MITUTOYO CORPORATION Patent applications |
Patent application number | Title | Published |
20160131474 | NON-CONTACT SURFACE-SHAPE MEASURMENT METHOD AND APPARATUS USING WHITE LIGHT INTERFEROMETER OPTICAL HEAD - A non-contact surface-shape measuring method uses a white light interferometer optical head that divides, through a beam splitter, light emitted from a white light source into reference light for a reference mirror and measurement light for a measured object surface; obtains an image having interference fringes generated from an optical path difference of light reflecting from the reference mirror and light reflecting from the measured object surface; and is displaced for scanning in a vertical direction with respect to the measured object surface in order to obtain the image having interference fringes. While the white light interferometer optical head is displaced in a scanning direction, a position of the optical head in the scanning direction is detected, and the image having interference fringes is obtained at predetermined spatial intervals in the scanning direction. | 05-12-2016 |
20160131302 | METHOD OF PLACING WORK PIECE ON TABLE OF MEASURING DEVICE - A method of placing a work piece on a measuring device in which a work piece is placed on a table of a measuring device is provided. The method includes: using a retainer capable of holding the work piece above the table and a lifting/lowering device lifting and lowering a top surface of the table; holding the work piece above the table with the retainer; lifting the top surface of the table with the lifting/lowering device to bring the top surface of the table into contact with a bottom surface of the work piece; and, after a load of the work piece is borne by the table, releasing the hold of the retainer on the work piece. | 05-12-2016 |
20160118769 | OPTICAL RESONATOR - An optical resonator includes a casing and various optical elements (laser crystal, SHG, etalon, movable mirror) provided within the casing. The optical resonator causes light from the excited laser crystal to resonate and, using the etalon, emits single longitudinal mode laser light. The casing is formed with a low thermal expansion metal exhibiting a thermal expansion coefficient within a range of 0.1 to 3.0×10 | 04-28-2016 |
20160094775 | AUTOFOCUS APPARATUS, AUTOFOCUS METHOD, AND PROGRAM - An autofocus apparatus according to an embodiment of the present invention is provided with an image acquirer, a pattern controller, and a focus controller. The image acquirer includes an optical system which forms an image of an object at a predetermined magnification and an image capturer which photographs the image of the object formed by the optical system. The pattern controller includes a generator which generates a pattern in a size according to the predetermined magnification of the optical system and a projector which projects the pattern generated by the generator onto the object. In the focus controller, an image of the projected pattern formed by the optical system at the predetermined magnification controls a focus position of the optical system based on the image of the object photographed by the image capturer. | 03-31-2016 |
20160093068 | IMAGE MEASUREMENT APPARATUS AND GUIDANCE DISPLAY METHOD OF IMAGE MEASUREMENT APPARATUS - An image measurement apparatus according to the present invention includes: an image capturer obtaining an image of an object to be measured; a display displaying the image obtained by the image capturer; a measurer performing a measurement selected by an operator based on the image displayed on the display; a guidance display portion displaying an operation sequence for the measurement on the display; and a step display portion displaying, on the display, a pattern corresponding to an operation step in the operation sequence. The step display portion displays a step display for each of the operation steps in a circular form in operation order as the pattern. | 03-31-2016 |
20160084631 | ROUNDNESS MEASUREMENT DEVICE AND CONTROL METHOD - A roundness measurement device provides a rotation table on a base and measures roundness of a measured object placed on the rotation table while rotating the rotation table, and includes a detecting main body, a detecting device driving mechanism, a stylus, a contact member, and a control device. The detecting device driving mechanism displaces the detecting device main body with respect to the base. The stylus has a base end rotatably supported on the detecting device main body and can change an angle position with respect to the detecting device main body using an external force. The contact member is provided at a position where the stylus comes in contact due to displacement of the detecting device main body by the detecting device driving mechanism. The control device controls driving of the detecting device driving mechanism. | 03-24-2016 |
20160055267 | THREE-DIMENSIONAL MODEL GENERATING METHOD, THREE-DIMENSIONAL MODEL GENERATING SYSTEM, AND THREE-DIMENSIONAL MODEL GENERATING PROGRAM - A three-dimensional model generating method selecting a predetermined plane element defining a three-dimensional model element using measurement data, which includes measurement point group data obtained by measuring a measured object, a type of a plane element, and geometric values of the plane element; obtaining a condition required for generating a three-dimensional model element; generating the three-dimensional model element using the selected plane element and the obtained condition; and generating the three-dimensional model of the measured object using one or a plurality of three-dimensional model elements. A calculator displays a three-dimensional image corresponding to the measured object as well as a list of at least the structural elements which, of the plane elements included in the measurement data, configure the three-dimensional image. | 02-25-2016 |
20160055266 | THREE-DIMENSIONAL MODEL GENERATING METHOD, THREE-DIMENSIONAL MODEL GENERATING SYSTEM, AND A THREE-DIMENSIONAL MODEL GENERATING PROGRAM - In a three-dimensional model generating method, a predetermined plane element defining a three-dimensional model element is selected from measurement data, which includes measurement point group data obtained by measuring a measured object, a type of a plane element, and geometric values of the plane element; a condition required for generating the three-dimensional model element is obtained; the three-dimensional model element is generated using the selected plane element and the obtained condition; and the three-dimensional model of the measured object is generated using one or a plurality of three-dimensional model elements. | 02-25-2016 |
20160040980 | OUTER DIMENSION MEASURING APPARATUS AND OUTER DIMENSION MEASURING METHOD - An outer dimension measuring apparatus includes a light source; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting the focused light; a detector detecting an intensity of the reflected light; and a calculator calculating an outer dimension of a measured object using a first focus position, a second focus position, and a position of the reflector on the optical axis, the first focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light reflected by a first surface, and the second focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light that has been reflected by the reflector and emitted at a second surface. | 02-11-2016 |
20160027194 | METHOD FOR MEASURING A HIGH ACCURACY HEIGHT MAP OF A TEST SURFACE - Method for measuring a height map of a test, including measuring a coarse height map of the test surface with a pre-map sensor provided to an optical profiler with a relatively long working distance and/or a large field of view, storing the coarse height map in a memory, subdividing the coarse height map into sections appropriate for the field of view of a high resolution optical profiler sensor provided to the optical profiler, calculating corresponding X, Y and Z positions for the optical profiler sensor with respect to the test surface, calculating a trajectory in the X, Y, Z-direction for the optical profiler sensor with respect to the test surface using the calculated X, Y, Z-positions, moving the optical profiler in the X, Y, Z-direction with respect to the test surface according to the trajectory, and measuring a high accuracy height map with the high resolution optical profiler sensor. | 01-28-2016 |
20160021306 | IMAGE MEASURING APPARATUS - An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on, a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes an individual determination results display region displaying individual determination results for each measurement position; and an overall determination results display region displaying overall determination results for the measured object as a unit. The image measuring apparatus is configured to display the individual determination results and the overall determination results together. | 01-21-2016 |
20160019687 | IMAGE MEASURING APPARATUS - An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes a selector selecting measurement results that include determination results on the list; and an emphasis displayer providing an emphasis display on the captured image display screen for a measurement position corresponding to the selected measurement results. | 01-21-2016 |
20160018976 | IMAGE MEASURING APPARATUS AND GUI PROGRAM FOR IMAGE MEASURING APPARATUS - An image measuring apparatus including an image measurer capable of switching between one of a type of lens and a magnification power, the image measurer obtaining an image of a measured object; a display displaying the image obtained by the image measurer and providing an operation screen to a user; and a controller controlling operations of the image measurer and the display. A calibration value and an expiration date for the calibration value are recorded by the controller for one of each type of lens and each magnification power. The controller communicates to the user, using the display, that one of the lens and the magnification power has an expired calibration value. | 01-21-2016 |
20160018308 | HARDNESS TESTER - A hardness tester includes: a tester main body, an inputter receiving an operation input from a user, a controller controlling an entirety of the hardness tester including the inputter, and a display which displays a predetermined image by being controlled by the controller. The controller includes a measurement procedure suggester and a suggestion switcher. The measurement procedure suggester suggests a procedure for measuring an indentation dimension value to the user. When receiving an operation input for proceeding to a subsequent procedure via the inputter, the suggestion switcher switches suggestions from the measurement procedure suggester and suggests the subsequent procedure to the user. | 01-21-2016 |
20160018218 | METHOD OF CORRECTING MEASUREMENT ERROR OF SHAPE MEASURING APPARATUS, AND SHAPE MEASURING APPARATUS - In a shape measuring apparatus having a scanning probe to perform scanning measurement using a tip ball provided at an end of a stylus with the tip ball being in contact with an object to be measured, a tip ball displacement detector detects a displacement of the tip ball of the scanning probe, a displacement of a moving mechanism that relatively moves the object to be measured and the scanning probe is detected, and an angle formed by a contact direction of the tip ball with the object to be measured and an axial direction of the stylus is calculated. The displacement of the tip ball that is detected by the tip ball displacement detector is corrected on the basis of the angle, and a corrected value of the displacement is outputted. The corrected value is added to the displacement of the moving mechanism to calculate a measurement value. | 01-21-2016 |
20160018213 | THICKNESS MEASUREMENT APPARATUS AND THICKNESS MEASUREMENT METHOD - A thickness measurement apparatus includes a light source emitting light; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting light focused by the optical system; a detector detecting intensity of the reflected light according to a position on the optical axis where the light passing through the optical system is in focus; and a calculator calculating thickness of a measured object using a refractive index of the measured object and an amount of displacement between a first focus position and a second focus position. | 01-21-2016 |
20150369726 | IMAGE MEASURING APPARATUS AND IMAGE MEASURING METHOD - An image measuring apparatus includes: a visible light source emitting each light of a blue region, a green region, and a red region; an infrared light source emitting light of an infrared region; an image capturer receiving at least one of reflected light or transmitted light of an object, and converting the light to an electric signal; an optical system passing each light of a visible light region and the infrared region with respect to an object to the image capturer without changing a relative position between the object and the image capturer; an intensity controller separately controlling each light amount of the blue region, the green region, the red region, and the infrared region; and a calculator detecting information of the object by processing the electric signal obtained after converting at the image capturer. | 12-24-2015 |
20150362309 | METHOD FOR CALCULATING A HEIGHT MAP OF A BODY OF TRANSPARENT MATERIAL HAVING AN INCLINED OR CURVED SURFACE - Provided is a method for calculating a height map of a sample comprising a body of a transparent material having a refractive index with an inclined or curved surface, the body being provided on an underlying surface extending laterally from underneath the body. The method may include positioning a first area of a body of a transparent material with an inclined or curved surface and a second area of the underlying surface extending laterally from underneath the body under an optical profiler, measuring a height map of the first area and the second area with the optical profiler; and calculating a height map of the inclined or curved surface by using the refractive index, the measured height map of the first area and the second area. | 12-17-2015 |
20150346475 | FOCUS DETECTION UNIT AND OPTICAL APPARATUS - A focus detection unit to adjust a focal point of an image, of an object, formed by an optical system includes a first output section, a second output section, and a projection optical system. The first output section includes a first light modulation element configured to generate a first pattern image based on incident light and is configured to output the generated first pattern image. The second output section includes a second light modulation element configured to generate a second pattern image based on incident light and is configured to output the generated second pattern image. The projection optical system is configured to project the output first pattern image and the output second pattern image such that the output first pattern image and the output second pattern image have a predetermined positional relationship at an in-focus position of the optical system. | 12-03-2015 |
20150323308 | COORDINATE MEASURING SYSTEM, COORDINATE MEASURING METHOD, AND PROBE - A coordinate measuring system includes a probe provided with first to ninth infrared LEDs, and an image capture apparatus and calculation controller detecting the position of the probe. The probe includes a distance obtainer acquiring distance data for a distance from the probe to the image capture apparatus; and an illumination controller controlling an illumination time of the first to ninth infrared LEDs based on the distance represented by the distance data. | 11-12-2015 |
20150323300 | HIGH SPEED CONTACT DETECTOR FOR MEASUREMENT SENSORS - A workpiece is measured by a contact detector. The contact detector is moved relatively towards a workpiece. A characteristic of the contact detector that changes as the contact detector contacts the workpiece is measured at a plurality of times. A projected time when the characteristic of the contact detector will meet a predetermined threshold is extrapolated from the characteristic measured the plurality of times and using a processor of a computer. A trigger is set to measure coordinates of the workpiece at the projected time. Coordinates of the workpiece are measured at the projected time based on the set trigger. | 11-12-2015 |
20150316365 | CALIPER FORCE INDICATOR WITH TACTILE OR AUDITORY FEEDBACK - A force indicator arrangement provides tactile or auditory feedback regarding a measuring force applied through a force actuator to a caliper jaw. The force indicator arrangement, coupled between the force actuator and the caliper jaw, includes an incremented member, an engaging member and a compliant element. The incremented member includes increment marker(s), and the engaging member is arranged to engage the increment marker(s) to produce tactile and/or auditory feedback (e.g., clicks) to indicate an amount of measuring force that is being applied arising from deformation of the compliant element. Different increment marker configurations may be provided to indicate different levels of measuring force. A set of interchangeable force indicator arrangements with different force sensitivities may be provided for use in different applications. A retrofitable force indicator arrangement may also utilize a fastening configuration that is compatible with existing mounting features on existing caliper jaws. | 11-05-2015 |
20150292851 | FORM MEASURING MACHINE - A measuring force includes a stem, an arm, a detector, a rotation fulcrum, and a measuring force adjuster. A probe which makes contact with a workpiece is provided on the stem. An end portion of the arm is joined to the stem. The rotation fulcrum acts as a fulcrum for a rotating motion of the stem and the arm. The detector detects a displacement amount of the rotating motion of the arm. A crossed spring of the rotation fulcrum imparts on the stem and the arm a torque around an axis of the rotating motion in accordance with the displacement amount of the rotating motion. The measuring force adjuster imparts on the arm and the stem a torque, in a reverse direction of the torque generated by the crossed spring, by an attraction force generated by a magnetic force between at least two magnetic members mutually arranged at opposite ends. | 10-15-2015 |
20150287177 | IMAGE MEASURING DEVICE - An image measuring device having an XY stage capable of moving along orthogonal XY axes includes an imaging capturer that takes an image of a plurality of same shape measured objects placed onto the XY stage, a specifier that specifies a location and a rotation angle of each measured object by using preregistered image patterns and through pattern matching, and a detector that measures a dimension of each measured object using at least one of the specified location and rotation angle and detects coordinate data of each measured object on the XY stage. | 10-08-2015 |
20150286354 | MEASURING INSTRUMENT - A measuring instrument includes a main body casing, a detector on the main body casing and detecting an amount of stylus head displacement, a display on an outer surface of the casing; a plurality of key switches on the outer surface, a menu proximate the display on the outer surface, and a display controller controlling the display. The display includes a main display and a cursor display, which is arranged in a location alongside the menu and displays a cursor pointing to the menu, and performs control such that a measured value based on an amount of displacement is displayed, but the cursor is not displayed when in a measurement mode where the detector detects the amount of displacement, and such that a cursor is displayed so as to point to the menu corresponding to a selected menu when in a settings mode where measurement conditions are set. | 10-08-2015 |
20150285619 | INTERFERENCE MEASURING DEVICE - An interference measuring device comprises: a light source; a beam splitter that causes the light to diverge into a reference optical path and a measurement optical path and that outputs a combined wave in which reflection light passed the reference optical path and reflection light passed the measurement optical path are combined; a reference light diverging part that causes the light diverged into the reference optical path, to further diverge into a plurality of optical paths and that causes reflection light beams respectively passed the optical paths to be input into the beam splitter; and a plurality of reference mirrors that are respectively arranged in the optical paths such that optical path lengths of the optical paths are different from each other, and that reflect reference light. An interference image is imaged by varying the optical path length of either the reference optical path or the measurement optical path. | 10-08-2015 |
