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WALSTEIN BENNETT SMITH III
GEORGETOWN, TX US
1. 20090077508 ACCELERATED LIFE TESTING OF SEMICONDUCTOR CHIPS 03-19-20092. 20090048801 Method and apparatus for generating thermal test vectors 02-19-2009
3. 20090024969 SEMICONDUCTOR CHIP DESIGN HAVING THERMAL AWARENESS ACROSS MULTIPLE SUB-SYSTEM DOMAINS 01-22-2009
4. 20090024347 Thermal Simulation Using Adaptive 3D and Hierarchical Grid Mechanisms 01-22-2009
5. 20090019411 Thermally Aware Design Modification - first variation a thermally aware design automation suite integrates system-level thermal awareness into design of 01-15-2009
6. 20080216040 Incremental Relative Slack Timing Force Model 09-04-2008
7. 20080216039 Node Spreading via Artificial Density Enhancement to Reduce Routing Congestion 09-04-2008
8. 20080216038 Timing Driven Force Directed Placement Flow 09-04-2008
9. 20080216025 Tunneling as a Boundary Congestion Relief Mechanism 09-04-2008
10. 20080197195 Multi-Mode Ring Scannner - multi-mode ring scanner has a ring unit for wearing on a finger 08-21-2008