifier. The memory cells are connected between a word line and a bit line pair, and the bit line sense amplifier is configured to amplify voltages of data from the bit line pair and then transmits the data to a local data line pair. The local sense amplifier is configured to amplify voltages of the data from the local data line pair and transmit the data to a global data line pair in response to first and second control signals, and the sense amplifier is configured to amplify the voltages of the data from the global data line pair and transmit the data to an input/output line pair during a read operation. The local sense amplifier comprises a first read circuit, a second read circuit, and a write circuit, and when the memory device performs the read operation, the data is transmitted from the first read circuit to the write circuit via the second read circuit. | 09-01-2011 |
20110211398 | MEMORY DEVICE AND ASSOCIATED MAIN WORD LINE AND WORD LINE DRIVING CIRCUIT - A main word line driving circuit for driving word lines in a memory device comprises first and second level shifting units and an inverting unit. The first level shifting unit is configured to convert a decode signal into a first operative signal, and the second level shifting unit is configured to convert the decode signal into a second operative signal. The inverting unit is configured to receive the first and second operative signals. A supply voltage of the first level shifting unit is selectively switched to a first bias voltage when the plurality of word lines are selected or partially selected and switched the output voltage to a second bias voltage when the plurality of word lines are deselected. | 09-01-2011 |
20110188322 | MEMORY DEVICE WITH DATA PATHS FOR OUTPUTTING COMPRESSED DATA - A memory device is provided. The memory device includes a plurality of memory array banks, a bus, a data buffer, and four data paths. The data buffer provides data from the memory array banks to an external node. The first data path includes a first compression module for compressing the data from the memory array banks to the bus. The second data path transmits the data from the memory array banks to the bus. The third data path includes a second compression module for compressing data from the bus to the data buffer. The fourth data path transmits the data from the bus to the data buffer. | 08-04-2011 |
20110188308 | OVER ERASE CORRECTION METHOD OF FLASH MEMORY APPARATUS - An over erase correction method of a flash memory apparatus is provided. The flash memory apparatus includes at least a microprocessor, a memory array, a bit line exchange unit and a column decoder. By controlling the column decoder of the flash memory during a period of the over-erase correction, the column decoder outputs control signals to the bit line exchange unit for selecting at least one of the bit lines according to a magnitude of the bit line leakage current. The drop in the charge pump voltage due to the bit line leakage current is reduced, and thus, the over-erase correction is executed effectively during the period of the over-erase correction. | 08-04-2011 |
20110176369 | ERASE VERIFICATION METHOD OF FLASH MEMORY APPARATUS - A suitable erase verification (ERSV) method of a flash memory apparatus is provided, which is different from the conventional ERSV method. That is, by managing the ERSV operation on the flash memory after at least once of erase operation, a flash memory controller in the flash memory apparatus selectively assigns at least one of de-selected sectors instead of all of the de-selected sectors to perform the ERSV. Therefore, by managing the ERSV operation on the flash memory, the time for the ERSV operation thereon is reduced. | 07-21-2011 |
20110175684 | TEMPERATURE-COMPENSATED RING OSCILLATOR - A temperature-compensated ring oscillator includes a control signal generator and a voltage controlled oscillator. The control signal generator is configured to generate at least one control signal, and includes at least one first resistor and second resistor. A first temperature coefficient of the first resistor is negative, and a second temperature coefficient of the second resistor is positive. The voltage controlled oscillator receives the control signal, outputs an oscillation signal, and has (2 | 07-21-2011 |
20100315143 | CIRCUIT AND METHOD FOR REDUCING POPPING SOUND - A circuit for reducing popping sound comprises a waveform generator, a voltage accumulator, and a comparator. The waveform generator is configured for generating a periodic waveform, and the voltage accumulator is configured for generating an increased voltage. The comparator is configured for comparing the periodic waveform with the increased voltage for generating a successive pulse signal. A percentage of a duty cycle in the successive pulse signal is increased gradually. | 12-16-2010 |