20150276435 | OPTICAL DISPLACEMENT ENCODER - An optical encoder includes a scale having bar-like scale marks; a detection head having a light source fiber emitting coherent light at the scale and a photoreceiver fiber receiving light reflected off the scale; electronic components connected to the detection head via the light source fiber and the photoreceiver fiber; and a protector covering the scale marks at a predetermined distance from the scale marks. The protector is a member configured with light-transmissive material and includes a top surface that is inclined with respect to a principal surface of the scale. | 10-01-2015 |
20150276390 | CORRECTION DEVICE AND CORRECTION METHOD FOR OPTICAL MEASURING APPARATUS - A correction device for an optical measuring apparatus obtains correction data for each scanning position of a light beam from an optical measuring apparatus that includes a light beam scanner which scans with a light beam a measuring region where a measured object is placed, and a light receiver which receives a transmitted light beam from the measuring region. The correction device includes a translucent scale having scale marks arranged at a predetermined pitch, and a support to mount the scale in the measuring region so that an arrangement direction of the scale marks is a scanning direction of the light beam. | 10-01-2015 |
20150276366 | FLEXIBLE MOUNT FOR COUPLING FORCE ACTUATOR TO CALIPER JAW - A flexible mount is provided for coupling a force actuator to a caliper jaw. The flexible mount includes a first mounting portion for being coupled to the caliper jaw, a second mounting portion for being coupled to the force actuator, and a flexible element (e.g., a parallel flexure) coupled between the first and second mounting portions. When a force is applied to the force actuator (e.g., by a user pushing on a thumbwheel) along the measuring axis direction, the flexible element flexes to generate a measuring force that is applied to the caliper jaw. The use of the flexible mount results in more control and a better feel for a user when attempting to exert control to provide a desired amount of force during a measuring process. The flexible mount may also utilize a fastening configuration that is compatible with existing mounting features on existing caliper jaws. | 10-01-2015 |
20150273583 | LAYER SCANNING INSPECTION SYSTEM FOR USE IN CONJUNCTION WITH AN ADDITIVE WORKPIECE FABRICATION SYSTEM - A layer scanning inspection system is disclosed for use in conjunction with an additive workpiece fabrication system. for providing in process layer measurement of a workpiece layer during an additive workpiece fabrication process. The additive workpiece fabrication system comprises a control portion; a layer binding portion; an elevation portion comprising a Z direction motion control portion; and a fabrication scanning motion portion. The layer scanning inspection comprises: an inspection scanning motion portion configured to scan across the current workpiece layer along a scanning direction in a manner synchronized with a layer fabrication operation sequence; a non-contact sensor arrangement that is arranged on a member of the inspection scanning motion portion; and a sensor data processing portion configured to process data acquired by the non-contact sensor arrangement as the sensing region is scanned across the current workpiece layer along the scanning direction. | 10-01-2015 |
20150247742 | DISPLACEMENT SENSOR FOR FORCE INDICATING CALIPER - A caliper including a scale member, a slider, a slider displacement sensor and a force sensing arrangement. The force sensing arrangement is configured to provide a signal indicative of a measurement force, and includes elements fabricated on the same circuit board as the slider displacement sensor. In one implementation, the force sensing arrangement includes drive and sense coils that are fabricated in one or more metal layers of the circuit board. A signal modulating element (e.g., a metal core) is also included which is attached to a force actuator which moves in accordance with the amount of measurement force that is being applied. The force actuator moves relative to the linearly displaced coils and the attached signal modulating element affects the inductive coupling between the coils. The resulting signals from the coils may be utilized to determine the position of the signal modulating element and the corresponding measurement force. | 09-03-2015 |
20150247717 | WHEEL ASSEMBLY FOR MOVING CALIPER JAW WITH REPEATABLE FORCE - A compliant wheel assembly is provided for moving a caliper jaw relative to a caliper spar. The wheel assembly includes a rotary bearing member, a rotary actuation member and a compliant coupling element. The rotary bearing member is coupled to the caliper jaw and may engage the caliper spar. The rotary actuation member is actuated by a user to apply a measuring force. The compliant coupling element is configured to compliantly couple the rotary actuation member to the rotary bearing member. Using the compliant wheel assembly, a user is able to apply a more consistent amount of measurement force than could typically be achieved with a conventional rigid thumb wheel in caliper. In one implementation, a displacement indicator may also be provided that is responsive to the rotational displacement between the rotary bearing and actuation members for indicating an amount of measurement force that is being applied. | 09-03-2015 |
20150241201 | GRAZING INCIDENCE INTERFEROMETER - A grazing incidence interferometer is configured to measure a profile of a target surface using a measurement beam radiated on the target surface in a direction oblique to a normal line of the target surface and reflected on the target surface to cause an interference with a reference beam. The grazing incidence interferometer includes: a light source to emit light; a first polarization beam splitter that splits the light from the light source into the reference beam and the measurement beam; a ratio changer that changes a light amount ratio between the reference beam and the measurement beam; a second polarization beam splitter that synthesizes the measurement beam reflected on the target surface and the reference beam; and an image capturing camera that receives the synthesized beam of the reference beam and the measurement beam. | 08-27-2015 |
20150241194 | COORDINATE MEASURING MACHINE AND METHOD FOR CALCULATING CORRECTION MATRIX BY COORDINATE MEASURING MACHINE - A first correction component calculation processing unit calculates diagonal components of a correction matrix based on first and second detection values. The first and second detection values are obtained by measurement in which a calibration reference body and the probe are moved relatively to each other in a normal direction on a surface of the calibration reference body so as to bring a measurement tip into contact with the surface of the calibration reference body at one point. A second correction component calculation processing unit calculates non-diagonal components of the correction matrix based on third and fourth detection values. The third and fourth detection values are obtained by scanning measurement using the measurement tip on the surface of the calibration reference body while maintaining a constant relative distance between the center of the measurement tip and a reference point or a reference line of the calibration reference body. | 08-27-2015 |
20150236755 | MEASURING DEVICE HAVING DATA TRANSMISSION FUNCTION - A digital caliper includes a tag, a memory, and a trigger generator. An external device includes a reader reading data stored in the tag when the tag is held up to the reader. The memory stores at least one measured value measured by the digital caliper. The trigger generator generates a trigger for when a measured value measured by the digital caliper is to be stored in the memory. The tag transmits to the external device all measured values stored in the memory based on the trigger generated by the trigger generator when the tag is held up to the reader of the external device. | 08-20-2015 |
20150233692 | SHAPE MEASURING APPARATUS AND SHAPE MEASUREMENT ERROR CORRECTION METHOD - A calculator includes a first filter, a second filter, and an adding device. The first filter outputs, as a first corrected value, a value in which displacement of a displacement table detected by a scale has been corrected based on first frequency transfer characteristics from a scale to a measured object station. The second filter outputs, as a second corrected value, a value in which the first corrected value is corrected based on second frequency transfer characteristics from a ball tip to a ball tip displacement detector. The adding device adds the second corrected value and displacement of the ball tip detected by the ball tip displacement detector to calculate a measured value. | 08-20-2015 |
20150226852 | POSITION MEASURING DEVICE AND POSITION MEASURING METHOD - A position measuring device includes a light emitter, an image capturer, a first beam splitter, a first light receiver, a second light receiver, a calculator, and a controller. The first light receiver receives light that propagates along a first optical axis toward the light emitter and is reflected by the first beam splitter, and outputs a first signal. The second light receiver outputs a second signal corresponding to an intensity of light propagating along a second optical axis toward the image capturer. The controller controls the intensity of the laser light based on the second signal when a difference between the first signal and the second signal is smaller than a predetermined threshold, and performs control so that the laser light has a predetermined intensity when the difference between the first signal and the second signal is equal to or greater than the threshold. | 08-13-2015 |
20150226544 | OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS - An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. In addition, a light reflection prevention structure or a diffusion structure is provided to the bottom surface of the probe cover. Light reflected from the work piece is prevented from reflecting off the bottom surface by the reflection prevention structure, or the reflected light is diffused by the diffusion structure. Accordingly, an occurrence of an erroneous value in received light distribution due to second order reflected light can be inhibited. | 08-13-2015 |
20150226543 | OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS - An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. The bottom surface forms a surface where, of the light reflected from the work piece, light following a direct reflection direction is reflected in a direction moving away from the incidence region, from a position where light emitted from the emitting region is emitted at the work piece. Accordingly, an amount of second order reflected light striking the incidence region can be suppressed and, therefore, an occurrence of an erroneous value in received light distribution can be suppressed. | 08-13-2015 |
20150226538 | GRAZING INCIDENCE INTERFEROMETER - A grazing incidence interferometer includes: a graduated instrument showing an index at an overlapping area where adjacent ones of measurement areas overlap with each other; and a measuring unit including: an image acquiring unit that acquires interference fringe images at image-capturing positions for the measurement areas, individually, the interference fringe images each showing each of the measurement areas and the index; and a profile computing unit that combines measurement results based on the interference fringe images of the adjacent ones of the measurement areas in a manner that images of the index included in common in the interference fringe images of the adjacent ones of the measurement areas are superimposed on each other. | 08-13-2015 |
20150219441 | IMAGE SEQUENCE AND EVALUATION METHOD AND SYSTEM FOR STRUCTURED ILLUMINATION MICROSCOPY - In a method and apparatus for determining the height of a plurality of spatial positions on a surface of a specimen, a light beam is projected on the surface. The light beam has a sinusoidal spatial pattern in at least two directions perpendicular to an optical axis of the light beam, and which is moved to different spatial pattern positions. The surface is scanned along the optical axis in different scanning positions. A fixed relationship between a moving distance between subsequent spatial pattern positions, and a scanning distance between subsequent scanning positions exists. The light reflected by the surface is detected in scanning positions with the spatial pattern having corresponding spatial pattern positions. From the detected light for each spatial position of the surface, an envelope curve of intensity values corresponding to scanning positions is determined. A maximum of the envelope curve and its corresponding scanning position being representative of the height of the spatial position of the surface is selected. The spatial pattern is moved in a sequence of 2n steps (n>2) in a first and a second spatial direction over a distance of ¼ and 1/n pattern wavelength, respectively. | 08-06-2015 |
20150212915 | REMOTE CONTROLLABLE MEASURING APPARATUS AND MEASURING SYSTEM - A remote controllable measuring system includes a remote controllable measuring apparatus having a communication terminal having instant messaging; an input/output for exchanging signals with the communication terminal; a measurer (measuring apparatus main body); and a controller (computation apparatus) causing the measurer to operate according to an instruction from the communication terminal. The remote controllable measuring system also includes a mobile terminal capable of transmitting and receiving signals with the communication terminal. | 07-30-2015 |
20150211850 | INTERCHANGEABLE REFLECTIVE ASSEMBLY FOR A CHROMATIC RANGE SENSOR OPTICAL PEN - Reflective assemblies are provided that may be attached to the end of a chromatic confocal point sensor optical pen. Each reflective assembly includes a reflective surface (e.g., a turning mirror) oriented for directing a measurement beam along a measurement axis at a selected angle relative to the central Z-axis of the optical pen. Reflective assemblies with different orientations for the measurement beams (e.g., 60 degrees, 120 degrees, etc.) allow for measurements of workpiece features that cannot be achieved with a measurement beam directed in a normal incident manner or at a standard 90 degree orientation. In one implementation, the reflective assemblies may be kinematically located and retained using magnetic coupling, and may be rotated and reseated in different rotational orientations about the central Z-axis of the optical pen. A set of such reflective assemblies greatly increases the measurement capability of a single optical pen, in an economical manner. | 07-30-2015 |
20150211842 | ILLUMINATION APPARATUS, ILLUMINATION METHOD, MEASURING APPARATUS, AND MEASURING METHOD - An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector. | 07-30-2015 |
20150177729 | REMOTE ACCESSORY FOR GENERATING CUSTOMIZED AND SYNCHRONIZED REFERENCE NOTES FOR A PROGRAMMABLE METROLOGY SYSTEM - A method for operating a remote device in relation to a programming environment of a programmable metrology system is provided. The metrology system may comprise an accessory interface portion comprising an accessory communication portion, and a user interface comprising a programming environment having part program instruction representation representations in an editing window, including an active “current instruction” representation. The method provides a connection between the remote device and the programming environment, which outputs current instruction identifiers for current instruction representations. The remote device receives a current instruction identifier and operates responsive to the that current instruction identifier to display a current instruction reference information user interface portion configured such that it is specifically related to a generic instruction type corresponding to the current instruction representation. That user interface may display customized reference information previously configured by a user of the remote device in association with that generic instruction type. | 06-25-2015 |
20150159998 | HOLE-MEASUREMENT SYSTEMS AND METHODS USING A NON-ROTATING CHROMATIC POINT SENSOR (CPS) PEN - A chromatic confocal point sensor (CPS) system and associated methods are provided for measuring holes. A CPS optical pen includes a beam dividing deflecting element that directs measurement light simultaneously along at least three directions to the interior surface of the hole. A CPS electronics portion comprises a light generator, a spectrometer, and a signal processor. In operation, the CPS pen directs measurement light to the interior surface along the at least three directions, and the spectrometer receives measurement light reflected from those directions back through the pen and provides a spectral intensity profile comprising spectral peak components corresponding to distances to the interior surface along those directions. The hole characteristic may be determined based at least partially on those distances. The CPS pen may be used as a probe on a coordinate measuring machine (CMM). The CPS pen does not require rotation in a hole to measure the hole. | 06-11-2015 |
20150145980 | Machine Vision Inspection System and Method for Obtaining an Image With an Extended Depth of Field - A method for operating an imaging system of a machine vision inspection system to provide an extended depth of field (EDOF) image. The method comprises (a) placing a workpiece in a field of view; (b) periodically modulating a focus position of the imaging system without macroscopically adjusting the spacing between elements in the imaging system, the focus position is periodically modulated over a plurality of positions along a focus axis direction in a focus range including a workpiece surface height; (c) exposing a first preliminary image during an image integration time while modulating the focus position in the focus range; and (d) processing the first preliminary image to remove blurred image contributions occurring in the focus range during the image integration time to provide an EDOF image that is focused throughout a larger depth of field than the imaging system provides at a single focal position. | 05-28-2015 |
20150143708 | FORM MEASURING APPARATUS AND FORM MEASUREMENT METHOD - Stylus head displacer displaces a stylus head on a first measurement path. A path definer defines the first measurement path. A displacement controller controls the stylus head displacer such that the stylus head displaces along the first measurement path. A position detector detects a position of the stylus head. A depression amount detector detects the depression amount of the stylus head. A measurement results memory stores the position and amount of depression of the stylus head. The depression amount detector outputs an error signal when detecting a measurement error. The displacement controller stops displacement of the stylus head in response to the error signal and displaces the stylus head to a starting point of the first measurement path, and controls the stylus head displacer such that the stylus head is displaced from the starting point to an end point of the first measurement path with a fixed depression amount. | 05-28-2015 |
20150136949 | STRUCTURED ILLUMINATION MICROSCOPY OPTICAL ARRANGEMENT INCLUDING PROJECTION ARTIFACT SUPRESSION ELEMENT - A structured illumination microscopy optical arrangement includes a projection path and an imaging path. The imaging path includes an imaging sensor and imaging optical elements. The projection path includes a light generator, a pattern generating element such as a spatial light modulator (SLM), and projection optical elements including an output lens and a projector artifact suppression element (PASE) located in the projection path between the SLM and the output lens. The PASE may include birefringent material which splits respective light rays of the structured illumination pattern source light to provide at least one replication of the structured illumination pattern with an offset transverse to the projection path. The offset replication of the structured illumination pattern increases the accuracy of the system by reducing spatial harmonic errors and spurious intensity variations due to projector pixel gap artifacts which may otherwise produce errors in resulting Z-height measurements. | 05-21-2015 |
20150131697 | INDUSTRIAL MACHINE AND METHOD FOR MEASURING AMOUNT OF EXPANSION/CONTRACTION OF INDUSTRIAL MACHINE - An industrial machine includes a moving mechanism moving one of a probe and a tool relative to a work piece, using three displacement axes parallel to each of three orthogonal axis directions; a low thermal expansion member formed with a material having a smaller thermal expansion coefficient than a material forming a structural element of the moving mechanism; and an expansion/contraction measurer measuring, using the low thermal expansion member as a reference, an amount of expansion/contraction of the structural element in one of the three orthogonal axis directions, the expansion/contraction occurring due to a change in temperature. | 05-14-2015 |
