Acid-base characterization of aluminum oxide surfaces with XPS

Article Abstract:

The localized acid-base properties of different, aluminum oxide thin layer surfaces have been evaluated with X-ray photoelectron spectroscopy (XPS). Five types of oxide layers were studied, which were produced by oxidizing aluminum in a vacuum, with an alkaline and acidic pretreatment, and in boiling water.

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Quantitative XPS analysis of PEG-modified silicon surfaces

Article Abstract:

X-ray photoelectron spectroscopy (XPS) is used to understand and analyze poly(ethylene glycol) (PEG) films on silicon bio-microsystems. The standard overlayer method is used to calculate the thickness of the film using the intensities of Si2p peaks before and after PEG modification.

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Hydrogen chemisorption on Al2O3-supported gold catalysts

Article Abstract:

Hydrogen dissociatively adsorbs on the gold atoms of Au/AL2O3 catalyst prepared by impregnation and deposition-precipitation. The dissociative and adsorption of hydrogen is limited to the gold atoms on corner and edge positions.

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