RHK Technology, Inc. Patent applications |
Patent application number | Title | Published |
20130333077 | Integrated Microscope and Related Methods and Devices - An embodiment includes an integrated microscope including scanning probe microscopy (SPM) hardware integrated with optical microscopy hardware, and other embodiments include related methods and devices. | 12-12-2013 |
20130007929 | Frequency Measuring and Control Apparatus with Integrated Parallel Synchronized Oscillators - A frequency measuring and control apparatus includes a plurality of synchronized oscillators integrated in parallel into one programmable logic device. | 01-03-2013 |
20120005621 | Programmable Equipment Configuration Method and Apparatus - A computer-implemented method, system, and computer readable medium for configuring programmable equipment having hardware devices that can be programmatically interconnected into different hardware configurations. A graphical user interface is provided on a computer display which permits a user to iconically define both a hardware and procedural configuration of the available hardware devices. Configuration data is generated that can be used to automatically configure the programmable equipment according to the user-defined hardware and procedural configuration. | 01-05-2012 |
20100301710 | LINEAR PIEZOELECTRIC NANO-POSITIONER - A linear piezoelectric nano-positioner includes an armature configured to be translated along a longitudinal axis and having oppositely-disposed bearing surfaces and oppositely-disposed piezo surfaces, bearing sets engaged with the bearing surfaces of the armature to translatably support the armature, and piezoelectric elements engaged with the piezo surfaces of the armature to translate the armature along the longitude axis. | 12-02-2010 |
20080308718 | POSITION CONTROL FOR SCANNING PROBE SPECTROSCOPY - A method of position control for scanning probe spectroscopy of a specimen. Probe positional error is determined by comparing images generated from a sequence of scans to identify differences between positions of at least a portion of a reference characteristic of the specimen in the images. A probe is moved to a target location for spectroscopic analysis, as a function of the determined probe positional error. | 12-18-2008 |