20150103156 | SYSTEM AND METHOD FOR CONTROLLING A TRACKING AUTOFOCUS (TAF) SENSOR IN A MACHINE VISION INSPECTION SYSTEM - A method is provided for controlling a Tracking AutoFocus (TAF) portion of a machine vision inspection system including an imaging portion, a movable workpiece stage, a control portion, and graphical user interface (GUI). The TAF portion automatically adjusts a focus position of the imaging portion to focus at a Z height corresponding to a current surface height of the workpiece. The method includes providing the TAF portion, and providing TAF enable and disable operations, wherein: the TAF disable operations comprise a first set of TAF automatic interrupt operations that are automatically triggered by user-initiated operations that include changing the Z height, and the TAF disable operations may further comprise automatic interrupt operations that are automatically triggered based on at least one respective TAF Z height surface tracking characteristic exceeding a previously set TAF disable limit for that respective TAF Z height surface tracking characteristic. | 04-16-2015 |
20150059480 | Method for Validating a Workpiece Measurement in a Dimensional Metrology Hand Tool - A method for validating a workpiece measurement in a hand-held spatial dimension measurement metrology tool comprises vibrating a portion of the metrology hand tool using the vibration excitation element; sensing a vibration signature using the vibration sensor configuration; identifying a valid contact state between the metrology hand tool and the workpiece based on a vibration signature criterion; identifying a valid seating state based on a measurement stability criterion applied to a set of dimensional measurements of the metrology hand tool; and indicating that a dimensional measurement is valid for a dimensional measurement that is obtained when the valid contact state and the valid seating state occur simultaneously. | 03-05-2015 |
20150059431 | Calibration Control Device for Metrology Tools - A calibration control device for being coupled to a measuring device such as a caliper, micrometer, or gauge is provided. The calibration control device includes a circuit portion and couples to a coupling feature on the measuring device. A calibration limit portion defines a parameter limit as related to a usage limit for which the measuring device is certified as calibrated. A controller operates a host-side data connection portion of the calibration control device to output measuring data in a first mode when the usage limit is not exceeded, and operates the calibration control device to perform a calibration limit function when the usage limit is exceeded. The calibration limit function may include stopping the output of the measuring data through the host-side data connection or providing an out-of-calibration warning to the host, or the like. | 03-05-2015 |
20140367560 | SCALE FOR PHOTOELECTRIC ENCODER - A scale for a photoelectric encoder includes a scale substrate and a reflection film formed at a predetermined pitch on the scale substrate. A surface of the reflection film forms a reflection surface. A low-reflection surface is formed by etching the scale substrate between reflection films. Accordingly, a scale can be provided which is lower in cost and has favorable yield rates. | 12-18-2014 |
20140362464 | POSITION DETECTION ENCODER - A position detection encoder includes a scale and a detection head and has position detection circuits which are capable of outputting respective pieces of position information on X | 12-11-2014 |
20140362383 | INTERFEROMETER SYSTEM AND METHOD TO GENERATE AN INTERFERENCE SIGNAL OF A SURFACE OF A SAMPLE - An interferometer system to generate an interference signal of a surface of a sample includes a broadband illuminator to provide a broadband illumination beam, a beam splitter to split the broadband illumination beam in a reference beam for reflection on a reference reflector and a measurement beam for reflection on the surface of the sample, and a detector to receive an interference radiation intensity created between the reference beam reflected from the reference reflector and the reflected measurement beam from the surface of the sample to generate an interference signal. The interferometer system having a continuous variable broadband reflector in the beam splitter and/or the reference reflector to adjust the broadband radiation intensity balance between the measurement beam and the reference beam. | 12-11-2014 |
20140362203 | Structured Illumination Projection With Enhanced Exposure Control - A method for controlling a structured illumination pattern generating portion is provided for illuminating a workpiece during an image acquisition by a camera in a precision machine vision inspection system. A controllable spatial light modulator (e.g., a digital light processing projector) is part of the generating portion for generating the structured illumination pattern. The pattern may comprise an array of stripes including a sinusoidal gray level intensity variation across each stripe. An overall image exposure is increased by repeating a complete structured illumination pattern generation iteration, including gray level variation, a plurality of times during an image integration period. Structured illumination microscopy techniques for determining a workpiece surface profile may benefit, wherein multiple (e.g., 3 or 4) images are acquired at respective focus positions to be analyzed, by using the method to project a different phase of a structured light pattern for each of the multiple images. | 12-11-2014 |
20140347879 | LIGHT SOURCE APPARATUS - A light source apparatus includes a light source, an optical fiber, and a positioning mechanism. The positioning mechanism is configured with a planar position adjustment mechanism, an axial line position adjustment mechanism, and an orientation maintaining mechanism. The planar position adjustment mechanism adjusts a position of the optical fiber in a direction following the light-emitting surface. The axial line position adjustment mechanism adjusts the position of the optical fiber in a direction intersecting with the light-emitting surface. The orientation maintaining mechanism holds the optical fiber in a state where an axis direction of the optical fiber lies in a predetermined intersecting direction with respect to the light-emitting surface. | 11-27-2014 |
20140347673 | LASER TRACKING INTERFEROMETER - A laser tracking interferometer has a carriage provided with a first displacement gauge outputting a displacement signal associated with a relative displacement from a reference sphere; a second retroreflector provided to the carriage; a laser interferometer provided to the carriage and outputting a displacement signal associated with a relative displacement between the first retroreflector and the second retroreflector; and a data processor calculating a displacement of the first retroreflector with reference to the reference sphere based on the displacement signal output from the first displacement gauge and the displacement signal output from the laser interferometer. | 11-27-2014 |
20140342840 | ROTATION TRANSMITTER - A rotation transmitter includes: a first member, an intermediate member and a second member that are arranged coaxially with a rotation axis. The first member is formed with a first bearing surface along the rotation axis and a first direction. The second member is formed with a second bearing surface along the rotation axis and a second direction. The intermediate member is formed with a first middle bearing surface facing the first bearing surface and formed with a second middle bearing surface facing the second bearing surface. A static-pressure air bearing is formed between the bearing surface and the middle bearing surface. The rotation transmitter further includes: a preload device that biases the bearing surface and the middle bearing surface in a direction approaching each other. | 11-20-2014 |
20140340694 | OPTICAL MEASURING APPARATUS - An optical measuring apparatus includes a light emitter, a scanner, a polarizing plate, a photoreceiver, and a CPU. The light emitter emits a laser beam. The scanner uses the laser beam emitted from the light emitter and scans a measurement region where a work piece is placed. The polarizing plate allows passage for only a laser beam, among the laser beams fired by the scanner, directed orthogonally to an emission direction of the laser beam and an axis direction of the work piece. The photoreceiver receives the laser beam that has passed through the measurement region and the polarizing plate. The CPU calculates a dimension of the work piece from a pattern of light and dark in a scan direction, the pattern being obtained by the photoreceiver. | 11-20-2014 |
20140340679 | Interchangeable Chromatic Range Sensor Probe for a Coordinate Measuring Machine - An interchangeable chromatic range sensor (CRS) probe for a coordinate measuring machine (CMM). The CRS probe is capable of being automatically connected to a CMM under program control. In one embodiment, in order to make the CRS probe compatible with a standard CMM auto exchange joint, all CRS measurement light transmitting and receiving elements (e.g., the light source, wavelength detector, optical pen, etc.) are included in the CRS probe assembly. The CRS probe assembly also includes an auto exchange joint element that is attachable through a standard auto exchange joint connection to a CMM. In one embodiment, in order to provide the required signals through the limited number of connections of the standard CMM auto exchange joint (e.g., 13 pins), a low voltage differential signaling (LVDS) serializer may be utilized for providing additional control and data signals on two signal lines. | 11-20-2014 |
20140339779 | DUSTPROOF MEMBER AND MEASUREMENT DEVICE - A dustproof member for a measurement device is provided. The measurement device includes a frame in which a scale is held and which has an insertion opening that extends in a longitudinal direction, and a detector that is inserted through the insertion opening and capable of moving along the insertion opening in the longitudinal direction to obtain position information from the scale. The dustproof member is provided on the frame to cover the insertion opening of the measurement device. The dustproof member includes a reinforcing member that extends continuously in the longitudinal direction and that is disposed in a substantially central region of the dustproof member in a width direction. | 11-20-2014 |
20140339405 | REFERENCE SIGNAL GENERATION APPARATUS AND REFERENCE SIGNAL GENERATION SYSTEM - A reference signal generation circuit generates a reference signal from a reading result of the reference point detection pattern. The first light-receiving element array includes a first light-receiving element that outputs a first signal, and a second light-receiving element that is disposed in a first direction of the first light-receiving element and outputs a second signal. A second light-receiving element array includes a third light-receiving element that outputs a third signal, and a fourth light-receiving element that is disposed in the first direction of the third light-receiving element and outputs a fourth signal. The second light-receiving element array is disposed in a second direction of the first light-receiving element array. The reference signal generation circuit outputs a reference signal that starts at a period when levels of the first and second signal become equal and ends at a period when levels of the third and fourth signal become equal. | 11-20-2014 |
20140339404 | REFERENCE SIGNAL GENERATION APPARATUS AND REFERENCE SIGNAL GENERATION SYSTEM - A reference point detection light-receiving unit receives light from a reference point detection pattern by first to fifth light-receiving elements. The first to fifth light-receiving elements are arranged in a first direction and outputs first to fifth signals, respectively. A reference signal generation circuit outputs a reference signal that starts at a period where a level of a signal, which is obtained by adding first and second signals, and a level of a signal, which is obtained by adding third and fourth signals, will become equal, and ends at a period where a level of a signal, which is obtained by adding the second and third signals, and a level of a signal, which is obtained by adding fourth and fifth signals, become equal. | 11-20-2014 |
20140338446 | LINEAR ENCODER - A linear encoder includes a scale; a frame in which the scale is held, the frame having an opening that extends in a longitudinal direction of the frame; and a pair of elongated dustproof members arranged to face each other in the opening. At least a part of each dustproof member is elastically deformable. Each dustproof member includes a first end portion in a transverse direction of the dustproof member, a first projecting portion disposed on the first end portion, and a second end portion in the transverse direction. The opening has a pair of fitting recesses formed therein. The first end portion of each dustproof member is fitted in a corresponding one of the fitting recesses, and the first projecting portion contacts the corresponding one of the fitting recesses. | 11-20-2014 |
20140337775 | MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING OPERATING CONTEXT AWARE COPY AND PASTE FEATURE - A method is provided for copying and pasting a set of machine vision part program operations when editing a part program in a machine vision inspection system. The method includes: a) selecting at least a first instruction representation at a copy location in a displayed part program representation; b) performing copy operations by executing a first subset of modification operations directed to elements that are specific to a first operating context at the copy location, to thereby generate a partially modified selected instruction representation and/or its underlying instruction code; c) defining a paste location in the displayed part program representation; and d) performing paste operations by executing a second subset of modification operations directed to elements that are specific to a second operating context at the paste location, to thereby generate and paste onto the paste location a fully modified selected instruction representation and/or its underlying instruction code. | 11-13-2014 |
20140328359 | LASER APPARATUS - A laser light generator emits laser light, a frequency of which can be adjusted. A laser light detector bombards an iodine cell with the laser light and photoelectrically converts the laser light that has passed through the iodine cell, then outputs a light output signal. A third order differential lock-in amplifier generates a third order differential signal of the light output signal. A frequency locker causes the laser light generator to change the frequency of the laser light within a predetermined range, detects an amplitude corresponding to a saturated absorption line occurring in the third order differential signal, and causes the frequency of the laser light to stabilize to a predetermined value. An error detector outputs an error signal in a case where the amplitude corresponding to the saturated absorption line occurring in the third order differential signal is greater than a predetermined value. | 11-06-2014 |
20140326057 | SURFACE PROPERTY MEASURING APPARATUS AND METHOD FOR CONTROLLING THE SAME - A surface property measuring apparatus includes a control unit, configured to control operations of a roughness measuring instrument and a relative moving mechanism, including: a measuring force command module configured to output a measuring command; and a measuring force control module configured to control the direction and magnitude of the measuring force, wherein the measuring force control module instructs a measuring force application unit of the roughness measuring instrument to generate therein the measuring force whose magnitude and direction are designated by the measuring force command when a displacement speed of a measuring arm is equal to or slower than a predetermined threshold, and the measuring force control module instructs the measuring force application unit to generate therein a force in a direction in which the distal end of the measuring arm is raised upwards when the displacement speed of the measuring arm exceeds the predetermined threshold. | 11-06-2014 |
20140321731 | Edge Measurement Video Tool With Robust Edge Discrimination Margin - A reliable method for discriminating between a plurality of edges in a region of interest of an edge feature video tool in a machine vision system comprises determining a scan direction and an intensity gradient threshold value, and defining associated gradient prominences. The gradient threshold value may be required to fall within a maximum range that is based on certain characteristics of an intensity gradient profile derived from an image of the region of interest. Gradient prominences are defined by limits at sequential intersections between the intensity gradient profile and the edge gradient threshold. A single prominence is allowed to include gradient extrema corresponding to a plurality of respective edges. A gradient prominence-counting parameter is automatically determined that is indicative of the location of the selected edge in relation to the defined gradient prominences. The gradient prominence-counting parameter may correspond to the scan direction. | 10-30-2014 |
20140300726 | SYSTEM AND METHOD FOR OBTAINING IMAGES WITH OFFSET UTILIZED FOR ENHANCED EDGE RESOLUTION - A method in a machine vision inspection system for obtaining two images of a workpiece with a desired sub-pixel offset between the images. The images are acquired using a fast multiple image acquisition mode of operation of a camera in the machine vision inspection system. In various implementations, the method includes removing the offset between the images such that the workpiece is congruent in the images and combining the congruent image data. The combined image data has a resolution better than that allowed by the native resolution of a camera that acquires images in the machine vision inspection system. The method may be implemented in an edge feature video tool for measuring edge features on the workpiece. The motion direction utilized for obtaining the two images may be made to be transverse to the edge direction of an edge that is being measured. | 10-09-2014 |
20140294282 | METHOD AND APPARATUS FOR HARDNESS TESTER - A hardness tester has an indentation former forming an indentation by pressing an indenter against a surface of a sample; an image capture controller controlling a CCD camera to capture an image of the surface of the sample and obtain image data; an indentation area extractor extracting an indentation area based on the obtained image data; and a hardness calculator calculating hardness of the sample based on the extracted indentation area. The indentation area extractor has a reduced image generator reducing the image obtained from the image data of the surface of the sample at a scale ratio selected from a plurality of predetermined scale ratios and generating a reduced image; and a pattern matcher performing pattern matching with respect to the generated reduced image and extracting the indentation area. | 10-02-2014 |
20140291497 | OPTICAL DISPLACEMENT ENCODER - An optical encoder includes a light source fiber holder holding a light source fiber and a collecting lens therein, and a nut. The light source fiber holder includes an end fitting together with a light source base. An outer circumferential surface of the end includes an inclined surface inclining such that a cross-sectional area increases as the surface approaches the light source fiber; and a projection capable of advancing into a groove of the light source base. The optical encoder includes a light source connector and the light source fiber holder. | 10-02-2014 |
20140283402 | CONTOUR MEASURING APPARATUS - A contour measuring apparatus includes: an arm including a stylus in a distal end and being swingable with respect to a cabinet; an attitude change mechanism configured to change an attitude of the arm within a swing range; a stopper configured to make contact with the arm when the arm moves nearer to an installation part of an object to be measured within the swing range; and a controller configured to operate the attitude change mechanism based on a power-off command and return the arm to a mechanical limit position in which the arm makes contact with the stopper. | 09-25-2014 |
20140265982 | CONTROL APPARATUS, CONTROL METHOD, AND COMPUTER READABLE MEDIUM - A control apparatus having high control performance is provided. A control apparatus according to an aspect of the present invention is a control apparatus that controls a DC motor, including a first current detection system that detects a current value of the DC motor, a second current detection system that detects a current value of the DC motor, and a control unit that controls the DC motor based on a signal indicating a current value input from the first or second current detection system, in which the second current detection system includes an amplifier. | 09-18-2014 |