20100172188 | METHOD FOR CONDUCTING OVER-ERASE CORRECTION - A method for conducting an over-erase correction comprises the steps of: conducting a first erase and verification operation; using an FN soft program to correct over-erased cells if bit line leakage is found after the first erase and verification operation; conducting a second erase and verification operation; and using a hot carrier HC soft program to correct over-erased cells if bit line leakage is found after the second erase and verification operation. | 07-08-2010 |
20100149901 | WORD LINE DECODER CIRCUIT - A word line decoder circuit is provided in the present invention. The word line decoder circuit comprises at least one local pre-decoder, at least one 3-transistors row driver, a controllable power supply, and a controllable pull-down circuit. The controllable power supply is controlled by an inversed sector select signal to provide a first voltage to the row driver and local pre-decoder. The local pre-decoder uses 5-transistors architecture, in which there are 2 PMOS transistors and 3 NOS transistors. The controllable pull-down circuit pulls down the local pre-decoder and is controlled by a sector select signal and pre-decoding signal. The local pre-decoder receives a local pre-decoding signal to select the row driver. When the row driver is selected, the row driver determines a word line according to a row driver pull-down signal and a row driver pull-up signal. | 06-17-2010 |
20100080059 | PAGE BUFFER USED IN A NAND FLASH MEMORY AND PROGRAMMING METHOD THEREOF - A page buffer used in a NAND flash memory comprises a first latch circuit, a second latch circuit, a bit line voltage supply circuit and a verification circuit comprising a first verification path, a second verification path and a third verification path. The first latch circuit and the second latch circuit latch the data programmed into and read from the NAND flash memory. The bit line voltage supply circuit supplies bit line voltages to the corresponding bit line of the NAND flash memory. The verification circuit verifies the programming operations of the NAND flash memory. The first verification path is for the verification of a first LSB programming operation. The second verification path is for the verification of a second LSB programming operation before the first LSB programming operation is verified. The third verification path is for the verification of the second LSB programming operation after the first LSB programming operation is verified. | 04-01-2010 |
20100020629 | WORD LINE DRIVER CIRCUIT - A sector of a word line driver circuit is provided, comprising a local reset signal generator module and m word line clusters. The m word line clusters are coupled to the local reset signal generator module. The local reset signal generator module is used to generate j reset signals. The x-th reset signal is determined according to an x-th pre-decoding signal, a bank selectable signal and a sector selectable signal, wherein j is a nature number, and x is an integer from 1 to j. Each of the m word line clusters comprises j row drivers. The x-th row driver of the y-th word line cluster determines a [x+j*(y−1)]-th word line signal according to the x-th reset signal, the x-th pre-decoding signal, the sector selectable signal, and a y-th cluster select signal, wherein m is a nature number, and y is an integer from 1 to m. | 01-28-2010 |
20100007387 | TRIANGULAR WAVE GENERATING CIRCUIT HAVING SYNCHRONIZATION WITH EXTERNAL CLOCK - A triangular wave generating circuit includes: an integrating unit including a capacitor, the integrating unit having an output for providing a triangular wave signal; first and second constant current sources for charging and discharging the capacitor; a switch unit for coupling the first and second current sources to the integrating unit to charge and discharge the capacitor in response to an internal clock signal; a high/low level limiter including first and second comparing units for comparing the output of the integrating unit with upper and lower triangular wave peak limit reference voltages, respectively, and providing output signals indicating when the output of the integrating unit coincides with the peak limit reference voltages; a clock generator for providing the internal clock signal in response to the comparing unit output signals; and means for varying a peak-to-peak swing of the triangular wave signal over time to synchronize the internal clock signal with an externally supplied clock pulse. | 01-14-2010 |