20140263987 | Adaptable Resolution Optical Encoder - A flexible optical displacement encoder configuration uses a source grating to illuminate a scale with structured light such that light from the scale is modulated with a beat frequency envelope, which may have a relatively coarse pitch that matches a desired detector pitch. An imaging configuration provides spatial filtering to remove the high spatial frequencies from the modulation envelope to provide a clean signal in the detected fringe pattern. This combination of elements allows an incremental scale track pattern with a relatively finer pitch (e.g., 4, 5, 8 microns) to provide fringes with a coarser pitch (e.g., 20 microns) at a detector. Various scale resolutions can use a corresponding source grating such that all combinations can produce detector fringes that match the same economical detector component. | 09-18-2014 |
20140253724 | SHAPE MEASURING APPARATUS - A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce laser light; a first optical member configured to linearly spread the laser light from the light source and generate the line laser; and a second optical member, provided between the light source and the first optical member, configured to adjust an area of irradiation with a line laser on the work; a first sensor configured to receive a line laser reflected by the work and capture an image of the work; a lens configured to form an image of a line laser reflected by the work on an imaging surface of the first sensor; and a control part configured to control adjustment of the area of irradiation with the line laser on the work by the second optical member. | 09-11-2014 |
20140250989 | HARDNESS TESTER - A hardness tester has a test force applier generating a test force using an electromagnetic force generated by supplying a current to a drive coil provided in a magnetic field and applies the test force to an indenter to press the indenter into a surface of a sample; a temperature detector detecting a temperature of the test force applier; and a test force corrector correcting the test force generated from the test force applier based on the temperature detected by the temperature detector. | 09-11-2014 |
20140237834 | FORM MEASURING INSTRUMENT - A form measuring instrument includes: a body; a movable member including: a stylus holder being rotatably supported by the body; a stylus being held by the stylus holder; and a tip being provided at an end of the stylus and being contactable with a workpiece surface; a measurement-force-applying unit being adapted to generate a rotation force acting on the stylus holder to bring the tip of the stylus into contact with the workpiece surface; a displacement detector being provided to a portion of the stylus holder to detect a displacement of the stylus holder resulting from a rotation thereof; and a vibration generator being adapted to apply vibration to the stylus holder. | 08-28-2014 |
20140232856 | VISION MEASURING DEVICE AND AUTO-FOCUSING CONTROL METHOD - A vision measuring device includes: a camera which images a workpiece and transfers image information of the workpiece; a position control unit which controls an in-focus position of the camera and outputs the in-focus position as position information representing a position in a Z-axis direction; and a vision measuring machine which performs vision measurement on the workpiece based on image information and position information. The position control unit acquires and retains position information in response to a trigger signal output from the camera or the position control unit to the other at a certain timing of an imaging period during which the camera images the workpiece. The vision measuring machine calculates position information representing a position of image information in the Z-axis direction based on image information transferred from the camera and position information output from the position control unit, and performs auto-focusing control. | 08-21-2014 |
20140232855 | SHAPE MEASURING APPARATUS - A shape measuring apparatus includes a first light source, a second light source, an optical system, an image capturer, and a controller. The first light source emits visible light. The second light source emits measurement light used in a measurement. The optical system emits the visible light and the measurement light at the same position on a work piece. The image capturer captures an image of the measurement light reflected by the work piece. The controller is configured to cause the emission of the visible light onto the work piece with the first light source when determining a measurement position, and to control the emission of the measurement light onto the work piece with the second light source when making the measurement. | 08-21-2014 |
20140217271 | SEPARATE LINEAR ENCODER - In a separate linear encoder, a scale is further provided with an ABS track that is arranged in parallel with an INC track and a detection head includes an ABS detection portion that reads the ABS track. The separate linear encoder includes a calculation portion that obtains a yaw angle of the detection head with respect to a scale based on a gap between an INC detection portion and an ABS detection portion and a difference amount between a position value of the INC track, which is detected by the INC detection portion, and a position of the ABS track, which is detected by the ABS detection portion. The calculation portion also obtains a signal strength based on two-phase sine wave signals that are output from the INC detection portion. The separate linear encoder further includes a display device that displays a plurality of yaw angles and the signal strengths corresponding to the respective yaw angles. | 08-07-2014 |
20140203800 | INDUCTIVE DETECTION TYPE ROTARY ENCODER - An inductive detection type rotary encoder comprises: a stator; and a rotor that is engaged with a rotation shaft to rotate along with the rotation shaft and faces the stator in an axial direction. The stator comprises at least two transmission windings and reception windings that are disposed from an inner peripheral side to an outer peripheral side, and the rotor comprises at least two magnetic flux coupling bodies that are respectively magnetic flux coupled with these at least two transmission windings and reception windings to configure angle detection tracks. Furthermore, inner peripheral side reception windings and outer peripheral side reception windings are connected in series, and are led out by lead-out wirings commonly used in the inner peripheral side reception windings and the outer peripheral side reception windings. | 07-24-2014 |
20140190028 | METHOD AND PROGRAM FOR USING GESTURES TO CONTROL A COORDINATE MEASURING DEVICE - A coordinate measuring device includes a measuring probe measuring three-dimensional coordinates; a measuring arm supporting the measuring probe and outputting position information for calculating the three-dimensional coordinates; a controller connected to the measuring arm and detecting the three-dimensional coordinates based on the position information; and a memory storing a predetermined gesture. The controller further detects a trajectory of the measuring probe based on the continuously detected three-dimensional coordinates and, by cross-checking the trajectory with the gesture stored in the memory, the controller recognizes the specific gesture corresponding to the trajectory. | 07-10-2014 |
20140190027 | METHOD AND PROGRAM FOR USING GESTURES TO CONTROL A COORDINATE MEASURING DEVICE - A coordinate measuring device includes a measuring probe measuring three-dimensional coordinates; a measuring arm supporting the measuring probe and outputting position information for calculating the three-dimensional coordinates; a controller connected to the measuring arm and detecting the three-dimensional coordinates based on the position information; and a display displaying a menu. The controller further displays the menu on the display when a predefined menu display operation performed using the measuring probe is detected. | 07-10-2014 |
20140185910 | METHOD FOR IMPROVING REPEATABILITY IN EDGE LOCATION RESULTS OF A MACHINE VISION INSPECTION SYSTEM - A method for improving repeatability in edge location measurement results of a machine vision inspection system comprises: placing a workpiece in a field of view of the machine vision inspection system; providing an edge measurement video tool comprising an edge-referenced alignment compensation defining portion; operating the edge measurement video tool to define a region of interest of the video tool which includes an edge feature of the workpiece; operating the edge measurement video tool to automatically perform scan line direction alignment operations such that the scan line direction of the edge measurement video tool is aligned along a first direction relative to the edge feature, wherein the first direction is defined by predetermined alignment operations of the edge-referenced alignment compensation defining portion; and performing edge location measurement operations with the region of interest in that position. | 07-03-2014 |
20140182364 | HARDNESS TESTER - The hardness tester includes a plurality of weights; a transmission mechanism transmitting to an indenter a force of gravity acting on the weights; and a test force switching mechanism switching between magnitudes of a test force. The weights include hollow portions running through the weights in a vertical direction; and accommodation portions formed so as to be capable of accommodating the weight directly below. Outside tapered portions are provided to an exterior surface of the weights and inside tapered portions are provided to an interior surface of the accommodation portions. The transmission mechanism includes a shaft member and a weight engagement portion capable of being accommodated by the bottom-most accommodation portion to engage a weight. The weight engagement portion includes a tapered portion engaging the weight to regulate horizontal-direction displacement. A predetermined gap is reserved between the hollow portions and the shaft member. | 07-03-2014 |
20140177937 | HARDNESS TESTER AND METHOD FOR HARDNESS TEST - The hardness tester includes a data obtainer obtaining sample shape data that can specify a shape of a sample; an image capture controller controlling a CCD camera to capture an image of the surface of the sample and obtaining image data of the sample; a matching performer associating the sample shape data obtained by the data obtainer with the image data of the sample obtained by the CCD camera; an indentation former forming an indentation with an indenter in a test position set on the sample shape data after the sample shape data and the image data of the sample have been associated by the matching performer; and a hardness value calculator calculating a hardness value of the sample based on the indentation captured with the CCD camera after the indentation has been formed by the indentation former. | 06-26-2014 |
20140152805 | ORTHOGONAL STATE MEASURING DEVICE - An orthogonal state measuring device includes a measurement table and a CCD camera displacing in X, Y, and Z directions relative to the measurement table and measuring a work piece placed on the measurement table. The orthogonal state measuring device further includes a wide angle surveillance camera, a computer main body, and a display. The wide angle surveillance camera captures in one pass an image that is capable of configuring a bird's-eye image of the work piece, the bird's-eye image encompassing an entire field over which the CCD camera is capable of relative displacement. The computer main body generates the bird's-eye image based on the image and defines a position of the CCD camera on the bird's-eye image, then configures navigation maps in which the position of the CCD camera is composited on the bird's-eye image. The display displays the navigation maps. | 06-05-2014 |
20140151539 | PHOTOELECTRIC ABSOLUTE ENCODER AND INSTALLATION METHOD THEREFOR - In a photoelectric absolute encoder including a scale having a plurality of tracks with different pitch patterns, and a detector having a light source and light receiving elements including a plurality of light receiving element arrays corresponding to the plurality of tracks, a light receiving element array is additionally arranged at a position in the detector corresponding to a boundary between the track having a pattern with a wide pitch and the track having a pattern with a narrow pitch adjacent to each other in the scale, and displacement of the detector relative to the scale in a lateral direction is detected from a signal amplitude of the added light receiving element array. In this manner, displacement of the detector relative to the scale in the lateral direction can be detected. | 06-05-2014 |
20140150570 | SYSTEM AND METHOD FOR SETTING MEASUREMENT FORCE THRESHOLDS IN A FORCE SENSING CALIPER - An electrically powered caliper is provided which includes a scale member, a slider, a displacement sensor, a force sensing arrangement and a signal processing portion. The signal processing portion is configured to receive a force signal and indicate a respective force corresponding to the respective position of the slider. Force data is acquired comprising a plurality of respective forces corresponding to respective positions of the slider. The signal processing portion defines an acceptable measurement force range defined by at least a minimum force threshold that is determined such that it exceeds a compensation force corresponding to at least one force component included in the force signal that is independent of user variations of the measurement force. It may analyze acquired force data to identify pre-contact data, and set the minimum force threshold for a current measurement procedure based on that pre-contact data. | 06-05-2014 |
20140150274 | Electronic Caliper Configured to Generate Power for Measurement Operations - An electronic caliper generates power for measurement operations. The caliper comprises a scale member, a slider, a signal processing portion configured to measure a displacement between the scale member and slider, a power generating arrangement attached to the slider comprising a gear assembly configured to rotate in response to a force provided through the scale member to the gear assembly by a user opening or closing the caliper, and a power generator coupled to the gear assembly and configured to rotate in response to force provided by the rotating gear assembly and provide power to the signal processing portion. The power generating arrangement generates power as the user opens or closes the caliper and is configured such that it contributes a motion resistance force component of at most 20N during the user opening or closing the caliper using a maximum manual acceleration and/or speed. | 06-05-2014 |
20140150272 | Electronic Caliper Configured to Generate Power for Measurement Operations - An electronic caliper generates power for measurement operations. The caliper comprises a scale member, a slider, a signal processing portion configured to measure a displacement between the scale member and slider, a power generating arrangement attached to the slider comprising a gear assembly configured to rotate in response to a force provided through a power generating handle to the gear assembly by a user moving the power generating handle relative to the gear assembly, and a power generator coupled to the gear assembly and configured to rotate in response to force provided by the rotating gear assembly and provide power to the signal processing portion. The power generating arrangement generates power as the user moves the power generating handle, and the power generating arrangement contributes a motion resistance force component of at most 20N as the user moves the power generating handle with a maximum manual acceleration. | 06-05-2014 |
20140145084 | OPTICAL MEASURING DEVICE - In an optical measuring device, the visual observation section includes: a white light source which emits white light; a first objective lens arranged between the white light source and measurement object, through which the white light emitted from the white light source and return light from the measurement object transmit; a plurality of tube lenses which change a magnification of the return light passing through the first objective lens to a predetermined magnification; and a lens switching mechanism which can selectively switch the tube lenses so as to select one of the tube lenses to be arranged on the return light, and the special observation section includes: a special light source which emits special light; and a second objective lens arranged between the special light source and measurement object, through which the special light emitted from the special light source and return light from the measurement object transmit. | 05-29-2014 |
20140139133 | LED ILLUMINATING METHOD AND APPARATUS FOR IMAGE MEASURING DEVICE - In an image measuring device that performs, on a work piece to be measured, low brightness continuous illumination and one of stroboscopic illumination and continuous illumination with high brightness, a common high-brightness LED is used, and driving circuits are switched between pseudo-continuous illumination and one of stroboscopic illumination and continuous illumination. In the pseudo-continuous illumination, an average brightness is reduced by pulse lighting. In the stroboscopic illumination, high brightness light is emitted instantaneously. The switching between the pseudo-continuous illumination and one of the stroboscopic illumination and continuous illumination may be performed by changing a lighting cycle of the high-brightness LED. | 05-22-2014 |
20140130363 | SPHERICAL-FORM MEASURING APPARATUS - A spherical-form measuring apparatus includes a turntable | 05-15-2014 |
20140130362 | SHAPE MEASURING MACHINE AND METHOD OF CORRECTING SHAPE MEASUREMENT ERROR - A shape measuring machine includes a slider that supports a scanning probe including a tip sphere. A scale unit detects a displacement of the slider. A tip sphere displacement detection unit detects a displacement of the tip sphere. A calculation unit includes a correction filter and an adder, and calculates a measurement value from the displacements of the slider and the tip sphere. The correction filter outputs a correction value that is obtained by correcting the displacement of the tip sphere detected by the tip sphere displacement detection unit based on an inverse characteristic of a frequency transfer characteristic from the scale unit to the tip sphere. The adder calculates the measurement value by adding the displacement of the slider detected by the scale unit and the correction value. | 05-15-2014 |
20140126804 | EDGE MEASUREMENT VIDEO TOOL AND INTERFACE INCLUDING AUTOMATIC PARAMETER SET ALTERNATIVES - A user interface for setting parameters for an edge location video tool is provided. In one implementation, the user interface includes a multi-dimensional parameter space representation with edge zones that allows a user to adjust a single parameter combination indicator in a zone in order to adjust multiple edge detection parameters for detecting a corresponding edge. The edge zones indicate the edge features that are detectable when the parameter combination indicator is placed within the edge zones. In another implementation, representations of multiple edge features that are detectable by different possible combinations of the edge detection parameters are automatically provided in one or more windows. When a user selects one of the edge feature representation, the corresponding combination of edge detection parameters is set as the parameters for the edge location video tool. | 05-08-2014 |
20140123509 | SHAPE MEASURING INSTRUMENT, IMPEDANCE DETECTOR, AND IMPEDANCE DETECTION METHOD - A coordinate measuring device includes a probe detecting a shape of a measured object and outputting a signal indicating results of the shape detection. A probe interface receives the signal indicating the results of the shape detection. A cable transmits the signal indicating the results of the shape detection between the probe and the probe interface and bends accompanying displacement of the probe. The probe interface includes an impedance detector having a calculator detecting impedance in the cable. The impedance detector transmits high-speed test data to the probe through the cable and detects impedance in the cable according to whether a reception confirmation signal output by the probe is received. | 05-08-2014 |
20140109423 | LEVER HEAD - A stylus support member extends in a first direction. A first and second elastic body attaching members are spaced aside from each other in a second direction are arranged spaced aside from the stylus support member in the first direction, and are connected to each other by first and second members. A first elastic body is arranged between a holder and the first elastic body attaching member. A second elastic body is arranged between a first member and the first elastic body attaching member. A third elastic body is arranged between a second member and the second elastic body attaching member. A fourth elastic body is arranged between the holder and the second elastic body attaching member. A detector detects displacement in the second direction of the stylus support member. The first to fourth elastic members perform lever motion of a single degree of freedom. | 04-24-2014 |
20140109422 | SURFACE ROUGHNESS MEASURING UNIT AND COORDINATE MEASURING APPARATUS - A surface roughness measuring unit according to the present invention includes a contact pin unit having a contact pin and a displacement detector, the contact pin being provided so as to project and retract through a through-hole of a skid and scanning and moving along a surface of a work piece, the displacement detector detecting displacement of the contact pin in a direction perpendicular to the work piece surface; a driver moving the contact pin unit forward and backward along the surface of the work piece; and a joint coupling the contact pin unit and the driver to a measurement head holder of a coordinate measuring system. The surface roughness measuring unit further includes a contact detector that detects contact of the skid on the surface of the work piece. | 04-24-2014 |
20140109420 | DOUBLE CONE STYLUS, TOUCH PROBE, AND METHOD OF CALIBRATING DOUBLE CONE STYLUS - A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above. | 04-24-2014 |
20140109419 | PROFILE MEASURING INSTRUMENT, ADJUSTING METHOD FOR PROFILE MEASURING INSTRUMENT, AND PROFILE MEASURING METHOD - A profile measuring instrument usable to perform a rotary scanning measurement and a linear scanning measurement on a workpiece in the form of a revolution solid, includes: a turntable on which the workpiece is mounted, the turntable being rotatable around a predetermined rotation axis; a rotary scanning measurement unit being adapted to measure a displacement of a surface of the workpiece mounted on the turntable; a linear scanning measurement unit being adapted to measure a profile of the surface of the workpiece mounted on the turntable along a predetermined measurement axis; and an aligning mechanism being adapted to relatively move the linear scanning measurement unit and the turntable in a direction intersecting with the measurement axis. The linear scanning measurement unit and the turntable are adjusted to relative positions at which the measurement axis passes through the rotation axis. | 04-24-2014 |
20140107973 | THREAD PROFILE MEASURING METHOD - A method includes: performing a scanning measurement of a female thread along first and second axes extending along a center axis of the thread and opposed to each other across the center axis; determining characteristic values of the thread from contour data of the thread obtained through the measurement; obtaining the contour data including first contour data associated with the first axis and second contour data associated with the second axis by performing the measurement; detecting a thread displacement along the center axis between a crest associated with the first axis and a crest associated with the second axis at each of first position and second position on the center axis; calculating inclination and deviation of the first and second axes from the thread displacements detected at the first and second positions; and adjusting an attitude of the thread for the measurement to eliminate the inclination and deviation. | 04-17-2014 |
20140102192 | DUST-PROOF STRUCTURE FOR MEASURING TOOL - A dust-proof structure for a measuring tool, includes: a case provided with an opening formed through a surface opposed to a protection plate thereof; a solar panel accommodated in the case through the opening of the case; an intermediate panel pressing an outer circumferential portion of the solar panel against a bottom wall of the case; a display device disposed at an inward portion of the intermediate panel and opposed to the solar panel with a gap; a cover attached to close the opening of the case; a screw used to secure the cover and the intermediate panel to the case; and a temporary-fixing unit disposed between the intermediate panel and the case, the temporary-fixing unit temporarily fixing the intermediate panel to the case while the outer circumferential portion of the solar panel is pressed against the bottom wall of the case. | 04-17-2014 |
20140081602 | METHOD, SYSTEM AND PROGRAM FOR GENERATING THREE-DIMENSIONAL MODEL - In a method of generating a three-dimensional (3D) model, a computing device enters measurement data including measurement point group data obtained from measurement of a measured object, a type of surface element, and a geometry value of a surface element; calculates an error of the measurement data based on the surface element specified by the measurement data; determines whether the calculated error is within a predetermined tolerance; corrects the surface element by the error when the error is within the tolerance; and obtains intersection data of the surface elements and outline data of each surface element from the corrected surface elements to generate a 3D model. | 03-20-2014 |
20140078299 | HARDNESS TESTER AND METHOD FOR HARDNESS TEST - Provided is a hardness tester and method including an indentation former creating an indentation in a sample surface with an indenter; a first area calculator calculating an area of the indentation during application of pressure, the indentation being formed in the sample surface while the indenter is pressed against the sample; an image capture controller controlling a CCD camera to obtain image data of the sample surface; a second area calculator calculating the area of the indentation remaining in the sample surface based on the obtained image data; an elasticity index calculator calculating an elasticity index of the sample based on the area of the indentation during application of pressure and the area of the indentation calculated by the second area calculator; and a hardness value calculator calculating a hardness value of the sample based on the indentation remaining in the sample surface. | 03-20-2014 |
20140059872 | SHAPE MEASURING MACHINE AND METHOD OF CORRECTING SHAPE MEASUREMENT ERROR - A shape measuring machine includes a slider that supports a scanning probe. A scale unit detects a displacement of the slider. A tip sphere displacement detection unit detects a displacement of the tip sphere. A calculation unit includes a correction filter including a first and second filters and an adder, and calculates a measurement value from the displacements of the slider and the tip sphere. The first filter corrects the displacement of the slider based on a frequency transfer characteristic from the scale unit to the tip of the slider. The second filter outputs a value that is obtained by correcting a value corrected by the first filter based on a frequency transfer characteristic from the tip of the slider to the tip sphere as the correction value. The adder outputs a measurement value obtained by adding the correction value and the displacement of the tip sphere. | 03-06-2014 |
20140055604 | MACHINE VISION INSPECTION SYSTEM COMPRISING TWO CAMERAS HAVING A ROTATIONAL OFFSET - A machine vision inspection system comprises an optical portion providing an image of a field of view of a workpiece which may be a magnified image. A first camera and a second camera provide first and second images of a shared or common field of view of the workpiece and are arranged such that the orientation of the common field of view imaged in the first camera is rotated relative to the orientation of the common field of view imaged in the second camera. Signal processing provides an edge measurement of an edge feature within the common field of view and determines which of the first and second images is used as a basis for the edge measurement based on whether their respective edge orientation (with respect to the pixel array of each camera) differs from the pixel array orientation of their associated camera by an orientation difference threshold amount. | 02-27-2014 |
20140033554 | HANDHELD MEASUREMENT TOOL WITH USER DEFINED DISPLAY - A handheld measurement tool with a display that can be defined by a user. The handheld measurement tool may be a portable measurement gauge (e.g. a digital caliper, digital “dial” gauge, height gauge, micrometer, indicator, etc.) that may be utilized for measuring precise physical dimensions of workpieces. The display may be independently modified according to a customer's individual needs for various precision measurement applications. A remote device (e.g. PC, laptop, tablet, smartphone, etc.) may be utilized for reconfiguring the display, wherein a user can select and modify display format arrangements on the remote device. When the remote device is coupled to the portable measurement gauge, the gauge display is reconfigured so as to have a similar appearance to the defined display format arrangement. In certain embodiments, voice commands may be reconfigured and used for controlling the gauge display. | 02-06-2014 |
20140013834 | HARDNESS TESTER AND PROGRAM - A hardness tester having an image capturer capturing an indentation image, a data memory, an automatic size-scanning program scanning an indentation size, and a hardness calculation program includes: an identification information providing program providing image data with test specimen identification information and indentation identification information; a memory control program having the image data associated with the identification information stored; a specifying program specifying, when a scanning error occurs, identification information of image data in which the scanning error has occurred; an obtaining program obtaining the image data from the data memory based on the specified identification information; and a re-scanner (a display, an operator, and a manual size-calculation program) re-scanning an indentation size from the obtained image data. | 01-16-2014 |
20130319091 | INDENTATION TESTER - Indentation tester capable of adjusting vertical-direction positioning drift due to individual differences of an indenter when indenters are switched includes an adjustment mechanism. The adjustment mechanism adjusts relative vertical-direction positions of a displacement sensor movable portion and a displacement sensor fixed portion. The adjustment mechanism includes a first hollow disk having a spiraling surface formed on a bottom surface; and a second hollow disk having a spiraling surface formed on a top surface. The spiraling surface of the second hollow disk has a thread equal to that of the spiraling surface of the first hollow disk. The first hollow disk rests on the second hollow disk such that the bottom surface of the first hollow disk is overlaid on the top surface of the second hollow disk. The first hollow disk and the second hollow disk are capable of rotation on a center axis of an indenter column. | 12-05-2013 |
20130314690 | INTERCHANGEABLE OPTICS CONFIGURATION FOR A CHROMATIC RANGE SENSOR OPTICAL PEN - An optical pen for use in a chromatic range sensor (CRS) may be used in a probe system for a coordinate measuring machine (CMM). The optical pen includes a confocal optical path, an interchangeable optics element, an optical pen base member, and a repeatable fast exchange mount. The confocal optical path includes a confocal aperture and a chromatically dispersive optics portion. The interchangeable optics element includes the chromatically dispersive optics portion. The optical pen base member includes an external mounting surface for mounting to an external reference frame. The repeatable fast exchange mount includes a first mating half located on the base member and a second mating half located on the interchangeable optics element. The repeatable fast exchange mount is configured to allow the base member to receive and hold the interchangeable optics element in a fixed relationship relative to the base member and the external reference frame. | 11-28-2013 |
20130310962 | SHAPE MEASURING APPARATUS - A shape measuring apparatus includes: a probe having a stylus tip; a movable mechanism configured to move the stylus tip; an information acquiring unit configured to acquire design information of a workpiece; a path setting unit configured to set a path of the stylus tip; a path component calculating section configured to calculate a path velocity vector; a push direction component calculating section configured to detect a deflection, and calculate a push correction vector; a locus correction component calculating section configured to detect an amount and a direction of locus deviation of the probe from the path, and calculate a locus correction vector; a velocity synthesizing section configured to calculate a velocity synthesis vector by combining the path velocity vector, the push correction vector, and the locus correction vector; and a drive control unit configured to move the probe according to the velocity synthesis vector. | 11-21-2013 |
20130305858 | FAST ROTARY DRIVE FOR A HANDHELD MICROMETER - A micrometer drive configuration for a handheld micrometer comprises: a frame; a spindle; a linear displacement sensor that senses a displacement of the spindle; a threaded spindle drive having a relatively coarse thread pitch, wherein the threaded spindle drive is attached to a spindle drive gear; a planetary drive gear that mates to the spindle drive gear; a ring gear surrounding and mating to the planetary drive gear; and a thimble generally surrounding the spindle drive gear, the planetary drive gear, and the ring gear. The thimble is coupled to drive the spindle drive gear through the planetary drive gear, and the planetary drive gear is sized and mounted such that the spindle drive gear turns faster than the thimble. | 11-21-2013 |
20130283627 | PROFILE MEASURING METHOD AND PROFILE MEASURING INSTRUMENT - A controller of a profile measuring instrument includes: an information acquirer that acquires profile information on a profile of a workpiece and a probe command unit that calculates a probe command value for moving the probe by a movement mechanism based on the profile information acquired by the information acquirer. The probe command value is a value for causing a movement of the stylus tip along a lateral face of an imaginary cone that is imaginarily defined in accordance with the profile of the workpiece based on the profile information, the movement of the stylus tip being performed while a distance between a center of the stylus tip and a reference axis passing through a center of a bottom face of the imaginary cone and parallel to the lateral face of the imaginary cone is kept constant. | 10-31-2013 |
20130277540 | MULTIPLE WAVELENGTH CONFIGURATION FOR AN OPTICAL ENCODER READHEAD - A readhead and scale arrangement comprises: a readhead comprising a light source configured to output diverging source light comprising a plurality of individually detected wavelengths and at least a first optical signal receiver channel configured to provide a first set of position signals; and a scale track extending along the measuring axis direction on a scale member comprising a scale grating, the scale track configured to diffract the first diverging source light to provide first and second diffracted scale light portions of each of the individually detected wavelengths to the first optical signal receiver channel which provide interference fringes. The readhead comprises an optical path difference element, arranged such that respective wavelengths undergo different phase shifts. Such an encoder is robust to scale track contamination and other signal degradation. | 10-24-2013 |
20130276319 | MICROMETER - A micrometer includes: a frame; an anvil; a spindle; an encoder; a display; a strain gauge that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge, as a compensation factor; and a compensator that compensates the detection value based on a difference between a zeroset-time deformation that is detected by the strain gauge when a command for zeroset is given and a measurement-time deformation that is detected by the strain gauge in measurement, and based on the compensation factor stored in the storage. | 10-24-2013 |
20130271995 | AUTOFOCUS MECHANISM - A computation & control unit defines, as first and second voltages, A+B_signal voltages at distances which give the maximum and minimum voltages of an S_signal voltage, respectively. The unit further defines the higher one of the first and second voltages as an S_signal validity determination voltage and defines a distance at which the S_signal voltage takes on an in-focus determination voltage. The unit defines first and second lower limit voltages, defines the higher one of the first and second lower limit voltages as a lower limit voltage, and defines, as an upper limit voltage, an A+B_signal voltage at a distance which gives an in-focus determination voltage between the maximum and minimum positions of the S_signal voltage. An input and output unit outputs the upper and lower limit voltages as the upper and lower limit values of a settable range of the S_signal validity determination voltage. | 10-17-2013 |
20130270428 | ENCODER - A first reference pattern has a plurality of patterns, which are arranged periodically in a measurement axis direction and have the same width in the measurement axis direction. The plurality of patterns have the respective different pitches. At least one of the plurality of patterns is smaller in pitch than a first main signal pattern. A second sensor has a plurality of detection regions which are in one-to-one correspondence with the plurality of patterns of the first reference pattern. An addition calculating section calculates an addition signal by adding up output signals of the plurality of detection regions. A square calculating section calculates a squared signal from the addition signal. A judging section outputs a reference signal for determination of a reference position according to signal levels of the squared signal. | 10-17-2013 |
20130265663 | ADAPTER CORRECTING FOR GLASS THICKNESS AND FIELD LENS - The adapter correcting for glass thickness includes an adapter main body, a plane parallel plate, and a retainer. The adapter main body includes an attacher/detacher capable of attaching and detaching with respect to an adapter connecter on the lens barrel; a tubular accommodator extending from the attacher/detacher toward the objective along an optical axis of the field lens; and a tongue provided on the attacher/detacher side of the accommodator. The plane parallel plate includes two mutually parallel flat surfaces and is inserted into the accommodator such that the two flat surfaces are orthogonal to the optical axis of the field lens. The retainer is attached to an end of the accommodator closest to the objective and holds the plane parallel plate between the retainer and the tongue. The accommodator is formed to have a tubular length sufficient to insert at least two plane parallel plates. | 10-10-2013 |
20130258094 | HARDNESS TESTER - A hardness tester enabling a user to form an indentation in a desired test position, capable of performing an accurate hardness test even when center positions of an indenter and a field lens are offset. The hardness tester includes an XY stage displacing a sample stage in a horizontal direction; a CCD camera capturing images of a sample surface via a field lens; a monitor displaying the images; a turret capable of selectively positioning the indenter or the field lens in a predetermined position opposite the sample; a memory storing an amount of horizontal direction offset between the center positions of the indenter and the field lens when positioned in the predetermined position; and a CPU displaying, based on the amount of offset stored in the memory, a mark indicating the center position of the indenter on the monitor when the field lens is positioned in the predetermined position. | 10-03-2013 |
20130255362 | HARDNESS TESTER - A hardness tester capable of facilitating positioning of a sample even when the hardness tester includes a manual XY stage. The hardness tester includes an XY stage displacing a sample stage in a horizontal direction; a CCD camera capturing an image of a sample surface via an objective lens; a monitor displaying the image of the sample surface captured by the CCD camera; an operator specifying a test position at which an indentation is to be formed, the test position being specified on the image displayed on the display; and a CPU calculating, in conjunction with displacement of the XY stage, an amount of offset in the XY direction between the test position and a center position of the indenter when forming the indentation, then displaying the calculated amount of offset on the display. | 10-03-2013 |
20130247403 | DIGITAL INDICATOR AND MULTIPOINT MEASURING APPARATUS - A digital indicator includes: a body; a spindle formed in the body, movably in an axial direction; a displacement detecting sensor configured to detect a movement displacement amount of the spindle; a display device configured to display the movement displacement amount of the spindle detected by the displacement detecting sensor; and a display controller configured to linearly move a measured value display mark representing a measured value in a display surface of the display device according to variations in the measured value. | 09-26-2013 |