20090296509 | VOLTAGE REGULATOR CIRCUIT FOR A MEMORY CIRCUIT - A voltage regulator circuit for a memory circuit comprises a voltage divider, a capacitor, an active-mode voltage regulator and a standby-mode voltage regulator. The active-mode voltage regulator is always on while in active mode, and turned on whenever a refresh is requested. The standby-mode voltage regulator is periodically turned on while in standby mode, and turned on whenever a refresh is requested. In addition, the active voltage regulator uses stronger transistors than those used by the standby-mode voltage regulator, and both the active-mode voltage regulator and the standby-mode voltage regulator are coupled to the voltage divider and the capacitor. | 12-03-2009 |
20090296492 | METHOD FOR ERASING FLASH MEMORY - A method for erasing flash memory comprises the steps of: setting a critical ending condition; simultaneously erasing selected multiple sectors of the flash memory; stopping simultaneous erasing if one of the selected multiple sectors meets the critical ending condition; and erasing the remainder of each of the selected multiple sectors sequentially. | 12-03-2009 |
20090244940 | VOLTAGE GENERATING CIRCUIT - A voltage generating circuit is provided, including a voltage output terminal, a ground terminal, a capacitor, a selector, a first switch, and a second switch. The capacitor is connected between a pump signal and the output of the selector. The selector is controlled by a first control signal and used to select the voltage source or the voltage output terminal to connect the capacitor. The first switch is controlled by a second control signal, and the second switch is controlled by a third control signal. When the first switch is turn-on, the voltage output terminal is connected to the ground terminal. When the second switch is turn-on, the voltage output terminal is connected to the voltage source. | 10-01-2009 |
20090237126 | GATE DRIVER FOR SWITCHING POWER MOSFET - A gate driver for switching power MOSFET including a MOS pair, a first conduction path, and a second conduction path is disclosed. The MOS pair electrically coupling gate of the power MOSFET, for controlling turning on or turning off the power MOSFET. The first conduction path electrically couples to gate of the power MOSFET and the MOS pair, and has a constant resistance. The second conduction path electrically coupling to gate of the power MOSFET and the MOS pair, having variable resistance corresponding to gate voltage of the power MOSFET. | 09-24-2009 |
20090231016 | GATE OXIDE PROTECTED I/O CIRCUIT - An integrated circuit comprises a first input node and a second input node, an output node; a first output transistor of a first type and a second output transistor of a second type, and a first clamping transistor of the second type and a second clamping transistor of a second type. The first clamping transistor, the first output transistor, the second clamping transistor, and the second output transistor are coupled in series across a first power supply terminal and a second power supply terminal. The first input node is coupled to a gate of the first output transistor. The second input node is coupled to a gate of the second output transistor. The output node is coupled to a common node of the first output transistor and the second clamping transistor. A gate of the first clamping transistor is coupled to a first reference voltage. A gate of the second clamping transistor is coupled to a second reference voltage. | 09-17-2009 |
20090160503 | TRIANGLE WAVE GENERATOR AND SPREAD SPECTRUM CONTROL CIRCUIT THEREOF - A triangle wave generator with function of spreading frequency spectrum is provided. The triangle wave generator includes a switch control circuit, a current generator, an integrator, and a spread spectrum control circuit. The switch control circuit provides an internal clock and a switch control signal. The current generator is coupled to the switch control circuit and provides charge current according to the switch control signal. The integrator is coupled to the current generator and provides a triangle wave signal. The spread spectrum control circuit is coupled to the switch control circuit and the current generator for providing a current control signal according to the internal clock. | 06-25-2009 |
20090147594 | VOLTAGE REGULATOR FOR SEMICONDUCTOR MEMORY - A voltage regulator in a semiconductor memory has: a comparing unit including first and second bias current sources, for comparing an output voltage with first and second reference voltages under control of a first signal, the second bias current source being ON under control of a second signal; and a driver active element, coupled to the comparing unit, for outputting the output voltage. Before sensing operations, the output voltage is reset to the second reference voltage. During the sensing operations, the output voltage is maintained at the first reference voltage and the second signal is asserted for turning ON the second bias current source for raising speed of the comparing unit. After the sensing operations, the output voltage is reset to the second reference voltage. | 06-11-2009 |