20130246959 | SURFACE TEXTURE MEASUREMENT DEVICE - A surface texture measurement device displays in a display an operation screen based on display information of a current operation screen, and displays in the display a guidance screen when guidance display is requested by pressing a guidance screen display button on the operation screen. The operation screen has icon display for one or more buttons that activate predetermined functions. The guidance screen has a button list field that displays a list of icon display and function name display for the buttons included in the current operation screen and a description display field that displays a function description for any of the buttons included in the current operation screen. | 09-19-2013 |
20130242311 | WHITE-LIGHT INTERFEROMETRIC MEASURING DEVICE - A white-light interferometric measuring device includes: a white light source that emits a white light beam; a beam splitter that reflects the white light beam; and an interference objective lens that collects the white light beam having reflected off the beam splitter in the direction of an optical axis and irradiates a measurement workpiece with the white light beam, the interference objective lens generating interference between a measurement light beam obtained by reflection of the white light beam off the measurement workpiece and a reference light beam obtained by branching of the white light beam to be converged on the measurement workpiece. Polarization correcting means that corrects the white light beam to enter the interference objective lens to circularly polarized light is arranged between the white light source and the interference objective lens. | 09-19-2013 |
20130239668 | SURFACE TEXTURE MEASURING MACHINE AND A SURFACE TEXTURE MEASURING METHOD - A surface texture measuring method includes: moving a stylus toward an origin point; and, when the stylus reaches the origin point, braking the stylus to be stopped after overrunning the origin point waiting for a measurement start command (approach section setting operation); bringing the stopped stylus into contact with a target portion of the workpiece (workpiece setting operation); moving the stopped stylus in a measurement direction reverse to the overrunning (approach operation); and, when the stylus passes the origin point in the approach operation, continuing the movement of the stylus while acquiring data detected by the detector (measurement operation). | 09-19-2013 |
20130238281 | SURFACE TEXTURE MEASUREMENT DEVICE, CONTROLLER FOR SURFACE TEXTURE MEASUREMENT DEVICE, AND METHOD FOR CONTROLLING THE SAME - A surface texture measurement device capable of resolving errors for each entire display range, a controller for the surface texture measurement device, and a method for controlling the surface texture measurement device that includes selecting any one of the display ranges as a reference range and defining a calibration measurement value for each display range; sequentially inputting the calibration measurement values in place of the measurement values to the range amplifier corresponding to the reference range to obtain a reference display value rDATAi; inputting the calibration measurement values to the range amplifiers corresponding to each display range, then obtaining an AD-converted value ADi and a display value DATAi; computing a gain error rate ki=rDATAi/DATAi, a display resolution DIVi=DATAi/ADi, and a corrected display resolution cDIVi=DIVi×ki; and displaying the corrected display value cDIVi=DIVi×ki. | 09-12-2013 |
20130232802 | MEASURING INSTRUMENT - To provide a measuring instrument having improved usability and viewability. A measuring instrument includes a touch panel display unit that receives an external input performed by physical contact and has a display function. In the touch panel display unit, a plurality of operation icons that are used to perform a complicated input operation as well as a measurement result are displayed. It is possible to provide a measuring instrument that is superior in terms of the usability and viewability. For example, a measurement mode can be selected by selecting and touching one of the plurality of operation icons displayed in the touch panel display unit. | 09-12-2013 |
20130226507 | DIGITAL DISPLACEMENT MEASURING INSTRUMENT - A digital displacement measuring instrument includes: a body; a spindle; an encoder; a display; a speed information detector that detects a moving speed of the spindle; a judging unit that judges whether or not the spindle is stopped based on the moving speed detected by the speed information detector and, when the judging unit judges that the spindle is stopped, judges whether or not the moving speed of the spindle just before the spindle is stopped exceeds a predetermined threshold; and a notifying unit that notifies a judgment result provided by the judging unit. | 08-29-2013 |
20130222815 | CHROMATIC RANGE SENSOR INCLUDING MEASUREMENT RELIABILITY CHARACTERIZATION - A method of categorizing the reliability of measurement data in a chromatic range sensor (e.g., an optical pen) which uses chromatically dispersed light to measure the distance to a surface. In one embodiment, the system performs a number of predetermined reliability checks which determine the reliability categories for the sets of measurement data. The reliability categories may be stored as metadata with the respective workpiece height measurements that are determined from the associated measurement data. The reliability categories may be reported to the user (e.g., as graphical reliability category indicators that accompany a graphical display of the measurement data). With these reliability categories, the user may make informed decisions regarding the measurement data (e.g., deciding to filter out data that is associated with certain reliability categories, making adjustments to the setup to achieve improved measurements, etc.). | 08-29-2013 |
20130222797 | METHOD FOR IDENTIFYING ABNORMAL SPECTRAL PROFILES MEASURED BY A CHROMATIC CONFOCAL RANGE SENSOR - A method for operating a chromatic range sensor (CRS) system to identify abnormal spectral profiles arising from light reflected from more than one portion of a workpiece surface is provided. The method comprises: providing a CRS system comprising: an optical element, a light source, and CRS electronics comprising a CRS wavelength detector; operating the CRS system to receive an output spectral profile from a measurement point on a workpiece surface and provide corresponding output spectral profile data; analyzing the output spectral profile data to provide a peak region asymmetry characterization; and providing a corresponding abnormality indicator if the peak region asymmetry characterization indicates that the peak region is abnormally asymmetric. | 08-29-2013 |
20130215263 | IMAGE PROCESSING DEVICE AND METHOD OF IMAGE PROCESSING - A control unit shifts an imaging unit relatively with respect to a stage to take an image of a measuring object at a plurality of places by the imaging unit and thereby obtain a plurality of images, and generates a composite image of the measuring object having a range which is wider than an imaging range of the imaging unit by combining the plurality of images. The control unit shifts the imaging unit relatively with respect to the stage such that parts of images adjacent to one another obtained by the imaging unit overlap, and performs an image matching processing that performs image matching of an overlapped portion of the adjacent images. The control unit generates the composite image of the measuring object by joining the adjacent images at a position where the image matching is performed in the image matching processing. | 08-22-2013 |
20130214137 | PHOTOELECTRIC ENCODER - A photoelectric encoder includes an irradiation unit configured to apply first and second irradiation light beams having a first linear polarization direction, a scale configured to produce first and second diffraction light beams having the first linear polarization direction by diffracting the first and second irradiation light beams, respectively, the scale having a glass plate whose front surface has a grating shape, a polarizing unit configured to convert the first diffraction light beam into a third diffraction light beam having a second linear polarization direction which is perpendicular to the first linear polarization direction, to produce first and second composite light beams by combining the second diffraction light beam and the third diffraction light beam, and to convert the first composite light beam into a circularly polarized third composite light beam, and a light receiver configured to receive the second composite light beam and the third composite light beam. | 08-22-2013 |
20130206970 | PHOTOELECTRIC ENCODER - A photoelectric encoder according to the present invention comprises a light-receiving unit including: a first and second light-receiving element column; and a light-blocking layer configured from a light-blocking portion and a light-transmitting portion, the first and second light-receiving element columns being disposed staggered in a second direction such that an arrangement pattern of light-receiving elements in the first and second light-receiving element columns has a pitch which is the same in a first direction and a phase which differs in the first direction, and the light-transmitting portion on the light-receiving surface of the light-receiving element in the first light-receiving element column and the light-transmitting portion on the light-receiving surface of the light-receiving element in the second light-receiving element column being formed so as not to overlap each other when staggered in the second direction. | 08-15-2013 |
20130195132 | METHOD FOR DETERMINING SATURATED ABSORPTION LINES AND LASER FREQUENCY STABILIZING DEVICE - A method for determining saturated absorption lines includes defining first and second threshold values based on an output value of a light output signal. The first and second threshold values are in a magnitude relationship. An output value of a second-order differential signal of the light output signal is compared with the first and second threshold values. A determination is made as to whether the second-order differential signal following a change in a resonator length has an output waveform that displays a behavior in which the output waveform changes from less than the second threshold value to be equal to or greater than the first threshold value, and then changes to be less than the second threshold value. Based on a result of the determination by the waveform determination, a determination is made as to whether the output waveform of the second-order differential signal is the saturated absorption line. | 08-01-2013 |
20130187639 | INDUCTIVE DETECTION TYPE ROTARY ENCODER - A first reception wiring and a first magnetic flux coupler form a first track having a shape periodically changing in a rotation direction of the rotor at a first pitch. A second reception wiring and a second magnetic flux coupler form a second track having a shape periodically changing in a rotation direction of the rotor at a second pitch. The first reception wiring and the second reception wiring are stacked via a first insulative layer in a direction in which a rotation shaft extends. The first magnetic flux coupler and the second magnetic flux coupler are stacked via a second insulative layer in a direction in which the rotation shaft extends. | 07-25-2013 |
20130185010 | MEASUREMENT COORDINATE CORRECTION METHOD AND COORDINATE MEASURING APPARATUS - A measurement coordinate correction method correcting the measurement coordinates of a work piece placed on a base, in which the measurement coordinate correction method includes a weight acquiring step, a position acquiring step, and a correcting step. The weight acquiring step acquires information related to the weight of the work piece. The position acquiring step acquires information related to the position of the work piece on the base. The correcting step corrects the measurement coordinates of the work piece based on the weight and position of the work piece. | 07-18-2013 |
20130181353 | SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME - A semiconductor package includes a semiconductor device and a substrate, the semiconductor device including a straight line portion on an outer periphery and the substrate supporting the semiconductor device. A foil positioning pattern is formed on a front surface of the substrate, the positioning pattern touching the straight line portion of the semiconductor device to regulate a position of the semiconductor device. | 07-18-2013 |
20130176575 | IMAGE SENSOR, ATTITUDE DETECTOR, CONTACT PROBE, AND MULTI-SENSING PROBE - An image sensor for fringe images of interference fringes and the like in which the optical system has a simpler configuration than that of the conventional line image sensor, and faster detection becomes possible includes a light receiving plane on which two or more straight rows of pixels are disposed, and captures images of regular fringes generated from light reflected from an irradiated body in accordance with the amount of light received by each pixel; among the rows of pixels, at least two rows of pixels are disposed at right angles to each other, and acquires images of linear fringes crossing almost at right angles in two directions among the fringe projected onto the light receiving plane. | 07-11-2013 |
20130176561 | WAVELENGTH DETECTOR AND CONTACT PROBE USING IT - A contact probe includes a stylus and an optical detector configured to detect a posture of the stylus optically. An illumination subject portion is formed on the stylus and has three or more reflection surfaces. The optical detector includes three or more fibers, a light source, a condenser lens group, and a wavelength detector. The wavelength detector calculates posture information of the stylus on the basis of wavelength variations of reflection light beams that are caused by variations of intervals between the condenser lens group and the three or more reflection surfaces, respectively. The contact probe acquires coordinates of a position of the contact to the object to be measured on the basis of posture information obtained by the optical detector. | 07-11-2013 |
20130174653 | HARDNESS TESTER AND PROGRAM - The present invention provides a hardness tester capable of accurately detecting a point where an indenter contacts a sample in instrumented indentation testing. Prior to beginning measurement, the hardness tester defines an expected range for a value for a displacement, speed, or acceleration of an indenter during a process of approaching a sample. After measurement has begun, the hardness tester measures the value for the displacement, speed, or acceleration of the indenter during the process of approaching the sample. When the measured value is not within the expected range, the hardness tester determines that detection of a zero point has failed. | 07-11-2013 |
20130163006 | CHROMATIC POINT SENSOR COMPENSATION INCLUDING WORKPIECE MATERIAL EFFECTS - A method of error compensation in a chromatic point sensor (CPS) reduces errors associated with varying workpiece spectral reflectivity. The errors are associated with a distance-independent profile component of the CPS measurement signals. Workpiece spectral reflectivity may be characterized using known spectral reflectivity for a workpiece material, or by measuring the workpiece spectral reflectivity using the CPS system. CPS spectral reflectivity measurement may comprise scanning the CPS optical pen to a plurality of distances relative to a workpiece surface and determining a distance-independent composite spectral profile from a plurality of resulting wavelength peaks. By comparing the distance-independent composite spectral profile obtained from a workpiece with that corresponding to the CPS distance calibration procedure, the contribution of the reflectivity characteristics of the workpiece will be indicated in the differences between the profiles, and potential CPS position errors due to varying workpiece reflectivity characteristics may be calculated and/or compensated. | 06-27-2013 |
20130162972 | CHROMATIC POINT SENSOR CONFIGURATION INCLUDING REAL TIME SPECTRUM COMPENSATION - A chromatic point sensor system configured to compensate for potential errors due to workpiece material effects comprises a first confocal optical path including a longitudinally dispersive element configured to focus different wavelengths at different distances proximate to a workpiece; a second optical path configured to focus different wavelengths at substantially the same distance proximate to the workpiece; a light source connected to the first confocal optical path; a light source connected to the second optical path; a first confocal optical path disabling element; a second optical path disabling element; and a CPS electronics comprising a CPS wavelength detector which provides output spectral profile data. The output spectral profile data from the second optical path is usable to compensate output spectral profile data from the first confocal optical path for a distance-independent profile component that includes errors due to workpiece material effects. | 06-27-2013 |
20130162807 | POINTS FROM FOCUS OPERATIONS USING MULTIPLE LIGHT SETTINGS IN A MACHINE VISION SYSTEM - A method of automatically adjusting lighting conditions improves the results of points from focus (PFF) | 06-27-2013 |
20130162806 | ENHANCED EDGE FOCUS TOOL - A method for operating an edge focus tool to focus the optics of a machine vision inspection system proximate to an edge adjacent to a beveled surface feature is provided. The method comprises defining a region of interest (ROI) including the edge in a field of view of the machine vision inspection system; acquiring an image stack of the ROI over a Z range including the edge; generating a point cloud including a Z height for a plurality of points in the ROI, based on determining a best focus Z height measurement for the plurality of points; defining a proximate subset of the point cloud comprising points proximate to the beveled surface feature and corresponding to the shape of the beveled surface feature; defining a Z-extremum subset of the proximate subset of the point cloud; and focusing the optics at a Z height corresponding to the Z-extremum subset. | 06-27-2013 |
20130161500 | ILLUMINATION PORTION FOR AN ADAPTABLE RESOLUTION OPTICAL ENCODER - An illumination portion is used in an optical encoder which comprises a scale grating, an imaging portion, and a detector portion. A light source outputs light having a wavelength λ. A structured illumination generating portion inputs the light and outputs structured illumination. The structured illumination comprises an illumination fringe pattern oriented transversely to the measuring axis direction. A first filtering lens focuses the structured illumination proximate to a plane of the spatial filter aperture configuration. A spatial filtering aperture configuration includes a central portion that blocks zero-order portions of the structured illumination and an open aperture portion that outputs +1 order and −1 order portions of the structured illumination to a second filtering lens. The second filtering lens outputs the structured illumination to a plane of the scale grating with an illumination fringe pitch P | 06-27-2013 |
20130161499 | ADAPTABLE RESOLUTION OPTICAL ENCODER - A flexible optical displacement encoder configuration uses a source grating to illuminate a scale with structured light such that light from the scale is modulated with a beat frequency envelope which may have a relatively coarse pitch that matches a desired detector pitch. An imaging configuration provides spatial filtering to remove the high spatial frequencies from the modulation envelope to provide a clean signal in the detected fringe pattern. This combination of elements allows an incremental scale track pattern with a relatively finer pitch (e.g., 4, 5, 8 microns) to provide fringes with a coarser pitch (e.g., 20 microns) at a detector. Various scale resolutions can use a corresponding source grating such that all combinations can produce detector fringes that match the same economical detector component. | 06-27-2013 |
20130133409 | SURFACE TEXTURE MEASURING APPARATUS - Surface texture measuring apparatus includes a measurement arm table storing mass of an entire measurement arm, an arm length from a supporting point to a stylus, and a horizontal and vertical barycenter of the measurement arm in a horizontal posture for each type of the measurement arm in which a second measurement arm having a different mass is attached; a measurement arm specifier; an inclination angle detector detecting an inclination angle of the detector; and a controller reading out from the measurement arm table the mass, the arm length, the horizontal barycenter, and the vertical barycenter for a specified measurement arm, calculating a difference between a measurement force of the measurement arm in the horizontal posture and a measurement force of the measurement arm in an inclined posture based on the read-out information and the inclination angle detected by the inclination angle detector, and adjusting a measurement force. | 05-30-2013 |