20090146726 | DELAY CIRCUIT WITH CONSTANT TIME DELAY INDEPENDENT OF TEMPERATURE VARIATIONS - A delay circuit has: an inverting receiver with a resistive element, the inverting receiver having an input node for receiving an input signal and an output node coupled to the resistive element; a capacitive element, coupled to the output node of the inverting receiver and the resistive element; a first transistor, having lower turned ON voltage at higher temperature; a second transistor, used for generating a rail to rail signals on a terminal of the first transistor; and an output inverter, having an input node coupled to the first transistor and an output node for outputting an output signal of the delay circuit. Further, a third transistor is used for enhancing pulling low of the output signal of the delay circuit. | 06-11-2009 |
20090146702 | CHARGE PUMP AND METHOD FOR OPERATING THE SAME - A charge pump comprises a ring oscillator and a pumping circuit. The ring oscillator provides a plurality of oscillating clocks. The pumping circuit includes a plurality of pumping blocks coupled to each other for outputting a boosted voltage, and each pumping block is connected to a corresponding oscillating clock. | 06-11-2009 |
20090134936 | CHARGE PUMP CIRCUIT AND CELL THEREOF - A charge pump cell with an input and output nodes includes a first, second, and third equalization units, and a first, second, and third capacitors. The input node is coupled to the inputs of the first, second and third equalization units, and the output node is coupled to the second equalization unit. One end of the second capacitor is coupled to the control end of the first equalization unit for enabling or disabling the first equalization unit, and also coupled to the output of the third equalization unit. One end of the third capacitor is coupled to the output of the second equalization unit. One end of the first capacitor is coupled to the control ends of the second and third equalization units, and also coupled to the output of the first equalization unit. | 05-28-2009 |
20090115492 | FUSE-FETCHING CIRCUIT AND METHOD FOR USING THE SAME - A fuse-fetching circuit comprises a plurality of fuses, a plurality of first switches and a shift register. Each of the first switches includes a first data end, a second data end and a control end. The first data end is connected to the fuse, and the control end is controlled by a fuse-fetching signal. The shift register includes a plurality of registers, each of which includes a first latch, a first transmission gate, a second latch and a second transmission gate. The first latch is connected to the second data end of the first switch. | 05-07-2009 |
20090109782 | TEMPERATURE DETECTOR IN AN INTEGRATED CIRCUIT - A temperature detector in an integrated circuit comprises a temperature-dependent voltage generator, a ring oscillator, a timer and a clock-driven recorder. The temperature-dependent voltage generator is configured to generate at least one temperature-dependent voltage. The ring oscillator is configured to generate a clock signal, which is affected by one of the at least one temperature-dependent voltage. The timer is configured to generate a time-out signal, which is affected by one of the temperature-dependent voltage. The clock-driven recorder has a clock input terminal in response to the clock signal and time-out signal. | 04-30-2009 |
20080316844 | SELECTION METHOD OF BIT LINE REDUNDANCY REPAIR AND APPARATUS PERFORMING THE SAME - A selection method of bit line redundancy repair includes the steps of providing a plurality of logical addresses of memory blocks in the normal cell array, generating a plurality of extra fuse signals, generating a code based on states of the extra fuse signals, the code matching a defective type of the memory blocks, and selecting a plurality of redundancy blocks in the redundancy cell array to replace the memory blocks according to the code. The apparatus includes a redundancy repair enable circuit for generating a redundancy enable signal based on logical addresses of the memory blocks, a controlling fuse circuit for sending a code matching a defective type of the memory blocks, and a redundancy decoder circuit for receiving the redundancy enable signal and the code to replace a plurality of memory blocks in the normal cell array with redundancy blocks. | 12-25-2008 |