20130127644 | SCALE OF PHOTOELECTRIC ENCODER AND MANUFACTURING METHOD OF THE SAME - A scale of a photoelectric encoder includes a base member which is conductive and has a light reflection surface, and light absorptive black gratings which are arranged at a prescribed pitch on the base member. | 05-23-2013 |
20130125631 | HARDNESS TESTER AND HARDNESS TEST METHOD - A hardness tester includes an image pickup control section, an indentation region extraction section, an indentation apex extraction section and a hardness calculation section. The image pickup control section obtains picked-up image data of a sample's surface. The region extraction section binarizes the image data, determines based on the binarized image data whether an indentation region candidate is extracted, and when determining that the candidate is not extracted, obtains curvature image data, binarizes the curvature image data, erodes and dilates the binarized curvature image data, performs distance transform on the eroded-and-dilated curvature image data, and extracts a closed region corresponding to the indenter's shape using the distance-transformed curvature image data. The apex extraction section extracts an indentation-measurement-use apex based on the closed region. The hardness calculation section calculates the sample's hardness based on the apex. | 05-23-2013 |
20130125044 | Machine Vision System Program Editing Environment Including Synchronized User Interface Features - A machine vision system program editing environment including synchronized selection and/or identification of related features in a plurality of different user interface windows is provided. In particular, one of the windows is an editing window where a part program representation is displayed for editing by a user. In one embodiment, a user may select data or another feature of interest in a window that is not the editing window (e.g., a results window, or graphical workpiece inspection feature display window) and the associated part program instruction representation is automatically highlighted and/or selected in the editing window. Conversely, a part program instruction representation may be selected by a user in the editing window and the associated results or feature in another window is automatically highlighted and/or selected. User interface navigation, rapid program quality assessment, and overall part program creation and editing efficiency are significantly enhanced in such an editing environment. | 05-16-2013 |
20130123945 | MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING REAL TIME CONTEXT GENERATION FEATURES - A machine vision system program editing environment includes near real time context generation. Rather than requiring execution of all preceding instructions of a part program in order to generate a realistic context for subsequent edits, surrogate data operations using previously saved data replace execution of certain sets of instructions. The surrogate data may be saved during the actual execution of operations that are recorded in a part program. An edit mode of execution substitutes that data as a surrogate for executing the operations that would otherwise generate that data. Significant time savings may be achieved for context generation, such that editing occurs within an operating context which may be repeatedly refreshed for accuracy in near real time. This supports convenient program modification by relatively unskilled users, using the native user interface of the machine vision system, rather than difficult to use text-based or graphical object-based editing environments. | 05-16-2013 |
20130120567 | SYSTEM AND METHOD UTILIZING AN EDITING INITIALIZATION BLOCK IN A PART PROGRAM EDITING ENVIRONMENT IN A MACHINE VISION SYSTEM - A method is provided for defining and utilizing an editing initialization block for a part program. The part program comprises a plurality of steps for taking measurements of a part and is displayed in an editing interface. An option is provided in the editing interface for selecting which steps are in an editing initialization block. After the part program has been saved, at a later time when the part program is recalled for editing, the editing initialization block may be run before additional steps are added to the part program. At least some of the data that would have been obtained by one or more of the initial part program steps that are not in the editing initialization block may be based on estimated data that is related to (e.g., modified based on) data determined from running the editing initialization block. | 05-16-2013 |
20130120553 | MACHINE VISION SYSTEM EDITING ENVIRONMENT FOR A PART PROGRAM IN WHICH A CONTINUOUS STREAM OF IMAGE ACQUISITION OPERATIONS ARE PERFORMED DURING A RUN MODE - A machine vision system editing environment is provided for a part program in which a continuous stream of image acquisition operations are performed during a run mode. In one embodiment, a new common syntax and representations are utilized wherein continuous image acquisition operations are recorded in the same way as regular operations, with the running of the part program being performed in two stages. In the first stage, the portion of the part program that is to have the continuous stream of image acquisition is scanned for image acquisition operations, and the most efficient order for acquiring the images is determined, after which the image acquisition process is begun. Then, in the second stage, while the image acquisition process is being performed, the portion of the part program is scanned again, with the image analysis operations then being performed. | 05-16-2013 |
20130118279 | MEASURING INSTRUMENT - A measuring instrument includes a display on which measurements are displayed. The display is provided by an organic electroluminescent panel or an electronic paper including an assembly of organic electroluminescence devices and includes: a display controlling section that displays a plurality of scale segment images at an equal interval and a pointer image at a position corresponding to the measurements among display areas displayed by the plurality of scale segment images; and a scale information input section that specifies at least one of the display areas and inputs scale interval information of the scale segment images on the specified area. The display controlling section includes a scale interval changing section that, based on the scale interval information, displays the scale segment images on the specified area commanded by the scale information input section. | 05-16-2013 |
20130112859 | OPTICAL ENCODER READHEAD CONFIGURED TO BLOCK STRAY LIGHT - An optical readhead for measuring a displacement along a measuring axis direction between the readhead and a scale track comprises an illumination portion configured to output source light to the scale track and a monolithic detector configuration. The monolithic detector configuration comprises: a first track photodetector portion configured to receive scale light from the scale track; a first metal layer; a second metal layer; and a plurality of dummy vias between the first metal layer and the second metal layer. The plurality of dummy vias is arranged to block light transmission along a layer between the first and second metal layers, and the plurality of dummy vias is formed by the same process steps used to fabricate a plurality of active vias used to connect circuit elements on the monolithic detector configuration. | 05-09-2013 |
20130105675 | DISPLACEMENT DETECTING DEVICE, DISPLACEMENT DETECTING METHOD, AND COMPUTER-READABLE MEDIUM | 05-02-2013 |
20130099106 | DISPLACEMENT DETECTING DEVICE, SCALE CALIBRATING METHOD AND SCALE CALIBRATING PROGRAM - A displacement detecting device includes: a scale which has an optical lattice; a detecting unit which is disposed so as to be movable in a scanning direction relative to the scale, inclusive of at least a first detection portion, a second detection portion and a third detection portion, arranged in the scanning direction for detecting position information from the optical lattice; and a calculating portion configured to obtain a self-calibration curve on graduations of the scale by specifying positions of the detection portions and calculating measurement error based on the position information detected by the detecting unit, wherein: the detecting unit is provided so that a distance between the first detection portion and the second detection portion and a distance between the second detection portion and the third detection portion are different from each other and do not form an integral multiple. | 04-25-2013 |
20130091720 | MICROMETER - A micrometer includes: a displacement detector that detects a displacement of a spindle; a display device that is rotatably attached to a fixed sleeve; and a control device that controls the display device. The display device includes: an image display section that displays an image including a measurement value based on the displacement detected by the displacement detector; a surface member that faces the image display section and has a touch surface; a position sensor that detects a position pressed on the touch surface; and a support member that supports the image display section, the surface member and the position sensor while the touch surface is exposed to an outside, the support member being rotatably attached to the fixed sleeve. | 04-18-2013 |
20130083384 | OPTICAL PROBE - An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part. | 04-04-2013 |
20130077644 | METHOD FOR DETERMINING STABILIZATION OF LIGHT OUTPUT SIGNAL AND LASER FREQUENCY STABILIZING DEVICE - A method for determining stabilization of a light output signal employed by a laser frequency stabilizing device which irradiates laser light on an absorption cell to obtain the light output signal and, based on a saturated absorption line contained in the light output signal, changes a resonator length to stabilize an oscillation frequency of the laser light to a specific saturated absorption line. The laser frequency stabilizing device includes a conversion mechanism converting the laser light that passes through the absorption cell into the light output signal, an actuator changing the resonator length, and a control mechanism controlling operation of the actuator. The method for determining stabilization includes a signal analysis step analyzing the light output signal and a stabilization determination step determining whether the light output signal is stabilized based on an analysis result from the signal analysis step, executed by the control mechanism. | 03-28-2013 |
20130076892 | METHOD UTILIZING IMAGE CORRELATION TO DETERMINE POSITION MEASUREMENTS IN A MACHINE VISION SYSTEM - A method utilizing image correlation to determine position measurements in a machine vision system. In a first operating state, the machine vision system utilizes traditional scale-based techniques to determine position measurements, while in a second operating state, image correlation displacement sensing techniques are utilized to determine position measurements. The image correlation techniques provide for higher accuracy for measuring distances between features that are separated by more than one field of view. The user may toggle between the operating states through a selection on the user interface, and guidance may be provided regarding when the image correlation mode is likely to provide higher accuracy, depending on factors such as the distance to be measured and the characteristics of the surface being measured. | 03-28-2013 |
20130075215 | CONSTANT-FORCE DEVICE AND MICROMETER - A constant-force device includes a first ratchet wheel mounted rotatably on a shaft and having first sawtoothed projections, a second ratchet wheel mounted on the shaft so as not to rotate relative to the shaft but to move along the shaft and having second sawtoothed projections opposed to the first sawtoothed projections, an intermediate ratchet wheel mounted on the shaft so as not only to rotate relative to the shaft but also to move along the shaft between the first ratchet wheel and the second ratchet wheel and having a pair of intermediate sawtoothed projections meshing with the first and second sawtoothed projections respectively, a biasing member configured to bias the second ratchet wheel towards the first ratchet wheel, and a lock mechanism configured to set the first and intermediate ratchet wheels in a connected or unconnected state. | 03-28-2013 |
20130069637 | INDUCTIVE DETECTION ENCODER AND DIGITAL MICROMETER - An inductive detection encoder according to the present invention includes: first and second members which are oppositely disposed so as to relatively move in a measurement direction; a transmitting coil formed in the first member; a magnetic flux coupled body which is formed in the second member and coupled with a magnetic field generated by the transmitting coil; and a receiving coil formed in the first member and having receiving loops. At least one of the transmitting coil and the receiving coil has a specific pattern that impairs the uniformity and periodicity of a pattern; and a dummy pattern formed in a position corresponding to a specific phase relationship of a cycle generated by the track with respect to the specific pattern. | 03-21-2013 |
20130069294 | TWO-DIMENSION PRECISION TRANSFER EQUIPMENT, THREE-DIMENSION PRECISION TRANSFER EQUIPMENT, AND COORDINATE MEASURING MACHINE - A coordinate measuring machine includes a three-dimension precision transfer equipment and a measuring equipment that measures an object. The three-dimension precision transfer equipment includes a movable body, first to third driving bodies, first to third drive mechanisms that drive to move the first to third driving bodies forward and backward in a first direction, a second direction and a vertical direction that are mutually orthogonal, and first to third laser interferometers that detect a displacement of the movable body. The first to third driving bodies include first to third joints that forms a static-pressure clearance between the first to third driving bodies and the movable body. Laser paths of the first to third laser interferometers extend in a manner to respectively penetrate the first to third driving bodies and the first to third joints. | 03-21-2013 |
20130068051 | PRECISION FEEDING DEVICE AND PRECISION TRANSFER EQUIPMENT - A precision feeding device that drives a table supported by a base in a predetermined moving direction includes: a rod connected to the table; a drive mechanism that drives to move the rod forward and backward in the moving direction; and a laser interferometer that detects a displacement of the rod relative to the base. The drive mechanism includes a linear motor that symmetrically applies a drive force on the rod relative to an axis in the moving direction. A laser path of the laser interferometer passes through the rod and extends in the moving direction, so that a moving axis of the rod, a thrust axis of the drive mechanism and a detection axis of the laser interferometer are aligned. | 03-21-2013 |
20130068050 | PRECISION TRANSFER EQUIPMENT - The invention includes: a base; a table supported by the base; a tubular rod connected to a side of the table via a joint; a drive mechanism that moves the rod forward and backward; and a laser interferometer that detects displacement of the table relative to the base. The joint is provided by a supplying-discharging static-pressure joint and includes: a movement surface that is connected to the table and is orthogonal to a moving direction of the table; a drive surface that is connected to the rod and faces the movement surface; and a fluid supply channel supplying fluid to a static-pressure clearance between the movement surface and the drive surface. The laser interferometer includes a laser path having an optical axis along the moving direction passing through the inside of the rod of which a pressure is reduced and the drive surface and reflect on the movement surface. | 03-21-2013 |
20130068001 | HARDNESS TESTER AND HARDNESS TEST METHOD - A hardness tester includes:
| 03-21-2013 |
20130061650 | Optical Aberration Correction for Machine Vision Inspection Systems - A system and method for correcting surface height measurements for optical aberration is provided. Heights determined by an autofocus tool, which may depend on surface feature angles in a focus region of interest (ROI) and on the ROI location in the field of view, are corrected based on a novel error calibration. Error calibration data includes height corrections for different feature angles in images, and for multiple locations in a field of view. Height corrections are determined by weighting and combining the angle dependent error calibration data, e.g., based on a gradient (edge) angle distribution determined in the ROIs. When Z-heights are determined for multiple ROIs in a field of view, storage of image data from particular images of a global image stack may be efficiently controlled based on determining early in processing whether a particular image is a sufficiently focused “near-peak” focused image or not. | 03-14-2013 |
20130057935 | APPARATUS FOR THE EXACT RECONSTRUCTION OF THE OBJECT WAVE IN OFF-AXIS DIGITAL HOLOGRAPHY - A method for preparing a digital hologram representing an image of an object, which includes generating a measurement beam and a first reference beam, irradiating the object by the measurement beam and guiding the measurement beam reflected to an optical sensor. The method also includes guiding the first reference beam to a first mirror, extending under an angle different from 90° with the optical axis of the first reference beam, and guiding the reflected beam to the optical sensor so that both beams generate an interference pattern on the sensor. The method further includes reading out the sensor and providing a digital signal representing the interference pattern on the optical sensor, and processing the signal to obtain a digital hologram. | 03-07-2013 |
20130056624 | ABSOLUTE POSITION MEASURING ENCODER - An absolute position measuring encoder having an ABS/INC integrated pattern obtained by integrating an absolute pattern and an incremental pattern together is provided. The absolute position measuring encoder includes an imaging optical system (lens) designed to generate an amplitude difference between a light and dark signal derived from the absolute pattern and light and dark signal derived from the incremental pattern, and a signal processing system (comparator) for separating a received light signal from the ABS/INC integrated pattern into an absolute pattern signal and an incremental pattern signal by utilizing the amplitude difference. Accordingly, an absolute pattern signal and an incremental pattern signal can be separated off from the ABS/INC integrated pattern at a high speed with a simple processing circuit. | 03-07-2013 |
20130055579 | MEASURING INSTRUMENT - A measuring instrument includes a display that displays measurements. The display is provided by an organic electroluminescent display device or an electronic paper including an assembly of organic EL (Electro-Luminescence) devices. Since the display is provided by the organic electroluminescent display device or an electronic paper including an assembly of organic electroluminescence devices, visibility of the display can be enhanced. Further, since the display can be used for various measuring instruments in common and the display design can be easily changed, production cost can be reduced. | 03-07-2013 |
20130047713 | HARDNESS TESTER - A hardness tester includes a CCD camera, a monitor, a clipper (a CPU and a clipping program), and a display controller (the CPU and a display control program). The CCD camera captures an image of an indentation formed on a surface of a specimen via field lenses. The monitor displays the image of the indentation captured by the CCD camera. The clipper clips a plurality of regions from the image of the indentation captured by the CCD camera, the regions containing predetermined measurement points. The display controller simultaneously displays on the monitor images of the plurality of regions clipped by the clipper. | 02-28-2013 |
20130039585 | IMAGE MEASUREMENT APPARATUS AND IMAGE MEASUREMENT METHOD - An image measurement apparatus includes: an imager section, an obtainment section, an outline detection section, a setting section, and a measurement section. The imager section takes an image of a subject to be measured. The obtainment section obtains a taken image of the subject taken by the imager section. The outline detection section detects, by a Hough transformation, outline of a graphic included in the image obtained by the obtainment section. The setting section sets an edge detection tool on the outline detected by the outline detection section. The measurement section measures, by the edge detection tool set by the setting section, graphic information concerning the graphic. | 02-14-2013 |
20130033257 | ELECTROMAGNETIC INDUCTION TYPE ABSOLUTE POSITION MEASURING ENCODER - An electromagnetic induction type absolute position measuring encoder having two or more rows of scale coils, each of the rows having a scale pitch different from that of another row; a transmitter coil and a receiver coil arranged on a grid that is movable relative to the scale in the measuring direction so as to face the scale coils; and the track is constituted by the scale coils, the transmitter coil and the receiver coil. The encoder is capable of measuring an absolute position of the grid with respect to the scale from a flux change detected at the receiver coil via the scale coils when the transmitter coil is excited, in which at least one loop-shaped additional scale coil is added between the scale coils in at least one of the tracks. | 02-07-2013 |
20130027538 | MULTI-REGION FOCUS NAVIGATION INTERFACE - A multi-region focus navigation interface for a machine vision inspection system is provided to assist a user with user-directed or manual focus operations. The multi-region focus navigation interface comprises a plurality of regional focus elements, each corresponding to a respective region of interest and superimposed on a displayed field of view. Each focus element comprises at least first and second operating states corresponding to its focus distance being in a close or intermediate range, respectively. Each operating state comprises a respective graphical focus indicator. For the intermediate range, a focus improvement direction may also be indicated. In one embodiment, in the close range operating state, a user may activate a region focus element to perform autofocus operations, while in the intermediate range operating state, a user may activate a focus element to perform operations that move toward the focus height by a predetermined step size. | 01-31-2013 |
20130025346 | LONG-PERIOD VIBRATION SENSOR AND METHOD FOR CORRECTING OUTPUT VALUE OF THE LONG-PERIOD VIBRATION SENSOR - A long-period vibration sensor includes an overdamped accelerometer including a magnet fixed to the inside of a casing, a detection coil disposed between magnetic poles formed due to the magnet, a bobbin configured to hold the detection coil, and a support spring configured to support the bobbin in the casing so that the bobbin can vibrate in a predetermined direction, a voltage being outputted from the detection coil when the bobbin is damped, a plurality of digital filters having different frequency characteristics from one another, a selection module configured to select one digital filter from the plurality of digital filters based on an output value of the voltage outputted from the overdamped accelerometer, and a correction module configured to correct the output value of the voltage outputted from the overdamped accelerometer using the digital filter selected by the selection module. | 01-31-2013 |
20130021614 | ABSCISSA CALIBRATION JIG AND ABSCISSA CALIBRATION METHOD OF LASER INTERFERENCE MEASURING APPARATUS - An abscissa calibration jig of a laser interference measuring apparatus, includes: an image projection unit configured to project an image with a marker; a first support mechanism configured to rotatably support the image projection unit around a first rotation axis passing a predetermined rotation center; and a second support mechanism configured to rotatably support the first support mechanism around a second rotation axis crossing the first rotation axis at the rotation center. | 01-24-2013 |
20130021024 | ELECTROMAGNETIC INDUCTION TYPE ABSOLUTE POSITION MEASURING ENCODER - In an electromagnetic induction type absolute position measuring encoder having two or more tracks which includes: two or more rows of scale coils, each row including scale coils numerously arranged on a scale along a measuring direction so as to have a scale pitch different from that of another row; and transmitter coils and receiver coils provided on a movable grid relative to the scale in the measuring direction so as to face the scale coils, and which can measure an absolute position of the grid with respect to the scale on the basis of a flux change detected at the receiver coil via the scale coil when the transmitter coil is excited, coil lines are added to at least one side of the scale coils in the measuring direction at least in one of the tracks. | 01-24-2013 |
20130019652 | INDEX ERROR ESTIMATING APPARATUS, INDEX ERROR CALIBRATING APPARATUS, AND INDEX ERROR ESTIMATING METHOD - An index error estimating apparatus used for an index error calibrating apparatus that has a grating disk supported by a rotation shaft and four detectors arranged on the grating disk. The index error estimating apparatus includes a detected value synthesizer that calculates a linear sum by multiplying by a predetermined coefficient each of detected values obtained from each of the at least four detectors; and a Fourier component identifier that uses a Fourier component of the linear sum and identifies a Fourier component of the index error. | 01-24-2013 |
20130008241 | HARDNESS TESTER AND TESTING METHOD - A hardness tester and testing method including a focuser, an image capturer, a test position setter, a focus position memory, an indentation creator, an image capture controller, and a measurer. The focuser focuses on the surface of the specimen. The image capturer captures an image of the surface of the specimen. The test position setter sets a test position at which the indentation is formed. The focus position memory measures a focus position, then associates the focus position with a test position within a predetermined range and stores the information in a memory. The indentation creator forms the indentation at the test position with the indenter. The image capture controller displaces the specimen, then captures an image of the formed indentation through the first field lens. The measurer measures the hardness of the specimen based on the indentation whose image has been captured. | 01-10-2013 |
20130006579 | METHOD OF MEASURING A CIRCULAR SHAPE CHARACTERISTIC AND CIRCULAR SHAPE CHARACTERISTIC MEASURING DEVICE AND PROGRAM - A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples. | 01-03-2013 |
20130001412 | OPTICAL ENCODER INCLUDING PASSIVE READHEAD WITH REMOTE CONTACTLESS EXCITATION AND SIGNAL SENSING - An optical encoder system with a passive readhead is provided. The passive readhead does not have an attached cable and is an all optical readhead where the measurement position information relative to a scale is read remotely by direct line-of-sight optical transmission to a remote companion system. The remote companion system includes a light source and a sensing portion. In one embodiment, the sensing portion may comprise a remote lens portion and a photodetector arrangement. The remote companion system is configured to optically sense intensities of imaged regions from the passive readhead, and to output a plurality of signals indicative of the measurement position based on the sensed intensities. | 01-03-2013 |
20120327425 | GRAZING INCIDENCE INTERFEROMETER - A grazing incidence interferometer includes a light source, a light beam divider configured to divide original light coming from the light source, an illuminator configured to apply measurement light to a measurement subject, a light beam combining module configured to combine the measurement light reflected from the measurement subject with reference light, and a photodetector configure to detect a combined light beam. The grazing incidence interferometer includes an interferometer main body, a stage configured to hold the measurement subject, a moving mechanism capable of moving the interferometer main body along the measurement subject, and an auxiliary reflector disposed on an extension of an axis of movement of the interferometer main body, an auxiliary light beam separator configured to separate auxiliary light from the original light and to apply the auxiliary light to the auxiliary reflector, and an auxiliary photodetector configured to detect the auxiliary light reflected by the auxiliary reflector. | 12-27-2012 |
20120324750 | STRUCTURE FOR PROTECTING SCALE GRADUATIONS - In a structure for protecting scale graduations, in which a graduation unit formed on a scale base is protected by a scale cover arranged on the top surface side of the graduation unit, a space between the scale base and the scale cover along the entire lateral periphery of the graduation unit is sealed using an adhesive agent mixed with a powder material such as a glass powder for blocking penetration of graduations-deteriorating components, to form a periphery adhesive layer. The scale cover may be supported on the scale base by a height regulating unit provided along the periphery of the graduation unit, so that variations in encoder output due to unevenness in thickness of the adhesive agent for joining the scale cover with the graduation unit can be prevented. | 12-27-2012 |
20120316826 | METHOD OF ALIGNING, ALIGNING PROGRAM AND THREE-DIMENSIONAL PROFILE EVALUATING SYSTEM - A method of aligning that aligns a measurement point group and a design point group by an arithmetic processing unit, the measurement point group including a plurality of measurement points obtained by measuring a workpiece by a measuring instrument, and the design point group including a plurality of design points specified by design data of the workpiece, comprises selecting a partial point group from the measurement point group, performing an alignment processing of the partial point group and the design point group to calculate a shift parameter, shifting the measurement point group using the shift parameter, and performing an alignment processing of the measurement point group after shifting and the design point group. | 12-13-2012 |
20120312972 | OPTICAL ENCODER INCLUDING DISPLACEMENT SENSING NORMAL TO THE ENCODER SCALE GRATING SURFACE - Disclosed is a displacement sensor configuration, comprising a scale grating disposed in a first direction; and a scale light imaging configuration which includes first and second optical paths and a detector including first and second detector portions. The imaging portion inputs a first scale light component output by the scale grating along the first optical path and transmits the first scale light component to the first detector portion, the imaging portion inputs a second scale light component output by the scale grating along the second optical path and transmits the second scale light component to the second detector portion, the first detector portion is configured to output a first displacement signal indicative of a displacement along the first direction, and the second detector portion is configured to output a second displacement signal indicative of a displacement along a second direction perpendicular to the first direction. | 12-13-2012 |
20120303320 | CROSS-SECTIONAL PROFILE MEASURING METHOD - A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, includes: circularly moving the probe along a route around a circumference of the object at one of the measurement sections, a distance of the moving being longer than a measurement range corresponding to the circumference of the object by a predetermined overlapping range consisting of an acceleration range and a deceleration range; and moving the probe to next one of the measurement sections through a transfer range in a movement direction oblique to a continuous direction in which the cross-sectional profiles are adjacent to one another to offset a distance corresponding to the overlapping range. | 11-29-2012 |
20120290260 | METHOD FOR GENERATING ERROR IMAGE AND PROGRAM FOR GENERATING ERROR IMAGE - A point group on a surface parametric space of free-form surface data corresponding to a measurement points is calculated as a first point group. Error data between each of measurement points and design points is calculated. The first point group is triangulated to generate first triangular facets and calculate a convex hull of the first point group. A second point group distributed in the calculated convex hull on the surface parametric space is set. Error data of the second point group is obtained from error data corresponding to the first point group. A point group including the first point group and the second point group is re-triangulated to generate a second triangular facets. | 11-15-2012 |
20120272729 | DUST-PROOF STRUCTURE FOR MEASURING TOOL - A dust-proof structure for a measuring tool, includes: a case provided with an opening formed through a surface opposed to a protection plate thereof; a solar panel accommodated in the case through the opening of the case; an intermediate panel pressing an outer circumferential portion of the solar panel against a bottom wall of the case; a display device disposed at an inward portion of the intermediate panel and opposed to the solar panel with a gap; a cover attached to close the opening of the case; a screw used to secure the cover and the intermediate panel to the case; and a temporary-fixing unit disposed between the intermediate panel and the case, the temporary-fixing unit temporarily fixing the intermediate panel to the case while the outer circumferential portion of the solar panel is pressed against the bottom wall of the case. | 11-01-2012 |
20120266475 | SURFACE TEXTURE MEASURING INSTRUMENT - In a surface texture measuring instrument, a measurement arm includes: a first measurement arm that is supported by a bracket around a support shaft movably in a circular movement in a casing; and a second measurement arm having styluses that are attachably and detachably provided to an end of the first measurement arm via an attachment-detachment mechanism, the attachment-detachment mechanism being arranged in the casing. A displacement detector includes: a scale provided to the measurement arm; and a detection head provided to the bracket to face the scale. A detecting surface of the scale is on an axis of the measurement arm and on a plane of the circular movement of the measurement arm. | 10-25-2012 |
20120262733 | DISPLACEMENT SENSOR USING MULTIPLE POSITION SENSITIVE PHOTODETECTORS - A position sensing device having a high range to resolution ratio comprises a light source arrangement, a moving aperture arrangement and a multiple position sensitive detector (PSD) arrangement. The multiple PSD arrangement comprises a plurality of position sensitive detectors arranged along at least two detection tracks along a measuring axis. Each of the plurality of position sensitive detectors shares a common portion of a total measuring range along the measuring axis with an adjacent position sensitive detector which is on a different detector track. The total measurement range is larger than the detector range of each of the position sensitive detectors. | 10-18-2012 |
20120262726 | SHAPE MEASUREMENT DEVICE - Disclosed is a shape measurement device including: a light irradiation unit which irradiates linear light onto a work; an imaging element which images reflected light reflected by the work; and an image-forming lens which forms an image of the reflected light reflected by the work on an imaging plane of the imaging element, and a light irradiation plane of the light irradiation unit, a principal plane including a principal point of the image-forming lens, and the imaging plane of the imaging element satisfy a Scheimpflug principle. The shape measurement device further includes: an image obtaining region selection unit which divides the imaging plane of the imaging element into a plurality of regions, and selects, as an image obtaining region, a region for use in measurement from the plurality of regions in response to at least one of measurement accuracy and a size of a measurement range. | 10-18-2012 |
20120262724 | SHAPE MEASUREMENT DEVICE - Disclosed is a shape measurement device which scans a surface of a work by a probe in a noncontact manner and measures a surface shape of the work. The probe includes: a light irradiation unit which irradiates linear light onto the work; and an imaging unit which images reflected light of the light irradiated from the light irradiation unit, the reflected light being reflected by the work. The imaging unit includes: an imaging element which images an image of the work; an image-forming lens which forms the image of the reflected light being reflected by the work on an imaging plane of the imaging element; and a lens exchange unit which makes the image-forming lens exchangeable. | 10-18-2012 |
20120243790 | EDGE LOCATION MEASUREMENT CORRECTION FOR COAXIAL LIGHT IMAGES - A method for correcting coaxial light image edge location errors in a precision machine vision inspection system is disclosed. The method comprises comparing an edge position measurement of a workpiece edge feature using coaxial light and stage light. Edge position measurements using stage light have a lower uncertainty than that of coaxial light. Position correction factors may be determined from the difference between the two edge position measurements. The position correction factors may be stored for correcting subsequent edge position measurements that are based on images acquired using coaxial light. In some embodiments, position correction factors may be determined based on comparing edge position measurements for a plurality of edges. | 09-27-2012 |
20120234075 | METHOD OF CALIBRATING SURFACE TEXTURE MEASUREMENT DEVICE - A method of calibrating a surface texture measurement device includes obtaining Y-axis shape measurement data and a maximum diameter portion to obtain upper and lower maximum diameter portions of a reference sphere from Y-axis upper and lower shape data obtained by relatively moving in the Y-axis direction while a downward and an upward styluses are in contact with an upper and a lower surfaces, respectively, of the reference sphere; obtaining X-axis shape measurement data to obtain X-axis upper and lower shape data of the reference sphere by relatively moving in the X-axis direction while the downward stylus is in contact with the upper diameter portion and the upward stylus with the lower diameter portion of the reference sphere; and calculating offset amounts Δx and Δz of the upward and downward styluses from center coordinates O3 and O4 obtained from the shape data. | 09-20-2012 |
20120227476 | SURFACE TEXTURE MEASURING APPARATUS - A surface texture measuring apparatus includes a stylus displacement detector having a measurement arm which is able to swing, a pair of styli provided at a tip of the measurement arm, and a detection unit configured to detect swing amounts of the measurement arm, a stage configured to mount the subject of measurement thereon, and a relative movement mechanism configured to cause a relative movement between the detector and the stage. The apparatus includes a posture switching mechanism configured to switch a posture of the measurement arm between a posture in which the measurement arm is urged in one swing direction and a posture in which the measurement arm is urged in the other swing direction, and a speed control mechanism configured to control a switching speed of posture switching of the measurement arm to a preset speed when the posture of the measurement arm is switched by the posture switching mechanism. | 09-13-2012 |
20120218560 | METHOD AND APPARATUS FOR PERFORMING FILM THICKNESS MEASUREMENTS USING WHITE LIGHT SCANNING INTERFEROMETRY - The invention relates to a method and an apparatus for measuring the thickness of a transparent film by broad band interferometry, comprising the steps of preparing a correlogram of the film by an interferometer, applying a Fourier transformation to said correlogram to obtain a Fourier phase function, removing a linear component thereof, applying a second integral transformation to the remaining non-linear component to obtain an integral amplitude function of said non-linear component, identifying the peak location of said integral amplitude function and determining the thickness of the film as the double value of the abscissa at said peak location considering a refractive index of a film which is dependent on wavelength. The last two steps may be replaced by identifying the peak locations of said integral amplitude function and determining the thickness of the films as the double values of the abscissas at the peak locations. | 08-30-2012 |
20120212607 | IMAGE MEASURING APPARATUS - An image measuring apparatus includes: an imaging device of a rolling shutter type configured to image a work; a position control system configured to output a focusing position as information representing a position in a direction of a focusing axis by controlling an in-focus position of the imaging device; and a computing device configured to calculate, from image information acquired from the imaging device, contrast information corresponding to the image information, wherein the computing device divides an acquired image into a plurality of regions and corrects the contrast information corresponding to the image information based on a position of and the contrast information corresponding to each of the regions. | 08-23-2012 |